Surface characterisation and surface measurements on Boron Phosphide films prepared by PECVD

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Metadaten
Author:Abraham Ogwu, Thomas Hellwig, Saul Doherty, David Haddow, Klaus-Peter Möllmann, Frank Placido
Parent Title (English):In: Window and dome technologies and materials IX : 28 - 29 March 2005, Orlando, Florida, USA ; [held as part of the SPIE Defense & Security Symposium] / sponsored and publ. by SPIE, the International Society for Optical Engineering. Cooperating organizations: Ball Aerospace & Technologies Corporation (USA) ... Randal W. Tustison, chair/ed. - Bellingham, Wash. : SPIE, 2005. - (Proceedings // SPIE, International Society for Optical Engineering : P, ISSN 0038-7355 ; 5786). - ISBN 0-8194-5771-X
Document Type:Conference Proceeding
Language:English
Year of Publishing:2005
Date of Publication (online):2014/01/23
Release Date:2014/01/23
First Page:130
Last Page:136
University Bibliography:Hochschulbibliographie
Licence (German):Creative Commons - Namensnennung, Nicht kommerziell, Keine Bearbeitung