Ingenieurwissenschaften und zugeordnete Tätigkeiten
Filtern
Dokumenttyp
- Vortrag (51)
Referierte Publikation
- nein (51)
Schlagworte
- Nanoparticles (26)
- VAMAS (23)
- Electron microscopy (14)
- Particle size distribution (12)
- Standardisation (9)
- Inter-laboratory comparison (8)
- Traceability (8)
- EBSD (7)
- Reference materials (7)
- SEM (6)
- AFM (5)
- FIB (5)
- ISO/TC 202 (4)
- Interlaboratory comparison (4)
- Microbeam analysis (4)
- Correlative imaging (3)
- EDS (3)
- ISO/TC 229 (3)
- Microbeam Analysis (3)
- Nano@BAM (3)
- SAXS (3)
- Sample preparation (3)
- Size (3)
- Thin films (3)
- TiO2 (3)
- nPSize (3)
- Advanced materials (2)
- CEN/TC 352 Nanotechnologies (2)
- EMPIR (2)
- Elektronenmikroskopie (2)
- Graphene oxide flakes (2)
- ISO (2)
- ISO/TC 229 Nanotechnologies (2)
- Imaging (2)
- Microanalysis (2)
- Nanomaterials (2)
- Nanoparticle concentration (2)
- Reference data (2)
- TEM (2)
- Article concentration (1)
- Artificial Intelligence (1)
- Auger electron spectroscopy (1)
- Automated Image Analysis (1)
- CUSP (1)
- Case studies (1)
- Certified reference materials (1)
- Correlative Imaging (1)
- Correlative analysis (1)
- EC4SafeNano (1)
- EDS-TM002 (1)
- EDX (1)
- EU (1)
- Electron Microscopy (1)
- Graphene oxide (1)
- HAXPES (1)
- Hyperspectral imaging (1)
- ISO/TC 201 (1)
- ISO/TC229 (1)
- ISOGScope (1)
- Image Segmentation (1)
- Inter-lab comparison (1)
- Inter-laboratory comparisons (1)
- Interlaboratory comparisons (1)
- Iridium oxide (1)
- Machine learning (1)
- Mesoporous (1)
- Metrology (1)
- Microplastic (1)
- Microplastics (1)
- Microscopy (1)
- Microstructure (1)
- Modelling (1)
- Morphology (1)
- Nano Characterisation (1)
- Nanoanalysis (1)
- Nanopartikel (1)
- Nanoplastics (1)
- Nanosafety (1)
- Nanosafety services (1)
- Nanoscale (1)
- Nanostructures (1)
- Neural Networks (1)
- Non-spherical shape (1)
- OECD TG 125 (1)
- Oberflächenanalytik (1)
- PC characterisation (1)
- Partikelgrößenverteilung (1)
- Performance check (1)
- Porosity (1)
- Porous layers (1)
- Pre-standardisation (1)
- Raman (1)
- Reference material (1)
- Reference procedures (1)
- Referenzdaten (1)
- Regional workshop (1)
- Reproducibility (1)
- SIMS (1)
- SOP (1)
- STEM-in-SEM (TSEM) (1)
- Shape (1)
- SiO2 (1)
- Size and shape distribution (1)
- Size distribution (1)
- Standardarbeitsanweisung (1)
- Standardisierung (1)
- Standardized check (1)
- Surface Analysis (1)
- Surface chemistry (1)
- Surface morphology (1)
- Surface morphology and chemistry (1)
- TKD (1)
- Test material (1)
- Thin film analysis (1)
- Titanium oxide (1)
- Transmission Kikuchi Diffraction (TKD) (1)
- X-Ray Spectroscopy (1)
- X-ray spectrometer (1)
- X-ray spectroscopy (1)
- XPS (1)
- electron microscopy (1)
Organisationseinheit der BAM
- 6 Materialchemie (50)
- 6.1 Oberflächen- und Dünnschichtanalyse (50)
- 1 Analytische Chemie; Referenzmaterialien (3)
- 4 Material und Umwelt (2)
- 4.2 Material-Mikrobiom Wechselwirkungen (2)
- 6.6 Physik und chemische Analytik der Polymere (2)
- 1.0 Abteilungsleitung und andere (1)
- 1.2 Biophotonik (1)
- 1.3 Instrumentelle Analytik (1)
Eingeladener Vortrag
- nein (51) (entfernen)
The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed.
One of the objectives of the EU Project EC4SafeNano (European Centre for Risk Management and Safe Innovation in Nanomaterials & Nanotechnologies) was to test and benchmark the services in order to check their relevance to address identified stakeholder needs, but also to evaluate the governance of the structure delivering the proposed services. The aim is to demonstrate the technical relevance of the services and the overall open structure organisation, including governance rules and operating procedures, by answering relevant identified questions (case studies) selected by a panel of stakeholders. Therefore, a significant part of the project will be devoted to this demonstration of the operational and functional basis of the organized network.
Challenges in Traceable Size Measurement of Non-Spherical, Non-Monodisperse Nanoparticles - nPSize
(2019)
Size measurement of nanoparticles (NP) becomes a challenging analytical problem when non-spherical shapes must be traceably measured. However, most industrial NPs have irregular shapes and broad size distribution making it often more complex to follow European regulatory to identify a material as a nanomaterial according to which accurate measurement of the smallest dimension and its size Distribution is necessary.
The European research project nPSize - Improved traceability chain of nanoparticle size measurements aims to fill this gap by developing potential non-spherical reference nanoparticles, measurement procedures and physical modelling to improve the traceability chain, comparability and compatibility for NP size measurements between different methods. Therefore, new model NP with well-controlled shape has been synthesized and are supposed to be systematically characterized using the traceable methods scanning/transmission electron microscopy, atomic force microscopy and small angle X-ray scattering.
Following NP candidates are under investigation with respect to their homogeneity and stability: (i) titania nanoplatelets (10-15 nm thickness x 50-100 nm lateral), (ii) titania bipyramides (~60 nm length x 40 nm width), (iii) titania acicular particles (100 nm length x 15-20 nm width; aspect ratio 5.5/6), (iv) gold nanorods (~10 nm width x 30 nm length), and (v) gold nanocubes (~55 nm x 55 nm x 55 nm). In addition, sample preparation procedures as well as measurement analysis procedures with evaluation of appropriate measurands and descriptors for each material class and method are being developed to support standardization. To underpin the traceability of the size measurement of nonspherical NP, physical modelling of the signals in e.g. electron microscopy techniques will be used and in combination, the implementation of machine learning is aimed to facilitate measurement Analysis procedures, especially regarding the accurate thresholding/segmentation of the NPs.zeige mehr
New reference material candidates for traceable size measurement of non-spherical nanoparticles
(2019)
New model nanoparticles with well-controlled shape were synthesized within the EMPIR project nPSize - Improved traceability chain of nanoparticle size measurements. Their systematic characterization takes place by the traceable methods scanning/transmission electron microscopy, atomic force microscopy and small angle X-ray scattering. Following reference nanoparticle candidates are under investigation with respect to their homogeneity and stability: titania nanoplatelets (10-15 nm x 50-100 nm), titania bipyramides (~60 nm x 40 nm), titania acicular particles (100 nm x 15-20 nm; aspect ratio 5.5/6), gold nanorods (~10 nm x 30 nm), and gold nanocubes (~55 nm x 55 nm x 55 nm).
New reference material candidates for traceable size measurement of nonspherical nanoparticles
(2019)
Size measurement of nanoparticles (NP) becomes a challenging analytical problem when non-spherical shapes must be traceably measured. However, most industrial NPs have irregular shapes and broad size distribution making it often more complex to follow European regulatory to identify a material as a nanomaterial according to which accurate measurement of the smallest dimension and its size Distribution is necessary.
The European research project nPSize - Improved traceability chain of nanoparticle size measurements aims to fill this gap by developing potential non-spherical reference nanoparticles, measurement procedures and physical modelling to improve the traceability chain, comparability and compatibility for NP size measurements between different methods. Therefore, new model NP with well-controlled shape has been synthesized and are supposed to be systematically characterized using the traceable methods scanning/transmission electron microscopy, atomic force microscopy and small angle X-ray scattering.
Following NP candidates are under investigation with respect to their homogeneity and stability: (i) titania nanoplatelets (10-15 nm thickness x 50-100 nm lateral), (ii) titania bipyramides (~60 nm length x 40 nm width), (iii) titania acicular particles (100 nm length x 15-20 nm width; aspect ratio 5.5/6), (iv) gold nanorods (~10 nm width x 30 nm length), and (v) gold nanocubes (~55 nm x 55 nm x 55 nm). In addition, sample preparation procedures as well as measurement analysis procedures with evaluation of appropriate measurands and descriptors for each material class and method are being developed to support standardization. To underpin the traceability of the size measurement of nonspherical NP, physical modelling of the signals in e.g. electron microscopy techniques will be used and in combination, the implementation of machine learning is aimed to facilitate measurement Analysis procedures, especially regarding the accurate thresholding/segmentation of the NPs.
There are different ways how to prove the quality of the results obtained by electron microscopy and related microanalysis techniques, e.g. use of validated standard operation procedures, participation in proficiency testing exercises, use of certified reference materials, etc. International standards are able to provide requirements, specifications, guidelines or characteristics of methods, instruments or samples with the final goal that these can be used consistently in accredited laboratories. In the field of electron microscopy and microbeam analysis standardization and metrology are terms which are encountered rather seldom at major conferences and scientific publications. Nevertheless, spectra formats like EMSA/MSA for spectral-data exchange or tagged image file format (TIFF) for SEM, guidelines for performing quality assurance procedures or for the specification of X-ray spectrometers as well as of certified reference materials (CRMs) in EPMA, or measurement of average grain size by electron backscatter diffraction (EBSD), or guidelines for calibrating image magnification in SEM or TEM are ISO standards already published and used successfully by a large part of the electron microscopy and microbeam analysis community. A main and continuous task of ISO/TC 202 and its subcommittees is to identify and evaluate feasible projects/proposals needed to be developed into new international standards, particularly in respect to recent but established technology, such the silicon drift detector (SDD) EDS one.
Another international platform in the frame of which pre-standardization work can be organized is VAMAS (Versailles Project on Advanced Materials and Standards). International collaborative projects involving aim at providing the technical basis for harmonized measurements, testing, specifications, and standards to be further developed at ISO level. One key point of VAMAS activities is constituted by inter-laboratory comparisons for high-quality data. In the field of microbeam analysis, the technical working area (TWA) 37 Quantitative Microstructural Analysis deals with corresponding projects. Good ideas, e.g. on analysis of low-Z materials/elements and at low energies are particularly encouraged by directly contacting the author. Support and already available guidance will be supplied.
The 44th Meeting of the Versailles Project on Advanced Materials and Standards (VAMAS) Steering Committee has just taken place at NIST in Boulder (CO, USA). BAM participates with significant contributions in Technical Working Areas on nanoparticle and surface chemistry characterization, but also has positioned itself to new global material challenges and trends in the developement of advanced materials and their characterization, such as thermal properties, self-healing materials, and micro- and nanoplastic.
An overview of the activities in the field of surface and microbeam analysis at BAM-6.1 is given with focus on physico-chemical characterization at the nanoscale. Ideas of potential joint activities are presented: structural and chemical analysis of graphene, deposition techniques for nanoparticles, EBSD on steel for a broader range of methods, instruments and types of steel, soft X-ray Analysis of low-Z materials, analysis of mesoporous thin films, etc.
Das EMPIR-Förderprogramm wird kurz erläutert und laufende Projekte aus der Nanotechnologie werden vorgestellt. Der Schwerpunkt liegt auf Standardisierungsprojekten, die gemeinsam mit ISO/TC 229 'Nanotechnologies' und CEN/TC 352 'Nanotechnologies' zu neuen Normen führen sollten. Als Beispiel für laufende Nanotechnologie-Projekte mit Koordination aus Deutschland werden MagNaStand (PTB) und nPSize (BAM) gegeben.