Visual Feature Space Analyses of Face Morphing Detectors
Author: | Clemens Seibold, Anna Hilsmann, Andrey Makrushin, Christian Kraetzer, Tom Neubert, Jana Dittmann, Peter Eisert |
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URL: | https://ieeexplore.ieee.org/document/9034983/ |
DOI: | https://doi.org/10.1109/WIFS47025.2019.9034983 |
ISBN: | 978-1-72813-217-4 |
Parent Title (English): | Konferenz: 2019 IEEE International Workshop on Information Forensics and Security (WIFS), Delft, Netherlands, 2019/ Konferenztitel: 2019 IEEE International Workshop on Information Forensics and Security (WIFS) |
Publisher: | IEEE |
Place of publication: | Delft, Netherlands |
Document Type: | Conference Proceeding |
Language: | English |
Year of Publishing: | 2019 |
Date of Publication (online): | 2024/02/13 |
Release Date: | 2024/02/14 |
Page Number: | 6 |
First Page: | 1 |
Last Page: | 6 |
Institutes: | Fachbereich Informatik und Medien |
University Bibliography: | Hochschulbibliografie |
Licence (German): | ![]() |