Ingenieurwissenschaften und zugeordnete Tätigkeiten
Filtern
Dokumenttyp
- Posterpräsentation (2) (entfernen)
Sprache
- Englisch (2)
Referierte Publikation
- nein (2)
Schlagworte
- Damage (2) (entfernen)
Organisationseinheit der BAM
In order to provide further evidence of damage mechanisms predicted by the solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al–3.85Mg was made using synchrotron X-ray refraction (SXRR). X-ray refraction techniques capture the specific surface (i.e. surface per unit volume) with a field of view comparable to the specimen size but with microscopic sensitivity. A significant rise of the internal specific surface with increasing creep time was observed, providing evidence for the creation of a fine grain substructure, as predicted by the SSTC model.
X-ray refraction techniques represent a very promising, yet not so wide-spread, set of X-ray techniques
based on refraction effects. They allow determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with nanometric detectability. While they are limited by the X-ray absorption of the material under investigation, we demonstrate showcases of ceramics and composite materials, where understanding of microstructural features could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography.