TY - CHAP A1 - Hessel, V. A1 - Löwe, H. A1 - Haverkamp, V. A1 - Wille, Ch. A1 - Ehrfeld, W. A1 - Lutz, N. A1 - Möllmann, Klaus-Peter A1 - Pinno, Frank A1 - Herweck, Th. T1 - Dynamic monitoring of fluid equipartition and heat release in a falling film microreactor using real-time thermography T2 - In: MICRO.tec 2000 : applications - trends - visions ; proceedings / VDE World Microtechnologies Congress, September 25 - 27, 2000, Expo 2000, Hannover, Germany. Organized by VDE Association for Electrical, Electronic & Information Technologies. Sponsored by EUREL ... . - Berlin ; Offenbach : VDE-Verl. - Vol. 2. - 2000. - S. 349 - 354. - ISBN 3-8007-2579-7 Y1 - 2000 SP - 349 EP - 354 ER - TY - CHAP A1 - Möllmann, Klaus-Peter A1 - Lutz, Norbert A1 - Vollmer, Michael A1 - Wille, Ch. T1 - Thermography of Microsystems T2 - In: InfraMation proceedings Vol. 5 (2004), 183-196 Y1 - 2004 SP - 183 EP - 196 ER -