TY - CONF A1 - Merkel, Ronny A1 - Vielhauer, Claus A1 - Dittmann, Jana A1 - Fischer, Robert A1 - Hildebrandt, Mario A1 - Arndt, Christian T1 - From classical forensics to digitized crime scene analysis T2 - 2015 IEEE International Conference on Multimedia and Expo (ICME) : June 29, 2015 - July 3, 2015, Turin, Italy KW - fingerprint recognition KW - forensics KW - sensors KW - substrates KW - feature extraction Y1 - 2018 UR - https://opus4.kobv.de/opus4-fhbrb/frontdoor/index/index/docId/2073 SN - 978-1-4799-7082-7 PB - IEEE CY - Piscataway, NJ ER -