Surface characterisation and surface measurements on Boron Phosphide films prepared by PECVD
Author: | Abraham Ogwu, Thomas Hellwig, Saul Doherty, David Haddow, Klaus-Peter MöllmannGND, Frank Placido |
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Parent Title (English): | In: Window and dome technologies and materials IX : 28 - 29 March 2005, Orlando, Florida, USA ; [held as part of the SPIE Defense & Security Symposium] / sponsored and publ. by SPIE, the International Society for Optical Engineering. Cooperating organizations: Ball Aerospace & Technologies Corporation (USA) ... Randal W. Tustison, chair/ed. - Bellingham, Wash. : SPIE, 2005. - (Proceedings // SPIE, International Society for Optical Engineering : P, ISSN 0038-7355 ; 5786). - ISBN 0-8194-5771-X |
Document Type: | Conference Proceeding |
Language: | English |
Year of Publishing: | 2005 |
Date of Publication (online): | 2014/01/23 |
Release Date: | 2014/01/23 |
First Page: | 130 |
Last Page: | 136 |
University Bibliography: | Hochschulbibliografie |
Licence (German): | Creative Commons - Namensnennung, Nicht kommerziell, Keine Bearbeitung |