TY - JOUR A1 - Dauber, Ben A1 - Meyer, Philipp A1 - Kindsmüller, Martin Christof ED - Koch, Michael T1 - The potential of smart glasses for smart homes JF - Mensch und Computer 2014 - Tagungsband : 14. Fachübergreifende Konferenz für Interaktive und Kooperative Medien - Interaktiv unterwegs - Freiräume gestalten Y1 - 2014 SN - 978-3-11-034415-8 SP - 379 EP - 382 PB - De Gruyter Oldenbourg CY - München ; Berlin ; Boston, Mass. ER - TY - JOUR A1 - Cabanac, Guillaume A1 - Preuss, Thomas T1 - Capitalizing on order effects in the bids of peer-reviewed conferences to secure reviews by expert referees JF - Journal of the Association for Information Science and Technology (JASIST) Y1 - 2012 SN - 1532-2890 (online) SN - 1532-2882 (print) VL - 64 IS - 2 SP - 405 EP - 415 ER - TY - CHAP A1 - Faber, Eberhard von T1 - In-House Standardization of Security Measures: Necessity, Benefits and Real-world Obstructions T2 - ISSE 2014 Securing Electronic Business Processes : Highlights of the Information Security Solutions Europe 2014 Conference Y1 - 2014 SN - 978-3-658-06707-6 (print) SN - 978-365-80670-8-3 (online) U6 - https://doi.org/10.1007/978-3-658-06708-3 SP - 35 EP - 48 PB - Springer Vieweg CY - Wiesbaden ER - TY - CHAP A1 - Faber, Eberhard von ED - Reimer, Helmut T1 - Changing the Security Mode of Operation in a Global IT Organization with 20000+Technical Staff Y1 - 2015 SN - 978-3-658-10933-2 (print) SN - 978-3-658-10934-9 (online) U6 - https://doi.org/10.1007/978-3-658-10934-9 N1 - Erscheint auch als Online-Ausgabe DOI: 10.1007/978-3-658-10934-9 SP - 286 EP - 304 PB - Springer Vieweg CY - Wiesbaden ER - TY - GEN A1 - Andrzejewski, Dennis A1 - Boersch, Ingo A1 - Schrader, Thomas A1 - Haeusler, N. A1 - Ledwon, P. A1 - Beck, Eberhard T1 - Potentials of Computer-aided Decision Support Systems in Medicine Y1 - 2014 N1 - Abstract und Poster, 31. Deutsche Krebskongress, 19. - 22.02.2014, Berlin ER - TY - JOUR A1 - Boersch, Ingo A1 - Füssel, Uwe A1 - Gresch, Christoph A1 - Großmann, Christoph A1 - Hoffmann, Benjamin ED - London, Springer T1 - Data mining in resistance spot welding - A non-destructive method to predict the welding spot diameter by monitoring process parameters JF - The International Journal of Advanced Manufacturing Technology N2 - Resistance spot welding is the dominant process in the present mass production of steel constructions without sealing requirements with single sheet thicknesses up to 3 mm. Two of the main applications of resistance spot welding are the automobile and the railway vehicle manufacturing industry. The majority of these connections has safety-related character and therefore they must not fall below a certain weld diameter. Since resistance spot welding has been established, this weld diameter has been usually used as the gold standard. Despite intensive efforts, there has not been found yet a reliable method to detect this connection quality non-destructively. Considerable amounts of money and steel sheets are wasted on making sure that the process does not result in faulty joints. The indication of the weld diameter by in-process monitoring in a reliable way would allow the quality documentation of joints during the welding process and additionally lead through demand-actuated milling cycles to a substantial decrease of electrode consumption. An annual, estimated reduction in the seven- to nine-figure range could be achieved. It has an important impact, because the economics of the process is essentially characterized by the electrode caps (Klages 24). We propose a simple and straightforward approach using data mining techniques to accurately predict the weld diameter from recorded data during the welding process. In this paper, we describe the methods used during data preprocessing and segmentation, feature extraction and selection, and model creation and validation. We achieve promising results during an analysis of more than 3000 classified welds using a model tree as a predictor with a success rate of 93 %. In the future, we hope to validate our model with unseen welding data and implement it in a real world application. KW - Resistance spot welding KW - Electrode life prognosis KW - Data mining KW - Feature extraction KW - Model selection Y1 - 2016 UR - http://link.springer.com/article/10.1007/s00170-016-9847-y U6 - https://doi.org/10.1007/s00170-016-9847-y ER - TY - CHAP A1 - Müller, Sebastian A1 - Gregor, Max A1 - van Rüschen, Raoul A1 - Rico, Wildenhein A1 - Creutzburg, Reiner A1 - Kindsmüller, Martin Christof ED - Creutzburg, Reiner T1 - MultiMo: A Multimodal University Evaluation Software Designed for High Response Rates and Usability T2 - Mobile Devices and Multimedia: Enabling Technologies, Algorithms, and Applications 2016 : IS & T International Symposium on Electronic Imaging Science and Technology 2016 : San Francisco, California, USA, 14-18 February 2016 Y1 - 2016 SN - 978-1-5108-4600-5 PB - Curran Associates, Inc. CY - Red Hook, NY ER - TY - CHAP A1 - Sigwarth, Timo A1 - Löwe, Katharina A1 - Beck, Eberhard A1 - Pelchen, Lutz A1 - Schrader, Thomas T1 - Conceptual ontology of prospective risk analysis in medical environments - the OPT-Model-Ontology T2 - 2015 IEEE Seventh International Conference on Intelligent Computing and Information Systems (ICICIS'15) : Faculty of Commuter & Information Sciences, Ain Shams University, Cairo, Egypt, 12-14 Dec. 2015 Y1 - 2015 SN - 978-1-5090-1950-2 SN - 978-1-5090-1949-6 U6 - https://doi.org/10.1109/IntelCIS.2015.7397202 SP - 88 EP - 93 PB - IEEE CY - Piscataway, NJ ER - TY - CHAP A1 - Hildebrandt, Mario A1 - Dittmann, Jana A1 - Vielhauer, Claus T1 - Capture and Analysis of Latent Marks T2 - Handbook of Biometrics for Forensic Science Y1 - 2017 SN - 978-3-319-50671-5 (Print) SN - 978-3-319-50673-9 (Online) U6 - https://doi.org/10.1007/978-3-319-50673-9_2 SP - 19 EP - 35 PB - Springer International Publishing CY - Cham ER - TY - BOOK ED - Vielhauer, Claus T1 - User-centric privacy and security in biometrics KW - Data privacy KW - Data security KW - Biometrics Y1 - 2017 SN - 978-1-78561-208-4 (Online) SN - 978-1-78561-207-7 (Print) U6 - https://doi.org/10.1049/PBSE004E PB - IET Institution of Engineering and Technology ER -