Ingenieurwissenschaften und zugeordnete Tätigkeiten
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AbstractLaser beam welding has become widely applied in many industrial fields in recent years. Solidification cracks remain one of the most common welding faults that can prevent a safe welded joint. In civil engineering, convolutional neural networks (CNNs) have been successfully used to detect cracks in roads and buildings by analysing images of the constructed objects. These cracks are found in static objects, whereas the generation of a welding crack is a dynamic process. Detecting the formation of cracks as early as possible is greatly important to ensure high welding quality. In this study, two end-to-end models based on long short-term memory and three-dimensional convolutional networks (3D-CNN) are proposed for automatic crack formation detection. To achieve maximum accuracy with minimal computational complexity, we progressively modify the model to find the optimal structure. The controlled tensile weldability test is conducted to generate long videos used for training and testing. The performance of the proposed models is compared with the classical neural network ResNet-18, which has been proven to be a good transfer learning model for crack detection. The results show that our models can detect the start time of crack formation earlier, while ResNet-18 only detects cracks during the propagation stage.
We present a workflow for obtaining fully trained artificial neural networks that can perform automatic particle segmentations of agglomerated, non-spherical nanoparticles from electron microscopy images “from scratch”, without the need for large training data sets of manually annotated images. This is achieved by using unsupervised learning for most of the training dataset generation, making heavy use of generative adversarial networks and especially unpaired image-to-image translation via cycle-consistent adversarial networks. The whole process only requires about 15 minutes of hands-on time by a user and can typically be finished within less than 12 hours when training on a single graphics card (GPU). After training, SEM image analysis can be carried out by the artificial neural network within seconds, and the segmented images can be used for automatically extracting and calculating various other particle size and shape descriptors.