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- Time-of-flight secondary ion mass spectrometry (2) (entfernen)
Organisationseinheit der BAM
This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences. The physical basics of the technique are explained along with a description of the typical instrumental setups and their modes of operation. The application paragraph specifically focuses on nanoparticle analysis by SIMS in terms of surface spectrometry, imaging, analysis in organic and complex media, and depth profiling.
A review of the existing literature is provided, and selected studies are showcased. Limitations and pitfalls as well as current technical developments of SIMS application in nanoparticle surface chemical analysis are equally discussed.
The effect of electrochemical charging of hydrogen on the structure of a lean duplex stainless steel LDX 2101® (EN 1.4162, UNS S32101) was examined by both Time-of-Flight secondary ion mass spectrometry and electron back-scatter diffraction. The goal is to correlate hydrogen concentration and induced structural changes. Chemical and structural characterizations were done for the same region at the sample's surface with sub-micron spatial resolution. Regions of interest were varying in size between 50 × 50 μm and 100 × 100 μm. The results show a phase transformation of austenite to mainly a defect-rich BCC and scarcely a HCP phase. The phase transformation occurred in deuterium rich regions in the austenite.