Ingenieurwissenschaften
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Erscheinungsjahr
- 2020 (2) (entfernen)
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- Englisch (2)
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- Additive Manufacturing (1)
- Additive manufacturing (1)
- Inconel 718 (1)
- Kernel average misorientation (1)
- L-PBF (1)
- LPBF (1)
- Process monitoring (1)
- Residual stress (1)
- Texture (1)
- Thermography (1)
Organisationseinheit der BAM
- 8 Zerstörungsfreie Prüfung (2) (entfernen)
The effect of two types of scanning strategies on the grain structure and build-up of Residual Stress (RS) has been investigated in an as-built IN718 alloy produced by Laser Powder Bed Fusion (LPBF). The RS state has been investigated by X-ray diffraction techniques. The microstructural characterization was performed principally by Electron Backscatter Diffraction (EBSD), where the application of a post-measurement refinement technique enables small misorientations (< 2°) to be resolved. Kernel average misorientation (KAM) distributions indicate that preferably oriented columnar grains contain higher levels of misorientation, when compared to elongated grains with lower texture. The KAM distributions combined with X-ray diffraction stress maps infer that the increased misorientation is induced via plastic deformation driven by the thermal stresses, acting to self-relieve stress. The possibility of obtaining lower RS states in the build direction as a consequence of the influence of the microstructure should be considered when envisaging scanning strategies aimed at the mitigation of RS.
Thermography is one on the most promising techniques for in-situ monitoring of metal additive manufacturing processes. Especially in laser powder bed fusion processes, the high process dynamics and the strong focus of the laser beam cause a very complex thermal history within the produced specimens, such as multiple heating cycles within single layer expositions. This complicates data interpretation, e.g., in terms of cooling rates. A quantity that is easily calculated is the time a specific area of the specimen is at a temperature above a chosen threshold value (TOT). Here, we discuss variations occurring in time-over-threshold-maps during manufacturing of an almost defect free cuboid specimen.