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Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of Fe3O4 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.
X-ray photoelectron spectroscopy (XPS) is widely used for characterising the chemistry of graphene-related two-dimensional materials (GR2M), however the careful preparation of the sample for analysis is important in obtaining representative quantifications. We report an investigation by three laboratories showing that the preparation method for oxygen-functionalised graphene nanoplatelet (GNP) powders has a significant effect on the homogeneous-equivalent elemental composition measured in XPS. We show that pressing GNP powders onto adhesive tapes, into recesses, or into solid pellets results in inconsistencies in the XPS quantification. The measured oxygen-to-carbon atomic ratio from GNP pellets depends upon the die pressure used to form them and the morphology of the GNPs themselves. We recommend that powder samples of GR2Ms are pelletised prior to XPS analysis to improve repeatability and reproducibility of measurements.
Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. Promising opportunities for applications are discussed in different field like electronics and optoelectronics, detection, and sensing devices, biosystems or chemical and environmental corrosion inhibition. Here, functionalization with elements like oxygen, nitrogen or fluorine can broaden the application, for example in composite materials. However, lack of generally accepted operation procedures hinders the commercialization, the so-called “what is my material” barrier. Therefore, first efforts were done to develop common, reliable, and reproducible ways to characterize the morphological and chemical properties of the industrially produced material.
In this contribution, our efforts in the development of reliable chemical characterizations protocols for functionalized graphene are presented. An ISO standard for the chemical characterization of graphene-related (GRM) is under development with X-ray photoelectron spectroscopy (XPS) having a prominent role. With its information depth of around 10 nm, which is the similar length scale as the thickness of particles of 2D materials consisting of a few monolayers, XPS seems to be highly suitable for the quantitative analysis of (functionalized) GRM. Thereby, different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. Furthermore, different morphologies like stacks of graphene layers (left figure) or irregular particles (right figure) lead to different analysis results for the chemical composition.
For the validation of the quantification with XPS and the further development of standards an international interlaboratory comparison was initiated under the head of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results are reported showing the suitability of the protocols. Finally, the XPS results are compared with the elemental composition results obtained after quantification with energy-dispersive X-ray spectroscopy (EDS) as a fast analytical method which is usually combined with electron microscopy.