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Organisationseinheit der BAM
- 6 Materialchemie (268) (entfernen)
Paper des Monats
- ja (1)
Spurenelemente spielen eine wichtige Rolle bei der Verfeinerung der Eigenschaften von komplexen Materialien. Diese Arbeit zeigt die Korrelation zwischen der Mikrostruktur, der Gitterfehlpassung und den Kriecheigenschaften. Die Legierung Al10Co25Cr8Fe15Ni36Ti6 (in at. %) mit komplexer Zusammensetzung wurde mit den Elementen Hf und W verstärkt. Die Zugabe von Hf bewirkt eine eckigere Form der würfelförmigen gamma'-Ausscheidungen und einen erhöhten Anteil der Heusler-Phase. Die Zugabe von W wiederum formt die Würfelchen rundlicher und löst die Heusler-Phase auf. Eine Mischung der beiden Spurenelemente zeigt einen Übergang zwischen den beiden Extremen, sowohl in Hinsicht auf die Form der Ausscheidungen als auch in Bezug auf die Gitterfehlpassung und die Kriecheigenschaften.
XPS of GR2M
(2022)
Direct Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy (XRM), which incorporates additional X-ray lenses, in three dimensions down to a minimal basic spatial resolution of about 500 nm or 50 nm, respectively. In this work, two different DLW structures are analysed via XCT. Internal defects are detected and analysed for the purpose of quality control. Defects and structures with sizes down to 1.5 µm are successfully analysed. A 3D reconstruction and internal, hidden features of the fabricated structures are shown and discussed. In a first-of-its-kind study, we demonstrate the detectability of a single-voxel line inside a fabricated structure that would not be detectable with SEM or light microscopy. Furthermore, the direct fabrication on a PET substrate is shown to overcome the high X-ray absorbance of commonly used glass substrates. Attenuation spectra of SZ2080 and glass substrates are compared to a fabrication route direct on a 170 µm PET foil. The practical aspects of XCT measurements for DLW structures on different substrates will be discussed.
Measuring an X-ray scattering pattern is relatively easy, but measuring a steady stream of high-quality, useful patterns requires significant effort and good laboratory organization.
Such laboratory organization can help address the reproducibility crisis in science, and easily multiply the scientific output of a laboratory, while greatly elevating the quality of the measurements. We have demonstrated this for small- and wide-angle X-ray scattering in the MOUSE project (Methodology Optimization for Ultrafine Structure Exploration).
With the MOUSE, we have combined a comprehensive and highly automated laboratory workflow with a heavily modified X-ray scattering instrument. This combination allows us to collect fully traceable scattering data, within a well-documented, FAIR-compliant data flow (akin to what is found at the more automated synchrotron beamlines). With two full-time researchers, our lab collects and interprets thousands of datasets, on hundreds of samples, for dozens of projects per year, supporting many users along the entire process from sample selection and preparation, to the analysis of the resulting data.
This talk will briefly introduce the foundations of X-ray scattering, present the MOUSE project, and will highlight the proven utility of the methodology for materials science. Upgrades to the methodology will also be discussed, as well as possible avenues for transferring this holistic methodology to other instruments
Wide-range X-ray scattering datasets and analyses for all samples described in the 2020 publication "Gold and silver dichroic nanocomposite in the quest for 3D printing the Lycurgus cup". These datasets are composed by combining multiple small-angle x-ray scattering and wide-angle x-ray scattering curves into a single dataset. They have been analyzed using McSAS to extract polydispersities and volume fractions. They have been collected using the MOUSE project (instrument and methodology).
Ultrashort pulse laser micromachining at repetition rates of several hundreds of kHz allows a cost-effective high precision manufacturing, which makes this method attractive for many industrial applications. Upon exceeding a critical laser intensity, hard X-ray radiation is generated as a side effect. Even if the emitted X-ray dose per laser pulse is low, for currently available high-repetition-rate laser systems the accumulated X-ray dose becomes significant and radiation safety must be considered. Influences of the processing parameters are discussed and radiation protection aspects will be outlined
Ultrashort pulse laser processing can result in the secondary generation of unwanted X-rays if a critical laser irradiance of about 10^13 W/cm^2 is exceeded. Spectral X-ray emissions were investigated during the processing of tungsten and steel using three complementary spectrometers (based on CdTe and silicon drift detectors) simultaneously for the identification of a worst-case spectral scenario. Therefore, maximum X-ray photon energies were determined, and corresponding dose equivalent rates were calculated. An ultrashort pulse laser workstation with a pulse duration of 274 fs, a center wavelength of 1030 nm, pulse repetition rates between 50 kHz and 200 kHz, and a Gaussian laser beam focused to a spot diameter of 33 µm was employed in a single pulse and burst laser operation mode. Different combinations of laser pulse energy and repetition rate were utilized, keeping the average laser power constant close to the maximum power of 20 W. Peak irradiances ranging from 7.3 × 10^13 W/cm^2 up to 3.0 × 10^14 W/cm^2 were used. The X-ray dose equivalent rate increases for lower repetition rates and higher pulse energy if a constant average power is used. Laser processing with burst mode significantly increases the dose rates and the X-ray photon energies. A maximum X-ray photon energy of about 40 keV was observed for burst mode processing of tungsten with a repetition rate of 50 kHz and a peak irradiance of 3 × 10^14 W/cm^2.
Luminescent lanthanides(III) offer exceptional optical properties that can overcome issues often encountered with other fluorophores (e.g. organic dyes). Their long lifetimes up to milliseconds, low photobleaching and sharp and characteristic emission peaks make the lanthanides extremely valuable for the development of advanced luminescent materials. Previous work on Ru(II) and Ir(III) gold surfaces further highlights the potential of employing the luminescence of metal complexes for the fabrication of sensing platforms and devices.
Here, we incorporate visible and NIR-emitting lanthanide(III) complexes Ln2L3 (Ln = Eu(III), Nd(III), Yb(III)) to gold and plasmonic surfaces, translating the unique optical properties of the lanthanides(III) to practical devices. The Ln2L3 complexes are deposited on the surfaces with different methods, ranging from polymer aided physisorption to the covalent attachment on the gold surface. Furthermore, we exploit the high sensitivity to the coordination environment of lanthanides(III) to design and prepare a sensing platform.
VAMAS-Enabling international standardisation for increasing the take up of Emerging Materials
(2022)
VAMAS (Versailles Project on Advanced Materials and Standards) supports world trade in products dependent on advanced materials technologies by providing technical basis for harmonized measurements, testing, specification, reference materials and standards. The major tools for fulfilling this task are interlaboratory comparisons (ILC). The organisation structure of VAMAS is presented. It is discussed, how a new technical activity can initiate.