TY - JOUR A1 - Han, Weijia A1 - Reiter, Sebastian A1 - Schlipf, Jon A1 - Mai, Christian A1 - Spirito, Davide A1 - Jose, Josmy A1 - Wenger, Christian A1 - Fischer, Inga A. T1 - Strongly enhanced sensitivities of CMOS compatible plasmonic titanium nitride nanohole arrays for refractive index sensing under oblique incidence T1 - Stark verbesserte Empfindlichkeit von CMOS-kompatiblen plasmonischen Titannitrid-Nanoloch-Arrays für die Brechungsindex-Messungen unter nicht-senkrechtem Lichteinfall JF - Optics Express N2 - Titanium nitride (TiN) is a complementary metal-oxide-semiconductor (CMOS) compatible material with large potential for the fabrication of plasmonic structures suited for device integration. However, the comparatively large optical losses can be detrimental for application. This work reports a CMOS compatible TiN nanohole array (NHA) on top of a multilayer stack for potential use in integrated refractive index sensing with high sensitivities at wavelengths between 800 and 1500 nm. The stack, consisting of the TiN NHA on a silicon dioxide (SiO2) layer with Si as substrate (TiN NHA/SiO2/Si), is prepared using an industrial CMOS compatible process. The TiN NHA/SiO2/Si shows Fano resonances in reflectance spectra under oblique excitation, which are well reproduced by simulation using both finite difference time domain (FDTD) and rigorous coupled-wave analysis (RCWA) methods. The sensitivities derived from spectroscopic characterizations increase with the increasing incident angle and match well with the simulated sensitivities. Our systematic simulation-based investigation of the sensitivity of the TiN NHA/SiO2/Si stack under varied conditions reveals that very large sensitivities up to 2305 nm per refractive index unit (nm RIU−1) are predicted when the refractive index of superstrate is similar to that of the SiO2 layer. We analyze in detail how the interplay between plasmonic and photonic resonances such as surface plasmon polaritons (SPPs), localized surface plasmon resonances (LSPRs), Rayleigh Anomalies (RAs), and photonic microcavity modes (Fabry-Pérot resonances) contributes to this result. This work not only reveals the tunability of TiN nanostructures for plasmonic applications but also paves the way to explore efficient devices for sensing in broad conditions. N2 - Titannitrid (TiN) ist ein CMOS-kompatibles Material mit großem Potenzial für die Herstellung plasmonischer Strukturen, die sich für die Bauelementintegration eignen. Die vergleichsweise großen optischen Verluste können sich jedoch nachteilig auf die Anwendung auswirken. In dieser Arbeit wird ein CMOS-kompatibles TiN-Nanoloch-Array (NHA) auf einem Mehrschichtstapel vorgestellt, das für die integrierte Brechungsindexmessung mit hoher Empfindlichkeit bei Wellenlängen zwischen 800 und 1500 nm eingesetzt werden kann. Der Stapel, bestehend aus dem TiN NHA auf einer Siliziumdioxid (SiO2)-Schicht mit Si als Substrat (TiN NHA/SiO2/Si), wurde in einem industriellen CMOS-kompatiblen Prozess hergestellt. Das TiN NHA/SiO2/Si zeigt Fano-Resonanzen in den Reflexionsspektren bei schrägem Einfallswinkel, die durch Simulationen sowohl mit Finite-Differenzen-Zeitbereichsmethoden (FDTD) als auch Rigorous Coupled Wave Analysis (RCWA) gut reproduziert werden. Die aus den spektroskopischen Charakterisierungen abgeleiteten Empfindlichkeiten nehmen mit zunehmendem Einfallswinkel zu und stimmen gut mit den simulierten Empfindlichkeiten überein. Unsere systematische simulationsbasierte Untersuchung der Empfindlichkeit des TiN NHA/SiO2/Si-Stapels unter verschiedenen Bedingungen zeigt, dass sehr große Empfindlichkeiten bis zu 2305 nm RIU-1 vorhergesagt werden, wenn der Brechungsindex des Dielektrikums oberhalb des NHAs ähnlich dem der SiO2-Schicht ist. Wir analysieren im Detail, wie das Zusammenspiel zwischen plasmonischen und photonischen Resonanzen wie Oberflächenplasmonpolaritonen (SPPs), lokalisierten Oberflächenplasmonenresonanzen (LSPRs), Rayleigh-Anomalien (RAs) und photonischen Mikrokavitätsmoden (Fabry-Pérot-Resonanzen) zu diesem Ergebnis beiträgt. Diese Arbeit zeigt nicht nur die Abstimmbarkeit von TiN-Nanostrukturen für plasmonische Anwendungen, sondern ebnet auch den Weg für die Erforschung effizienter Geräte für die Erkennung unter verschiedensten Bedingungen. KW - TiN KW - Plasmonics KW - Plasmonik KW - Plasmonik KW - Photonik KW - Titannitrid KW - Plasmonics KW - Photonics Y1 - 2023 U6 - https://doi.org/10.1364/OE.481993 SN - 1094-4087 VL - 31 IS - 11 SP - 17389 EP - 17407 PB - Optica Publishing Group CY - Washington, DC ER - TY - CHAP A1 - Pechmann, Stefan A1 - Hagelauer, Amelie A1 - Wenger, Christian A1 - Reichenbach, Marc T1 - 1. Memristor-Symposium 2023 T1 - 1. Memristor-Symposium 2023 N2 - The 1.Memristor-Symposium was held from 27-28.02.2023 in Bamberg. Young scientists and PhD students presented their research and covered several topics regarding ongoing memristive research in Germany. Several talks on the topic of memristive devices, their testing, modeling and usage were presented and discussed, covering the whole vertical integration from material and divice up to application level. N2 - Das 1.Memristor-Symposium fand am 27. und 28.02.2023 in Bamberg statt. Junge Wissenschaftler*innen und Doktorant*innen präsentierten dort ihre aktuelle Arbeit und deckten dabei mehrere Themengebiete aus der memristiven Forschung in Deutschland ab. Die Vorträge kommen aus dem Bereich der memristiven Bauteile, deren Test, Modellierung und Anwendung und decken dabei die volle vertikale Integration von Materialforschung über Bauteile bis hin zur Anwendungsebene ab. KW - Memristor KW - Memristive switching KW - RRAM KW - Modeling KW - Memristisches Schalten KW - Modellierung KW - Memristor KW - Modellierung Y1 - 2023 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus4-63489 ER - TY - JOUR A1 - Morales, Carlos A1 - Gertig, Max A1 - Kot, Małgorzata A1 - Alvarado, Carlos A1 - Schubert, Markus Andreas A1 - Zoellner, Marvin Hartwig A1 - Wenger, Christian A1 - Henkel, Karsten A1 - Flege, Jan Ingo T1 - In situ X-ray photoelectron spectroscopy study of atomic layer deposited ceria on SiO₂ : substrate influence on the reaction mechanism during the early stages of growth JF - Advanced Materials Interfaces N2 - Thermal atomic layer deposition (ALD) of cerium oxide using commercial Ce(thd)4 precursor and O₃ on SiO₂ substrates is studied employing in-situ X-ray photoelectron spectroscopy (XPS). The system presents a complex growth behavior determined by the change in the reaction mechanism when the precursor interacts with the substrate or the cerium oxide surface. During the first growth stage, non-ALD side reactions promoted by the substrate affect the growth per cycle, the amount of carbon residue on the surface, and the oxidation degree of cerium oxide. On the contrary, the second growth stage is characterized by a constant growth per cycle in good agreement with the literature, low carbon residues, and almost fully oxidized cerium oxide films. This distinction between two growth regimes is not unique to the CeOx/SiO₂ system but can be generalized to other metal oxide substrates. Furthermore, the film growth deviates from the ideal layer-by-layer mode, forming micrometric inhomogeneous and defective flakes that eventually coalesce for deposit thicknesses above 10 nm. The ALD-cerium oxide films present less order and a higher density of defects than films grown by physical vapor deposition techniques, likely affecting their reactivity in oxidizing and reducing conditions. KW - ALD KW - Cerium oxide KW - Growth model KW - In-situ KW - XPS Y1 - 2025 U6 - https://doi.org/10.1002/admi.202400537 SN - 2196-7350 VL - 12 IS - 5 PB - Wiley CY - Weinheim ER - TY - JOUR A1 - Sengül, Akant A1 - Reiter, Sebastian A1 - Lotfi, Zahra A1 - Efremenko, Julia A1 - Laroussi, Arwa A1 - Corley-Wiciak, Agnieszka Anna A1 - Ratzke, Markus A1 - Mirsky, Vladimir M. A1 - Wenger, Christian A1 - Fischer, Inga Anita T1 - Titanium nitride plasmonic nanohole arrays with polymer coating : optical properties and their humidity-induced modifications JF - Optical Materials Express N2 - The use of titanium nitride (TiN) for the fabrication of plasmonic structures such as nanohole arrays (NHAs) can enable their integration into optoelectronic devices on the silicon (Si) platform, for example, for the realization of on-chip chemical sensors and biosensors based on refractometric transduction. With a corresponding functionalization of the TiN nanohole arrays, these ultra-compact devices can be utilized in the development of various affinity sensors and sensor systems, such as cost-effective electronic noses for the early detection of gases in the food industry or agriculture. In this work, we focus on two types of coating for functionalization of TiN nanohole arrays: electrochemically synthesized poly-N-methylaniline and layer-by-layer deposited polyacrylic-acid/poly-allylamine (PAA/PAH). Our investigation comprises the experimental characterization of the optical properties of TiN nanhole arrays coated with polymer layers of different thicknesses as well as a comparison with simulation results. We demonstrate the potential of our setup sensing applications by measuring changes in optical properties of TiN nanohole arrays coated with PAA/PAH upon exposure to air of different humidity. KW - Chemical sensors KW - Extraordinary optical transmission KW - Localized surface plasmon resonance KW - Optical coatings KW - Optical properties KW - Refractive index Y1 - 2025 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:co1-opus4-72739 SN - 2159-3930 VL - 16 IS - 2 SP - 184 EP - 196 PB - Optica Publishing Group CY - Washington D.C. ER -