Customized piezoresistive cantilever microprobes with a deflection range of 120 μm and silicon tips of 100 μm height were operated in a Cypher AFM showing their functionality for measuring topography together with stiffness, adhesion, and viscoelastic properties of thin films.
Atomic force microscopy (AFM) plays an important role as a multifuntional tool in nanotribology.In the present work it was shown that the main features of force-distance curves on different lubricants have been characterized and the underlying phenomena could be explained.