@phdthesis{Deplanque2007, author = {D{\´e}planque, Sylvain}, title = {Lifetime prediction for solder die-attach in power applications by means of primary and secondary creep}, url = {http://nbn-resolving.de/urn:nbn:de:kobv:co1-opus-4275}, school = {BTU Cottbus - Senftenberg}, year = {2007}, abstract = {The objective of this thesis was to accurately check and improve the models existing for eutectic solder alloys used in simulation tools. Creep deformation,which is the most important deformation mode of solders, of two solder alloys, the widely used eutectic SnPb and the environmentally friendly alternative solder alloy SnAgCu was tested. It was shown that it is necessary to model two different stages of this high temperature induced mechanism: To improve the current material definition, primary creep must be implemented in the FE-software in addition to the existing secondary creep models. This thesis shows how it is possible to test creep behaviour under cyclic loading conditions with a test specimen of novel design. So, primary creep was observed and reoccurs cyclically under such test conditions. Furthermore, steady state creep is also always observed. A Constitutive equation combining both primary and secondary creep was given and verified. This model was implemented in FE-code Ansys, and after performing different kinds of simulation, the necessity of simulating primary creep was demonstrated. In order to achieve reliability information by FE-simulation of solder die attach, the creep-fatigue behaviour with the mean of crack propagation must be modeled. Various kinds of chips on copper substrate (power-transistors) were thermally tested, and different methods were used to investigate crack propagation. These methods were scanning acoustic microscopy and microstructure analysis by optical microscopy. The influence of damage on thermal behaviour (i.e. the thermal resistance of the device) was also assessed. These results were compared with the simulation results in order to build a lifetime prediction model based on crack propagation analysis.}, subject = {Legierung; L{\"o}ten; Kriechen; Kriechen; L{\"o}tstelle; Rissfortschritt; Lebensdauer; Leistungselektronik; Creep; Solder joint; Crack propagation; Lifetime; Power electronic}, language = {en} }