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    <title language="eng">Electrochemical investigation of the stability and corrosion resistance of boron phosphide films prepared by PECVD</title>
    <parentTitle language="eng">In: Window and dome technologies and materials IX : 28 - 29 March 2005, Orlando, Florida, USA ; [held as part of the SPIE Defense &amp; Security Symposium] / sponsored and publ. by SPIE, the International Society for Optical Engineering. Cooperating organizations: Ball Aerospace &amp; Technologies Corporation (USA) ... Randal W. Tustison, chair/ed. - Bellingham, Wash. : SPIE, 2005. - (Proceedings // SPIE, International Society for Optical Engineering : P, ISSN 0038-7355 ; 5786). - ISBN 0-8194-5771-X</parentTitle>
    <author>Abraham Ogwu</author>
    <author>Thomas Hellwig</author>
    <author>Saul Doherty</author>
    <author>David Haddow</author>
    <author>Klaus-Peter Möllmann</author>
    <author>Francis Placido</author>
    <collection role="Hochschulbibliografie" number="1">Hochschulbibliografie</collection>
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    <title language="eng">Surface characterisation and surface measurements on Boron Phosphide films prepared by PECVD</title>
    <parentTitle language="eng">In:  	&#13;
Window and dome technologies and materials IX : 28 - 29 March 2005, Orlando, Florida, USA ; [held as part of the SPIE Defense &amp; Security Symposium] / sponsored and publ. by SPIE, the International Society for Optical Engineering. Cooperating organizations: Ball Aerospace &amp; Technologies Corporation (USA) ... Randal W. Tustison, chair/ed. - Bellingham, Wash. : SPIE, 2005. - (Proceedings // SPIE, International Society for Optical Engineering : P, ISSN 0038-7355 ; 5786). - ISBN 0-8194-5771-X</parentTitle>
    <author>Abraham Ogwu</author>
    <author>Thomas Hellwig</author>
    <author>Saul Doherty</author>
    <author>David Haddow</author>
    <author>Klaus-Peter Möllmann</author>
    <author>Frank Placido</author>
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