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Since there is a lack of knowledge about the effects of nanomaterials on human health and the environment, and in order to get safe- and sustainable-by-design nanomaterials, it is necessary to find an easy way to assess their properties, without having to perform time-consuming experiments each time. In the European project NanoSolveIT, the behavior of nanoparticles is to be derived from a nanomaterial fingerprint database with standardized physico-chemical properties of nanomaterials. The key element for these grouping and reading across approaches is the collection of standardized information about nanomaterials in combination with modelling and simulations. As parameters the particle size, particle shape, chemical composition and surface chemistry are discussed here.
Measurements of the shape and size were performed using scanning electron microscopy (SEM). For the chemical composition energy dispersive X-ray spectroscopy (EDS) and for the surface chemistry X-ray photoelectron spectroscopy (XPS) were used. As an additional method hard X-ray photoelectron spectroscopy (HAXPES) with a higher information depth than XPS was used, thus we were able to include information not only from the top surface, but also from deeper regions of about 30 nm. Therefore, this method is complementary to EDS.
All these methods have been correlatively used to study nanoparticles of different chemical composition that have been treated differently by sterilization. Such a sterilization step is common, before testing for toxicity. To date, the sterilization step has not been considered in establishing the structure-activity relationship of the nanomaterial.
The effects of sterilization are discussed on exemplary samples. The results demonstrate the influence of sterilization on all investigated properties, indicating a restructuring of the nanoparticles. This implies that samples that have been sterilized after synthesis, may show different toxicity from those used in applications without a sterilization step.
Acknowledgement: This research is part of the project “NanoSolveIT”, which has received funding from European Union Horizon 2020 Programme (H2020) under grant agreement no 814572. (https://nanosolveit.eu/)
Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. Promising opportunities for applications are discussed in different field like electronics and optoelectronics, detection, and sensing devices, biosystems or chemical and environmental corrosion inhibition. Here, functionalization with elements like oxygen, nitrogen or fluorine can broaden the application, for example in composite materials. However, lack of generally accepted operation procedures hinders the commercialization, the so-called “what is my material” barrier. Therefore, first efforts were done to develop common, reliable, and reproducible ways to characterize the morphological and chemical properties of the industrially produced material.
In this contribution, our efforts in the development of reliable chemical characterizations protocols for functionalized graphene are presented. An ISO standard for the chemical characterization of graphene-related (GRM) is under development with X-ray photoelectron spectroscopy (XPS) having a prominent role. With its information depth of around 10 nm, which is the similar length scale as the thickness of particles of 2D materials consisting of a few monolayers, XPS seems to be highly suitable for the quantitative analysis of (functionalized) GRM. Thereby, different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. Furthermore, different morphologies like stacks of graphene layers (left figure) or irregular particles (right figure) lead to different analysis results for the chemical composition.
For the validation of the quantification with XPS and the further development of standards an international interlaboratory comparison was initiated under the head of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results are reported showing the suitability of the protocols. Finally, the XPS results are compared with the elemental composition results obtained after quantification with energy-dispersive X-ray spectroscopy (EDS) as a fast analytical method which is usually combined with electron microscopy.
McSAS3 is a refactored software package for fitting large batches of (X-ray or Neutron) scattering data. It uses a Monte-Carlo acceptance-rejection algorithm to optimize model parameters - ideal for analysis of size-disperse scatterers.
The refactored code can exploit multiprocessing, traceably stores (multiple) results in the output file, and allows for re-histogramming of previous optimizations. Besides analysis of large batches, it can also be integrated in automated data processing pipelines.
The live demonstration will show how to use the software, what its limitations are, and what outcomes can look like for batches of results.
Elemental composition and thickness determination of thin films by electron probe microanalysis
(2023)
Electron probe microanalysis (EPMA) applies to solid samples of homogenous (bulk) chemical composition and can usually not be applied to structures which are inhomogeneous in the micrometer range such as thin film systems down to a few nm. However, in combination with the established thin film software Stratagem, the thickness as well as the elemental composition of thin films on a substrate can be determined. This has been recently successfully demonstrated for Fe-Ni on Si and Si-Ge on Al2O3 thin film systems. For both systems five samples of different elemental composition and a reference were produced and characterised by inductively coupled plasma mass spectrometry (ICP-MS), Rutherford backscattering (RBS), and transmission electron microscopy (TEM) as reference values. Last year, a new and open-source thin film evaluation programme called BadgerFilm has been released. It can also be used to determine thin film composition and thickness from intensity ratios of the unknown sample and standards (k-ratios). In this contribution, we reevaluated the data acquired for the Fe-Ni and Si-Ge systems using the BadgerFilm software package and compared the obtained elemental compositions and thickness values with the results of the Stratagem software and the reference methods. The conclusion is that the BadgerFilm software shows good agreement with the elemental composition and thickness calculated by Stratagem (mostly <2% for both composition and thickness) and with the reference values for two representative thin film systems (<1%–2% for composition and <10%–20% for thickness).
Python Materials Genomics (pymatgen) is a robust materials analysis code that defines classes for structures and molecules with support for many electronic structure codes. This open-source software package powers the Materials Project.
In this particular contribution, the handling of obital-resolved "ICOHPLIST.lobster" files from Lobster was implemented in the software package (github handle: @JaGeo).