Ingenieurwissenschaften und zugeordnete Tätigkeiten
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In-situ SAXS techniques
(2018)
This project studies the orientation of nanoparticles under the influence of external stimuli such as electric fields, magnetic fields and ultra-sonic vibrations. A set of functional sample holders that fit inside the sample chamber of a state-of-the-art Small Angle X-ray Scattering (SAXS) machine, called the “Multi-scale Analyzer for Ultrafine Structures” (MAUS).
The MAUS has been custom engineered to serve as a miniaturized Synchrotron, thus enabling standard material to be characterized to a high standard. Our work is needed to detail the fine characterization of reference nano-particles, not only on the nano-scale, but also coupled with external agents.
A second aim of this project is to verify a few proof-of-concept designs for the alignment of nano-particles. Where the alignment of nano-particles In-Situ is intended to further develop 3D printing technologies, and SAXS is an ideal choice to study the alignment of an oriented ensemble.
For more information about the MAUS;
https://www.bam.de/Content/DE/Pressemitteilungen/2018/AnalyticalSciences/2018-01-31-mit-maus-an-die-spitze-der-nano-forschung.html
The electrochemical behavior of UNS N08031 was investigated as a function of electrode potential in Green-Death solution at 40 °C. The UNS N08031 surface is in a stable passive state during cyclic potentiodynamic polarization without an initiation and/or propagation of localized corrosion. In potentiostatic polarization of UNS N08031 for 3600 s, passive current density increases with an increase in the passivation potential from 0.7 to 1.0 VSSE (silver/silver chloride reference electrode in saturated potassium chloride) Electrochemical impedance spectroscopy (EIS) and Mott-Schottky (M-S) analysis showed that a more defective n-type semiconductive passive film forms as the potential increases. X-ray photoelectron spectroscopy (XPS) revealed that passive film consists of mainly chromium and minor iron and nickel oxides. The mechanism of the defective passive film formation is discussed. The increase of the applied potential is considered to be a reason for the change in passive film stability.
Der Vortrag gibt den aktuellen Stand der Normung im Bereich der Oberflächen-technik insbesondere der Oberflächenanalytik und der Oberflächenmess- und -prüftechnik wider.
Vorgestellt wird der Status technischer Berichte, Normenentwürfe und Normen u.a. zur Charakterisierung von funktionellen Glasoberflächen für bioanalytische Anwendungen, zur Messung der Schichtdicke von Nanomaterialien mittels Ellipsometrie, zur Kalibrierung von Interferometern und Interferenzmikroskopen für die Formmessung, zur Rockwelleindringprüfung zur Bewertung der Schicht-haftung, zu den Grundlagen der Ellipsometrie, zur Messung der Schichtdicke mittels Wirbelstromverfahren, zur Schichtpotentialmessung von Mehrfach-Nickelschichten, zu Filtern und Augenschutzgeräten gegen Laserstrahlung sowie zur Bestimmung der Schichthaftung mittels Zugversuch.
Der Vortrag gibt den aktuellen Stand der Normung im Bereich der Oberflächen-technik insbesondere der Oberflächenanalytik und der Oberflächenmess- und -prüftechnik wider. Vorgestellt wird der Status technischer Berichte, Normenentwürfe und Normen u.a. zur Charakterisierung von funktionellen Glasoberflächen für bioanalytische Anwendungen, zur Messung der Schichtdicke von Nanomaterialien mittels Ellipsometrie, zur Kalibrierung von Interferometern und Interferenzmikroskopen für die Formmessung, zur Rockwelleindringprüfung zur Bewertung der Schicht-haftung, zu den Grundlagen der Ellipsometrie, zur Messung der Schichtdicke mittels Wirbelstromverfahren, zur Schichtpotentialmessung von Mehrfach-Nickelschichten, zu Filtern und Augenschutzgeräten gegen Laserstrahlung sowie zur Bestimmung der Schichthaftung mittels Zugversuch.
The paper addresses “WHITE LIGHT INTERFERENCE MICROSCOPY, ELLIPSOMETRY, AND INSTRUMENTED INDENTATION TESTING AS REFERENCE PROCEDURES“ and is subdivided in the following sections: 1. Measurement vs. testing vs. reference procedures, 2. White light interference microscopy (WLIM) for determination of step height h, 3. Spectroscopic ellipsometry (SE) for determination of layer thickness d and 4. Instrumented indentation testing (IIT) for determination of indentation hardness HIT. The following points are discussed in more detail: methodology of measurement and testing, uncertainty budgets for direct (WLIM), model-based (SE) and formula-based (IIT) reference procedures by means of specific examples. It is shown that standardization efforts are connected to reference procedures.
The talk addresses the STANDARDIZATION OF ELLIPSOMETRY and the following points are discussed in more detail: historical background of ellipsometry, history of International Conferences on Ellipsometry, Workshops Ellipsometry in Germany and Europe, information on German/European Working Group Ellipsometry, technical/industrial importance of ellipsometry, applications on non-ideal material systems and standardization activities on ellipsometry.
Transparent conductive oxide (TCO) films are a vital part of a large part of modern technology. The production of TCO materials has sparked much development in plasma coating technology. Quality control measurements of these layers are therefore important in many fields of optics and electronics such as high efficiency thin film photovoltaics. In this presentation, we report on optical measurements of ZnSnOx layers generated by DC/RF magnetron plasma co-sputtering. By changing the respective power on two different targets, the overall power, the gas composition and post-treatment, the properties of this type of layers can be varied in a number of parameters. The optical, electrical, and chemical properties of TCO layers are the technically most important properties together with the layer thickness. The dielectric function of layers is accessible by means of spectroscopic ellipsometry, which also yields the very important value for the layer thickness at the same time. It would be a significant step forward in quality control to use this non-destructive method also as a fast test for electrical properties. Therefore, we report on the optical properties connected to the production parameters, and also on our preliminary results connecting the optical dielectric function (in the visible and near infrared) to the electrical conductivity of the layers. We discuss the effect of deposition parameters on the optical properties of the layers and present an approach for correlating optical and electrical properties. Further, we discuss the question of accuracy of optical properties gained from model-fit-based optical methods and the use of different parameterised models for the dielectric function to achieve this.
Multi-functional coatings are a key requirement for surface engineering. General demands are adhesion and long-term stability under service conditions. The modification of surfaces by means of PVD-, ECD- or hybrid processes allows an add-on functionalization of surfaces by a huge diversity of materials with both lateral and vertical micro-/nano-designs. This fact is a prerequisite for micro- and sensor-systems in lab-on-chip and sensor-on-chip technology. Two layer-based sensor principles are presented, i.e. surface plasmon resonance enhanced spectroscopic ellipsometry (SPREE) for detection of hazardous gases and magneto-optical sensors on smart-coated fiber Bragg gratings (FBG) for structural health monitoring (SHM).
The interdependence of substrate features, coating properties, and layer design is discussed firstly for gas sensitivity and selectivity of SPREE-sensors and secondly for sensitivity and selectivity of magneto-strictive coatings to mechanical strain or external magnetic fields resulting in an optical displacement of the Bragg wavelength of FBG-sensors. Moreover, generic features such long-term stability, crucial process-related fabrication conditions, and effects of operational and environmental parameters are discussed with respect to the sensor performance. It has been shown that appropriate layer design and adapted selection of layer materials (SnOx/Au, Fe/Ni:SnOx/Au; Ni/NiFe-Cu-Cr) result in improved sensor parameters and may enable new sensor applications.
Ellipsometry is well known as a highly sensitive and reproducible surface analysis technique. However, in a context of metrological applications, the most important property of a measurement process is accuracy, relying on statistical precision, (reproducibility) and trueness (in an absolute sense versus a given standard). The latter is much more difficult to achieve. In this presentation, we discuss the possibility of establishing ellipsometry in a diverse metrological landscape by means of defining standard procedures and best practice methodologies for the measurement and for calibration purposes. The most important task of this approach is to determine the model-inherent uncertainty, originating from parameter coupling. We achieve this by means of sensitivity analysis of the parameters resulting from the fit process. We discuss the definition of reference materials by which accuracy can be made available for ellipsometry, passed along between ellipsometry laboratories and for other measurement techniques. The determination of uncertainty is presented in this work for a number of examples involving difficult analysis models employed for samples from different production environments. We present a standardization initiative with the goal to disseminate this work into an international standard alongside an inter-laboratory study comparing the results for complex samples gained by laboratories with different instrumentation. We also present the results gained within EURAMET projects focused on the metrology of materials with strong non-idealities used in photovoltaics and other energy technology.
Der Vortrag widmet sich der „ELLIPSOMETRISCHE KLASSIFIZIERUNG VON KOHLENSTOFFSCHICHTEN“ und beschreibt die Punkte: 1. Anwendungen Kohlenstoffschichten–Carbon–based films (DLC) aus dem Vortrag N. Ohtakeet. al. (ISO TC 107, Tokyo 2017),2. Präparation der Kohlenstoffschichten für ISO TC 107 Ringversuch aus Vortrag M. Hiratsuka et. al. (ISO TC 107, Tokyo 2017), 3. Ellipsometrische Charakterisierung von Kohlenstoffschichten, Ergebnisse des Ringversuchs (ISO TC 107, Tokyo 2017) Vortrag Beck et. al. und 4.Deutsche Normungsaktivitäten national/international zur Ellipsometrie DIN NA 062-01-061 (DIN 50989-1)/TC 107 (PWI DE)“ im Einzelnen.
For the first time, the molecular mobility of two linear-shaped tetramethylated guanidinium triflates ionic liquid crystals (ILCs) having different length of alkyl chains was investigated by a combination of broadband dielectric spectroscopy (BDS) and specific heat spectroscopy (SHS). By self-assembly, these ILCs can form a hexagonal ordered mesophase besides plastic crystalline phases and the isotropic state. SHS was carried out by differential AC-chip calorimetry at higher frequencies and temperature modulated DSC at lower frequencies.
Two relaxation processes were found by BDS for both samples. At low temperatures, a γ-processes is observed which is assigned to specific localized fluctuations. At higher temperatures, α1-processes take place. α2 processes were also detected by SHS but with a completely different temperature dependence of the relaxation times. Different molecular assignments of α1- and α2-processes are suggested. At even higher temperatures, conductivity was detected by BDS. An increase in the DC conductivity by four orders of magnitude at the phase transition from the plastic crystalline to the hexagonal columnar mesophase is found. This result is traced to a change in the charge transport mechanism from a delocalized electron hopping in the stacked aromatic systems (in the plastic phase) to one dominated by an ionic conduction in the quasi-1D ion channels formed along the supermolecular columns in the ILC hexagonal mesophases.
For the first time, the molecular mobility of two linear-shaped tetramethylated guanidinium triflates ionic liquid crystals (ILCs) having different length of alkyl chains was investigated by a combination of broadband dielectric spectroscopy (BDS) and specific heat spectroscopy (SHS). SHS was carried out by differential AC-chip calorimetry at higher frequencies and temperature modulated DSC at lower frequencies. These ILCs can form a hexagonal ordered columnar mesophase. Two relaxation processes were found by BDS for both samples. At low temperatures, a γ-processes is observed which is assigned to specific localized fluctuations. At higher temperatures, α1-processes take place. α2 processes were also detected by SHS but with a completely different temperature dependence of the relaxation times. Different molecular assignments of α1- and α2-processes are suggested. At even higher temperatures, conductivity was detected by BDS.
In inorganic/polymer nanocomposites the polymer matrix region near a filler surface, termed as the interphase, is of topical interest due to its possible influence on the macroscopic properties of the material. The segmental dynamics of this interphase is expected to be altered, as compared to the pure matrix, which might percolate into the entire system. It was found that a so-called Rigid Amorphous Phase (RAF) is formed in the interfacial region by adsorption of the polymer segments onto the nanoparticles, yielding in their immobilization. Here, we employed a combination of two relaxation spectroscopy techniques (Broadband Dielectric Spectroscopy (BDS) and Specific Heat Spectroscopy (SHS) in a form of Temperature Modulated DSC (TMDSC)) to investigate the structure and molecular mobility of Epoxy/Inorganic nanofiller composites with different nanoparticles geometries and contents. The two techniques show different perspectives on the glassy dynamics; BDS is sensitive to dipole fluctuations, whereas SHS senses entropy fluctuations.
First, our dielectric relaxation investigations proved an existence of an additional process in nanocomposites, which is not present in the pure material. Due to the increasing intensity of the process with increasing filler content it was assigned as the α-process related to the segmental dynamics of polymer chains adsorbed onto the nanoparticles. Considering the expected high conductivity effects of the material, the dielectric data were analyzed by fitting a derivative of the HN function to a “conduction-free” loss spectra: ε''deriv=-(∂ε'/∂logω).
Second, TMDSC measurements were used to study the specific heat capacity of nanocomposites in its nanofiller content dependence. Assuming that RAF is proportional to the decrease of the specific heat capacity step (Δcp) in the glass transition region of the nanocomposites, comparing to the pure material, the inorganic/polymer interphase was quantitatively analyzed and the amount of RAF estimated.
Over the past decades research on the molecular dynamics of miscible polymer blends are of topical interest in the literature, in an attempt to understand the segmental mobilty of individual components, as it is affected by blending. In general, miscible polymer blends exhibit a complex behavior of the molecular mobility. For an A/B blend the relaxation times of component A and component B are affected by the spatial local compositional heterogeneity, present in binary systems on a microscopic level, regardless of the macroscopic homogeneity. Here, a combination of broadband dielectric and specific heat spectroscopy was employed to study the dynamically asymmetric PVME/PS blend with seven different compositions, focusing on samples with high PS contents. Considering that PS is dielectrically invisible, BDS is a powerful technique to study the response of PVME, as it is affected by PS segments. In this work the well-known binary relaxation times distribution of PVME in a blend, originating from the spatial local heterogeneity, was studied over ten decades in frequency, for the first time in literature. Secondly, one of the detected processes, α’-relaxation, shows a crossover from high-temperature behavior (system in equilibrium) towards a low temperature regime, where PS undergoes the thermal glass transition, resulting in confined segmental dynamics of PVME within a frozen network of PS. Here, we introduce a precise mathematical tool to distinguish between the temperature dependency regimes of the process, and examine the composition dependence of the crossover temperature, detected by dielectric spectroscopy. Moreover, the dielectric data was compared in detail with results obtained by specific heat spectroscopy. This comparison provides new insights in the dynamics and dynamic heterogeneity of the PVME/PS blend system.
Dynamics of nanoscopically confined PVME in thin films of an asymmetric miscible PVME/PS blend
(2018)
In recent years, substantial efforts have been devoted to investigating nanoscopic confinement of polymers, and its effect on glassy dynamics. Broadband Dielectric Spectroscopy (BDS) was used to study the dynamics of ultra-thin films of PVME/PS 50/50 wt% blend, employing a novel nano-structured capacitor sample arrangement. The investigated system shows a complex dynamic behavior. First, an α-relaxation, related to a bulk-like layer was found. Second, an α’-relaxation was observed, characteristic for dynamically asymmetric blends, where the out of equilibrium dynamics is attributed to weakly-cooperative PVME segments relaxing within a frozen environment of PS segments. Third, for thinnest films, an Arrhenius-like process was dominant in the dielectric spectra, indicating localized fluctuations of the segments. Relaxation rates of this process resembled that of the degenerated α-relaxation of the adsorbed layer, found for pure PVME [1], thus it was assigned accordingly. For thinnest films, this process undergoes a further confinement, due to the topological constraints, introduced by PS. Such multiple confinement effect has not been reported for ultra-thin films of polymer blends, before this study [2].
[1] Madkour, S. et al. ACS Appl. Mater. Interfaces 2017, 9, 7535.
[2] Madkour, S. et al. ACS Appl. Mater. Interfaces 2017, 9, 37289.
The interphase between the inorganic filler and the polymer matrix is considered as one of the most important characteristics of inorganic/polymer nanocomposites. The segmental dynamics of this interphase is expected to be altered as compared to the pure matrix, which might percolate into the entire system. For instance, it was found that a so-called Rigid Amorphous Phase (RAF) is formed by adsorption of segments onto the nanoparticles yielding to its immobilization. The RAF is available from the decrease of the specific heat capacity Δcp in the glass transition region of the nanocomposites. Here, precise Temperature Modulated DSC (TMDSC) was employed to study Δcp of epoxy/Boehmite nanocomposites with different nanofiller concentrations. Surprisingly, the investigated system showed an increase of Δcp with increasing filler concentration up to 10 wt%. This implies an increased fraction of mobile segments, and is in accordance with the found decreased value of the glass transition temperature Tg. Although for higher filler contents Tg further slightly decreases, Δcp decreases in contrary, indicating a formation of RAF. This behavior was discussed as a competition of mobilization effects, due to an incomplete crosslinking reaction, and the formation of RAF.
The structure and molecular dynamics of thin polymer films are of topical interest of soft matter-physics. Commonly, spatial structural heterogeneities of 1D confined thin films (surface, bulk-like and adsorbed layer), are expected to alter the glassy dynamics, compared to the bulk. Here, Specific Heat Spectroscopy (SHS) was used, to investigate the glassy dynamics of thin films of an asymmetric miscible PVME/PS 25/75 wt% blend. SHS measurements showed a non-monotonous thickness dependence of the dynamic Tg, on the contrary to the previously investigated PVME/PS 50/50 wt%. For PVME/PS 25/75 wt% thin films (> 30 nm), due to the presence of PVME-rich adsorbed and surface layers, the bulk-like layer experienced a thickness dependent increase of PS concentration. This led to a systematic increase of dynamic Tg. Further decrease of the film thickness (< 30 nm), resulted in a decrease of dynamic Tg, ascribed to the influence of the surface layer, which has a high molecular mobility. This is the first study, which shows deviations of dynamic Tg of thin films, compared to the bulk, resulting from the counterbalance of the free surface and adsorbed layer.
Dielectric spectroscopy (BDS) was employed to investigate the dynamics of thin films (7 – 200 nm) of a Poly (vinyl methyl ether) (PVME) / Polystyrene (PS) blend (50:50 wt%). For the BDS measurements Nano-Structured Capacitors (NSC) were employed, where films have a free surface. This method was applied for film thicknesses up to 36 nm. Thicker films were prepared between Crossed Electrodes Capacitors (CEC). The spectra of the films showed multiple processes. The first process was assigned to the -relaxation of a bulk-like layer. For films measured by NSC, its rates were higher compared to that of the bulk blend. This behavior was related to a PVME-rich free-surface layer. A second process was observed for films measured by CEC (process X) and the 36 nm film measured by NSC (process X2). This process was assigned to fluctuations of PVME constraint by PS. Its activation energy was found to be thickness dependent, due to the evidenced thickness dependency of the compositional heterogeneity. Finally, a third process with an activated temperature-dependence was observed for all films measured by NSC (process X1). It resembled the molecular fluctuations in an adsorbed layer found for films of pure PVME.
In recent years, substantial efforts have been devoted to investigating nanoscopic confinement of polymers, and its effect on glassy dynamics. Broadband Dielectric Spectroscopy (BDS) was used to study the dynamics of ultra-thin films of PVME/PS 50/50 wt% blend, employing a novel nano-structured capacitor sample arrangement. The investigated system shows a complex dynamic behavior. First, an α-relaxation, related to a bulk-like layer was found. Second, an α’-relaxation was observed, characteristic for dynamically asymmetric blends, where the out of equilibrium dynamics is attributed to weakly-cooperative PVME segments relaxing within a frozen environment of PS segments. Thirdly, for thinnest films, an Arrhenius-like process was dominant in the dielectric spectra, indicating localized fluctuations of the segments. Relaxation rates of this process resembled that of the degenerated α-relaxation of the adsorbed layer, found for pure PVME, thus it was assigned accordingly. For thinnest films, this process undergoes a further confinement, due to the topological constraints, introduced by PS. Such multiple confinement effect has not been reported for ultra-thin films of polymer blends, before this study.