@inproceedings{HesselLoeweHaverkampetal.2000, author = {Hessel, V. and L{\"o}we, H. and Haverkamp, V. and Wille, Ch. and Ehrfeld, W. and Lutz, N. and M{\"o}llmann, Klaus-Peter and Pinno, Frank and Herweck, Th.}, title = {Dynamic monitoring of fluid equipartition and heat release in a falling film microreactor using real-time thermography}, series = {In: MICRO.tec 2000 : applications - trends - visions ; proceedings / VDE World Microtechnologies Congress, September 25 - 27, 2000, Expo 2000, Hannover, Germany. Organized by VDE Association for Electrical, Electronic \& Information Technologies. Sponsored by EUREL ... . - Berlin ; Offenbach : VDE-Verl. - Vol. 2. - 2000. - S. 349 - 354. - ISBN 3-8007-2579-7}, booktitle = {In: MICRO.tec 2000 : applications - trends - visions ; proceedings / VDE World Microtechnologies Congress, September 25 - 27, 2000, Expo 2000, Hannover, Germany. Organized by VDE Association for Electrical, Electronic \& Information Technologies. Sponsored by EUREL ... . - Berlin ; Offenbach : VDE-Verl. - Vol. 2. - 2000. - S. 349 - 354. - ISBN 3-8007-2579-7}, pages = {349 -- 354}, year = {2000}, language = {en} } @inproceedings{MoellmannLutzVollmeretal.2004, author = {M{\"o}llmann, Klaus-Peter and Lutz, Norbert and Vollmer, Michael and Wille, Ch.}, title = {Thermography of Microsystems}, series = {In: InfraMation proceedings Vol. 5 (2004), 183-196}, booktitle = {In: InfraMation proceedings Vol. 5 (2004), 183-196}, pages = {183 -- 196}, year = {2004}, language = {en} }