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- Electron backscatter diffraction (2) (entfernen)
We present special applications of electron backscatter diffraction (EBSD) which aim to overcome some of the limitations of this technique as it is currently applied in the scanning electron microscope. We stress that the raw EBSD signal carries additional information which is useful beyond the conventional orientation determination. The background signal underlying the backscattered Kikuchi diffraction (BKD) patterns reflects the chemical composition and surface topography but also contains channeling-in information which is used for qualitative real-time orientation imaging using various backscattered electron signals. A significantly improved orientation precision can be achieved when dynamically simulated pattern are matched to the experimental BKD patterns. The breaking of Friedel’s rule makes it possible to obtain orientation mappings with respect to the point-group symmetries. Finally, we discuss the
determination of lattice parameters from individual BKD
patterns. Subgrain structure in a single quartz grain. The increased noise level in the left map reflects the lower precision of a standard orientation determination using band detection by the Hough transform. The right map results from the same experimental raw data after orientation refinement using a pattern matching approach. The colors correspond an adapted inverse pole figure color key with a maximum angular deviation of about 2° from the mean orientation.
The inverse pole figure (IPF) coloring for a suitable evaluation of crystal
orientation data is discussed. The major goal is a high correlation between
encoding color and crystal orientation. Revised color distributions of the
fundamental sectors are introduced which have the advantages of (1) being
applicable for all point groups, (2) not causing color discontinuities within grains,
(3) featuring carefully balanced regions for red, cyan, blue, magenta, green and
yellow, and (4) an enlarged gray center in opposition to a tiny white center. A
new set of IPF color keys is proposed which is the result of a thorough analysis
of the colorization problem. The discussion considers several topics: (a) the
majority of presently applied IPF color keys generate color discontinuities for
specifically oriented grains; (b) if a unique correlation between crystal direction
and color is requested, discontinuity-preventing keys are possible for all point
groups, except for 4, 3 and 1; (c) for a specific symmetry group several IPF color
keys are available, visualizing different features of a microstructure; and (d) for
higher symmetries a simultaneous IPF mapping of two or three standard
reference directions is insufficient for an unequivocal orientation assignment.
All color keys are available in MTEX, a freely available MATLAB toolbox.