TY - CONF A1 - Ogwu, Abraham A1 - Hellwig, Thomas A1 - Doherty, Saul A1 - Haddow, David A1 - Möllmann, Klaus-Peter A1 - Placido, Frank T1 - Surface characterisation and surface measurements on Boron Phosphide films prepared by PECVD T2 - In: Window and dome technologies and materials IX : 28 - 29 March 2005, Orlando, Florida, USA ; [held as part of the SPIE Defense & Security Symposium] / sponsored and publ. by SPIE, the International Society for Optical Engineering. Cooperating organizations: Ball Aerospace & Technologies Corporation (USA) ... Randal W. Tustison, chair/ed. - Bellingham, Wash. : SPIE, 2005. - (Proceedings // SPIE, International Society for Optical Engineering : P, ISSN 0038-7355 ; 5786). - ISBN 0-8194-5771-X Y1 - 2014 UR - https://opus4.kobv.de/opus4-fhbrb/frontdoor/index/index/docId/656 SP - 130 EP - 136 ER -