Ingenieurwissenschaften und zugeordnete Tätigkeiten
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- 2018 (2)
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- Englisch (2)
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- Synchrotron X-ray refraction (2) (entfernen)
Organisationseinheit der BAM
In order to provide further evidence of damage mechanisms predicted by the recent solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al–3.85Mg was made using synchrotron X-ray refraction. X-ray refraction techniques detect the internal specific surface (i.e. surface per unit volume) on a length scale comparable to the specimen size, but with microscopic sensitivity. A significant rise in the internal specific surface with increasing creep time was observed, providing evidence for the creation of a fine grain substructure, as predicted by the SSTC model. This substructure was also observed by scanning electron microscopy
In order to provide further evidence of damage mechanisms predicted by the solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al–3.85Mg was made using synchrotron X-ray refraction (SXRR). X-ray refraction techniques capture the specific surface (i.e. surface per unit volume) with a field of view comparable to the specimen size but with microscopic sensitivity. A significant rise of the internal specific surface with increasing creep time was observed, providing evidence for the creation of a fine grain substructure, as predicted by the SSTC model.