TY - CHAP A1 - Seibold, Clemens A1 - Hilsmann, Anna A1 - Makrushin, Andrey A1 - Kraetzer, Christian A1 - Neubert, Tom A1 - Dittmann, Jana A1 - Eisert, Peter T1 - Visual Feature Space Analyses of Face Morphing Detectors T2 - Konferenz: 2019 IEEE International Workshop on Information Forensics and Security (WIFS), Delft, Netherlands, 2019/ Konferenztitel: 2019 IEEE International Workshop on Information Forensics and Security (WIFS) Y1 - 2019 UR - https://ieeexplore.ieee.org/document/9034983/ SN - 978-1-72813-217-4 U6 - https://doi.org/10.1109/WIFS47025.2019.9034983 SP - 1 EP - 6 PB - IEEE CY - Delft, Netherlands ER -