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There is an increasing interest in optical reporters like semiconductor quantum dots and upconversion nanocrystals with emission > 800 nm for bioanalysis, medical diagnostics, and safety barcodes. Prerequisites for the comparison of material performance, the mechanistic understanding of nonradiative decay channels, and the rational design of new nanomaterials with improved properties are reliable fluorescence measurements and validated methods for the assessment of their surface chemistry. The latter is of special relevance for nanocrystalline emitters, where surface states and the accessibility of emissive states by quenchers largely control accomplishable photoluminescence quantum yields and hence, signal sizes and detection sensitivities from the reporter side. Here, we present the design of integrating sphere setups for the excitation power density-dependent absolute measurement of emission spectra and photoluminescence quantum yields in the wavelength region of 350 to 1600 nm and results from spectroscopic studies of semiconductor quantum dots and upconversion nanocrystals of different size and surface chemistries in various environments. Subsequently, examples for simple approaches to surface group and ligand analysis are presented.
Nanocrystalline fluorophores like semiconductor quantum dots and rods and recently also lanthanide-based upconversion phosphors with emission in the visible (vis), near-infrared (NIR), and IR (infrared) region are increasingly being used in bioimaging studies and fluorescence assays as well as in photovoltaics and solid state lighting. The assessment and comparison of material performance as well as the development of rational design strategies for improved systems require spectroscopic tools, which enable the determination of the signal-relevant optical properties like photoluminescence quantum yields and brightness values. In the case of nonlinear fluorescence as shown by upconversion materials, such measurements must be also performed as function of excitation power density. In this work, we report on methods for the absolute determination of the photoluminescence quantum yield and brightness of fluorescent particles in dispersion and as powders based on integrating sphere spectroscopy and underline the importance of such measurements for the understanding of the photophysics of such nanocrystals.
The characterization of the optical properties of photoluminescent systems, that scatter, like dispersions of nanoparticles with sizes exceeding about 25 nm or solid nanophosphors is of increasing importance for many applications in the life and material sciences. Examples present nanoscale optical reporters and dye-doped microparticles for bioimaging, fluorescence assays or DNA sequencing as well as nanocrystalline emitters like semiconductor quantum dots and rods or lanthanide-based nanophosphors embedded into solid matrices for solid state lighting, display technologies, or barcoding/security applications. The assessment and comparison of material performance as well as the development of rational design strategies for improved systems require spectroscopic tools, which enable the determination of the signal-relevant optical properties like photoluminescence quantum yields and brightness values.
This encouraged us to built up an integrating sphere setup enabling absolute measurements of photoluminescence spectra and quantum yields of transparent and scattering photoluminescent dispersions and solid samples in different measurement geometries, i.e., direct and indirect illumination and the combination of both geometries and perform first measurements with selected emitters. Here, the design of this setup is presented and first recommendations concerning suitable measurement geometries are given.