Ingenieurwissenschaften und zugeordnete Tätigkeiten
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This presentation reviews the current state in the field of Laser-induced Periodic Surface Structures (LIPSS). These surface nanostructures are a universal phenomenon and can be generated on almost any material by irradiation with intense linearly polarized radiation. LIPSS are formed in a “self-ordered” way and are often accompanying material processing applications. They can be produced in a single-step process and enable surface functionalization through the adaption of optical, mechanical and chemical surface properties. Their structural sizes typically range from several micrometers down to less than 100 nanometers and show a clear correlation with the polarization direction of the laser radiation. Various types of surface structures are classified, relevant control parameters are identified, and their material specific formation mechanisms are analyzed for different types of inorganic solids, i.e., metals, semiconductors, and dielectrics, through time-resolved optical experiments and theoretical simulations. Finally, technological applications featuring surface functionalization in the fields of optics, fluidics, medicine, and tribology are discussed.
Nach einer Übersicht zu den immer schneller aktualisierenden Rahmenbedingungen von Politik und Gesellschaft folgt eine Übersicht zu materialwissenschaftlichen Problemen des Recyclings von Kunststoffen. Lösungsansätze aus der Forschung reichen von einfacher Optimierung bis hin zur radikalen Neukonstruktion der polymeren Werkstoffe. Aus dem bereits möglichen Ansatz "performance-by-design" wird ein neuer Weg des "recycling-by-design" adressiert. Dies inkludiert methodisch eine skalenübergreifende Modellierung und die Depolarisation bis zum Monomer.
The presence of polycarboxylate ether (PCE) based superplasticizers (SPs) has enormous influence on the early hydration of cement. C3A as the most reactive phase of Portland cement plays a significant role in early hydration reactions and affects the rheological performance. Therefore, this talk presents experimental results about the influence of delayed addition of PCEs on the Hydration of alite and C3A-gypsum pastes investigated by isothermal heat flow calorimetry. Complementary in-situ XRD was carried out on C3S and C3A-gypsum pastes to analyze hydration and phase changes related to the addition of PCE. Cement pastes with a delayed addition of PCE showed less retardation compared to simultaneous addition. The alteration caused by PCE is much more pronounced for C3A-gypsum mixes. With a delayed addition of SP, the hydration of C3A is less retarded or even accelerated. It is obvious that there is less retardation the later the addition of SP. Furthermore, the PCE alter the hydration of C3A when added delayed and exhibit changes in kinetics and Hydration rates. XRD results showed that more C3A is dissolved in the presence of PCE. Also, the gypsum depletion occurs earlier in the presence of PCE and even faster with delayed addition. Without PCE AFm starts to form just after the gypsum depletion. However, in the presence of PCE AFm already starts to form at the beginning of the hydration. Due to the faster gypsum depletion in the presence of PCE, also the transformation from ettringite into AFm begins earlier, but takes longer as without SP.
The presentation summarizes our recent results on the coupled electrochemical methods for high resolution corrosion studies. The combination of Scanning Electrochemical Microscopy (SECM) and multielectrode (MMA) based real-time corrosion monitoring was presented as a new method for achieving high time resolution in local electrochemical analysis. Correlative imaging by means of Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) was demonstrated as a tool for the investigation of local corrosion processes initiated by the intermetallic particles (IMPs) on AA2024-T3 aluminium alloy.
In service, most materials are operated under simultaneous corrosive and mechanical load and there are very few methods capable for testing material degradation under these conditions, especially when it comes to high resolution analysis. For this purpose, in this work, a tensile module capable of uniaxial stretching and compression with up to 5 kN force was integrated into an AFM stage. The elimination of the need for sample unmounting and remounting and the resulting possibility of keeping the sample under constant mechanical load during AFM measurements not only enables a precise positioning of the area of interest but also allows for the analysis of processes in the elastic deformation regime.
This methodology was demonstrated for two case studies. Scanning Kelvin Probe Force Microscopy (SKPFM) was used as the main tool to characterize the deformation behavior. Moreover, a flexible electrochemical measurement cell was used to enable electrochemical analysis by means of electrochemical impedance spectroscopy (EIS) and Linear Sweep Voltammetry (LSV) during AFM measurements at different levels of strain. The in situ AFM results are complemented by microstructure analysis by means of electron backscatter diffraction (EBSD).
In the first case study, the deformation induced delamination of a thin organic coating on AA2024 T3 aluminium alloy was investigated as a function of alloy surface treatment. The formation of cracks in the insulating passive film enabled an early detection of deformation processes by means of SKPFM. The second case study focused on the comparison of corrosion and deformation behavior of conventional and additively manufactured 316 stainless steels. In comparison to the conventional 316 stainless steel, the effect of processing was clearly detectable on the additively manufactured material as zones of inhomogeneous potential, which also affected the initiation of local corrosion processes. The contribution will provide detailed information on the new AFM setup and summarize our results from both case studies.
There are different ways how to prove the quality of the results obtained by electron microscopy and related microanalysis techniques, e.g. use of validated standard operation procedures, participation in proficiency testing exercises, use of certified reference materials, etc. International standards are able to provide requirements, specifications, guidelines or characteristics of methods, instruments or samples with the final goal that these can be used consistently in accredited laboratories. In the field of electron microscopy and microbeam analysis standardization and metrology are terms which are encountered rather seldom at major conferences and scientific publications. Nevertheless, spectra formats like EMSA/MSA for spectral-data exchange or tagged image file format (TIFF) for SEM, guidelines for performing quality assurance procedures or for the specification of X-ray spectrometers as well as of certified reference materials (CRMs) in EPMA, or measurement of average grain size by electron backscatter diffraction (EBSD), or guidelines for calibrating image magnification in SEM or TEM are ISO standards already published and used successfully by a large part of the electron microscopy and microbeam analysis community. A main and continuous task of ISO/TC 202 and its subcommittees is to identify and evaluate feasible projects/proposals needed to be developed into new international standards, particularly in respect to recent but established technology, such the silicon drift detector (SDD) EDS one.
Another international platform in the frame of which pre-standardization work can be organized is VAMAS (Versailles Project on Advanced Materials and Standards). International collaborative projects involving aim at providing the technical basis for harmonized measurements, testing, specifications, and standards to be further developed at ISO level. One key point of VAMAS activities is constituted by inter-laboratory comparisons for high-quality data. In the field of microbeam analysis, the technical working area (TWA) 37 Quantitative Microstructural Analysis deals with corresponding projects. Good ideas, e.g. on analysis of low-Z materials/elements and at low energies are particularly encouraged by directly contacting the author. Support and already available guidance will be supplied.
In well-annealed thin polymer films, with non-repulsive polymer/substrate interactions, an irreversibly adsorbed layer is formed. These adsorbed layers have shown enormous potential for technological applications. Due to the hard accessibility of these layers, their growth kinetics and molecular dynamics are still not fully understood. Here, the irreversibly adsorbed layers of Poly(2-vinylpyridine) (P2VP) and Poly(vinyl methyl ether) (PVME) thin films are revealed by solvent-leaching experiments. The growth kinetics of these layers is investigated as a function of original film thickness and annealing times. The thickness, topography and quality of the adsorbed layer is determined with Atomic Force Microscopy (AFM) and spectroscopic ellipsometry. Additionally, the molecular mobility of the adsorbed layer is investigated with Broadband Dielectric Spectroscopy (BDS). A recently developed nanostructured capacitor (NSC) is employed to measure the adsorbed layers with a free surface layer depending on annealing and solvent-leaching time. The results are quantitatively compared and discussed with respect to recently published work.
Nachdem Jahrzehnte die Grenzfläche zwischen Kohlefaser und Duroplastmatrix optimiert wurde liegt das Augenmerk heute auf der Polymermatrix selbst. Diese lässt sich hinsichtlich ihres Elastizitätsmoduls und ihrer Bruchfestigkeit verbessern, indem Nanopartikel aus Böhmit (AlOOH) eindispergiert werden. Der Vortrag geht auf integrale und hochauflösend-bildgebende Methoden ein die ein Verständnis der komplexen Zusammenhänge ermöglichen. Nach einer chemischen in-situ Analyse des Aushärtvorgangs, aus welchem sich die Bedeutung der externer Parameter ablesen lässt, werden diverse hochauflösende, neue Methoden der Rasterkraftmikroskopie (AFM) eingeführt. Der lokalen Bestimmung des E-Moduls der Nanopartikel folgen Ausführungen zum temperaturabhängigen Chemismus des Böhmits, der während der Aushärtung Wasser freisetzt. Die hochauflösende Bestimmung der Oberflächenpotentiale, der Steifigkeit, der attraktiven Kräfte zwischen Spitze und Probe sowie der Energiedissipation im Kontakt stellen auf der Nanoskala eine komplexe Datenquelle dar, die auf der Makroskala einer Ergänzung bedarf: Durch Kombination von dynamisch-mechanisch-thermischer Analyse einerseits und Kartierung physikalischer Eigenschaften auf der Nanoskala andererseits kann der Zusammenhang zwischen chemischer Steuerung der Netzwerkbildung und den mechanischen Eigenschaften des Nanokomposits geklärt werden. Überraschend ist, dass bei geeigneter Steuerung der lokale E-Modul der Polymermatrix den des Füllstoffs übersteigt. Die Rissfortschrittsenergie wird in Böhmit-modifiziertem Epoxy verbessert absorbiert, die These dazu ist, dass die (010)-Gleitebenen, die nur durch Wasserstoffbrücken zusammen gehalten werden, einigermaßen schadlos geschert werden können. Daraus folgt, dass das System auf der Nanoskala über einen, wenn auch begrenzten, Selbstheilmechanismus verfügt. Zudem wird durch die hohe Heterogenität der Steifigkeit und Energiedissipation des Nanokomposits eine Risstrajektorie vielfach umgelenkt und somit früher gestoppt. Ergebnisse dieses Vortrags stammen aus einer Zusammenarbeit innerhalb des DFG-Forscherverbundes FOR2021 „Wirkprinzipien nanoskaliger Matrixadditive für den Faserverbundleichtbau“.
Polymers at interfaces play a major role in a broad variety of applications ranging from engineering purposes (for instance polymer based nanocomposites) to high tech implications (for instance light emitting diodes). Here the glass transition and glassy dynamics is considered for epoxy-based nanocomposite with Layered Double Hydroxide nanofiller and for thin films of a misicble polymer blend of PVME/PS with thicknesses down to 7 nm. The materials are investigated by spectroscopic techniques (broadband and specific heat spectroscopy), as well as by fast scanning calorimetry and small- and wide-angle X-ray scattering.