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Institute
Steganography embraces several hiding techniques which spawn across multiple domains. However, the related terminology is not unified among the different domains, such as digital media steganography, text steganography, cyber-physical systems steganography, network steganography (network covert channels), local covert channels, and out-of-band covert channels. To cope with this, a prime attempt has been done in 2015, with the introduction of the so-called hiding patterns, which allow to describe hiding techniques in a more abstract manner. Despite significant enhancements, the main limitation of such a taxonomy is that it only considers the case of network steganography. Therefore, this paper reviews both the terminology and the taxonomy of hiding patterns as to make them more general. Specifically, hiding patterns are split into those that describe the embedding and the representation of hidden data within the cover object. As a first research action, we focus on embedding hiding patterns and we show how they can be applied to multiple domains of steganography instead of being limited to the network scenario. Additionally, we exemplify representation patterns using network steganography.
Der Erwartungswert einer Zufallsgröße kann generell am Graphen ihrer Verteilungsfunktion durch eine naheliegende Gleichheit zweier Flächeninhalte festgelegt werden. Äquivalent dazu lässt er sich mit zwei uneigentlichen Riemann-Integralen darstellen. Davon ausgehend werden die Tschebyschow-Ungleichung und ihre Modifikation mit strikten Ungleichheitszeichen hergeleitet.
Smectic films in a collapsing catenoid develop spontaneous wrinkling patterns like solid sheets.
Smectic freely-suspended films can wrinkle like solid sheets. This has been demonstrated earlier with shape-fluctuating smectic bubbles. Here, we exploit the collapse of smectic catenoid films with a central equatorial film to expose the latter to rapid lateral compression. Wrinkle formation is observed in the planar film and the thickness dependence of the undulation wavelength is measured. In addition to the central film, its border undergoes an undulation instability as well.