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Ferritic-martensitic alloys with 12-16 % Cr in weight are subject to devices for various energy systems, such as coal power plants and waste incineration plants. These materials are exposed to a highly corrosive environment which lead to a degradation of the material. Especially the simultaneous oxidation and sulfidation is thereby of special interest. Proper spatially resolved measurements that determine not only chemical compositions but phases are rare. However, precise phase identification and quantification of corrosion products within the multi-phase corrosion scales is a key aspect to understand diffusion paths of metal ions and gas ions/molecules. This study investigated Fe-Cr model alloys with Cr contents from 0 to 13 % in weight in 0.5 % SO2 and 99.5 % Ar atmosphere to aim in a fundamental and systematic analysis. Samples were aged at 650 °C for time scales from 12 h to 250 h. The results presented here correspond to depth dependent phase identification of oxide and sulphide phases in the corrosion scales by using X-ray absorption near edge spectroscopy (XANES). Per sample a series of ca. 20 spots (1-5 µm spot size) from scale-gas to scale-metal interface were measured. XANES spectroscopy was performed at the Fe-K edge (7.11 keV) on polished cross sections. The collected spectra were fitted to a combination of reference materials to quantify the present phases at different positions within the scale.The phase distribution differs with Cr content and the Cr diffusion through pure Fe-oxide and mixed Fe-Cr-oxide phases is discussed.
Transparent conductive oxide (TCO) films are a vital part of a large part of modern technology. The production of TCO materials has sparked much development in plasma coating technology. Quality control measurements of these layers are therefore important in many fields of optics and electronics such as high efficiency thin film photovoltaics. In this presentation, we report on optical measurements of ZnSnOx layers generated by DC/RF magnetron plasma co-sputtering. By changing the respective power on two different targets, the overall power, the gas composition and post-treatment, the properties of this type of layers can be varied in a number of parameters. The optical, electrical, and chemical properties of TCO layers are the technically most important properties together with the layer thickness. The dielectric function of layers is accessible by means of spectroscopic ellipsometry, which also yields the very important value for the layer thickness at the same time. It would be a significant step forward in quality control to use this non-destructive method also as a fast test for electrical properties. Therefore, we report on the optical properties connected to the production parameters, and also on our preliminary results connecting the optical dielectric function (in the visible and near infrared) to the electrical conductivity of the layers. We discuss the effect of deposition parameters on the optical properties of the layers and present an approach for correlating optical and electrical properties. Further, we discuss the question of accuracy of optical properties gained from model-fit-based optical methods and the use of different parameterised models for the dielectric function to achieve this.
The paper addresses the “State-of-the-Art in Multiple-Sample Evaluation of Adhesive and Bonding Strength” and the following points are discussed in more detail:
1. Motivation (coatings, varnishes, tapes, laminates, CFRP, adhesive-bonded joints)
2. Conventional single-sample testing (evaluation of adhesive and bonding strength; failure pattern)
3. Multiple-sample handling (MSH), bonding (MSB), and testing: centrifugal adhesion testing (CAT) (multiple-sample approach, tensile test within a centrifuge)
4. Application examples of CAT-Technology™ (laminates, optical coatings, CFRP joints)
Finally, a summary is given regarding status quo and benefits of CAT-technology under tensile stress conditions whereas examples of testing in a centrifuge under compressive stress conditions are mentioned in the outlook.
Absorption edge tomography, also known as differential tomography at absorption edges, is a method which exploits the sudden change of the attenuation coefficient, when the photon energy crosses the absorption edge of an element. Synchrotron radiation is the best source for absorption edge tomography, because of its small bandwidth, high intensity and easily adjustable photon energy. The synchrotron beamline BAMline at the synchrotron radiation facility BESSY II in Berlin, which is operated by the Bundesanstalt für Materialforschung und -prüfung (BAM), provides a monochromatized beam in a photon energy range from 5 keV up to 80 keV with a bandwidth of 2%, when the double multilayer monochromator is used. Together with the microtomography setup, this enables differential tomography with submicron resolution at the K edge of the elements from chromium up to the lanthanides, and up to uranium, when the L edges are used as well.
In this work, metal organic frameworks (MOFs) embedded in polymer are characterized using differential tomography. MOFs are microporous structures of metal ions, coordinated by organic linker molecules, that can be used in a broad field of applications, especially in gas storage and catalysis. In this work, polymer embedded MOFs were extruded into filaments, which could be used for 3d-printing to profit from the specific properties of the MOFs in polymeric materials combined with the arbitrary shapes provided by 3d-printing. For the extrusion, different polymer classes like ABS, polyester- and polyetherurethanes, as well as different MOFs (ZIF-8, ZIF-67, HKUST-1) were used to create MOF containing filaments with a nominal diameter of 3.0 mm. Differential tomography at the edges of the Zn, Co, and Cu was then used to find the distribution of the corresponding MOF in the filament and to analyze the shape of the inclusions.
Zinc oxide (ZnO) as a wide-bandgap II-VI semiconductor finds application in areas like optoelectronics, photocatalysis as well as in detection systems. While band-gap engineering in macroscopic ZnO can be performed by alloying, the band-gap of ZnO nanoparticles is also dependent on their size. Since small-angle X-ray scattering (SAXS) provides a much higher resolution in terms of ultra-small nanoparticle size analysis compared to other techniques, it allows for a careful examination of the correlation between particle size and band-gap.
We report on the microwave-assisted synthesis of oleate-capped, photoluminescent zinc oxide nanoparticles with adjustable size as dispersions in organic solvents. The spherical particles were obtained by hydrolysis of the metal precursor in presence of a strong base at temperatures above the solvent’s boiling point. Hence, the reaction is dramatically accelerated and within seconds – instead of hours at lower temperatures –, narrowly dispersed particle systems are yielded. The particles’ sizes as derived from SAXS strongly depend on the reaction temperature and time. Choosing the right reaction conditions, the particle size and thus their band gap can be finely tuned. A size increase can be achieved both by increasing the reaction temperature and the reaction time.
See Figure 1 for an exemplary comparison of five-minute syntheses at different temperatures. Here, the yielded particles display diameters between 5.0 and 7.6 nm and corresponding band-gaps of 3.32 up to 3.41 eV. The size increase is accompanied by a red-shift of the UV/Vis absorption edges and fluorescence emission.
Furthermore, these particles can be transferred into water by coating with polysorbates.
XAFS@BAMline
(2018)
X-ray Absorption fine structure spectroscopy (XAFS) is a frequently employed technique in order to investigate structural composition and Change of chemical compounds such as catalytic species or corrosion processes. These structural properties are essential (i) to understand underlying reaction mechanism and (ii) to further improve the design of materials.
While XAFS measurements are usually performed with ionization Chambers or simple fluorescence detectors, we at BAMline specialize in measurements with innovative set-ups that meet Specialrequirements such as time resolution, (3D-) spatial Resolution or demanding sample environments.
This contribution presents various available XAFS configurations with their corresponding applications. In particular, these comprise single -shot XAFS for time- resolved measurements, grazing-exit XAFS with energy and a spatially resolved detector for the characterization of thin films and an in situ grazing incidence Setup for the characterization of corrosion layers.
Additionally,the possibility of analyzing Minute samples in total-reflection geometry is demonstrated.
X-ray absorption fine structure spectroscopy (XAFS) is a frequently employed technique in order to investigate structural composition and change of chemical compounds such as catalytic species. These structural properties are essential (i) to understand underlying reaction mechanism and (ii) to further improve the design of efficient catalysts.
This investigation is based on a newly developed XAFS setup comprising both time- and lateral-resolved XAFS information simultaneously in a single-shot (S2XAFS). The primary broadband beam is generated by a filter/X-ray-mirror combination (bandpass). The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by an area sensitive detector with a theta to 2 theta geometry. This facile, stable and scanningless setup was tested at the BAMline @ BESSY-II (Berlin, Germany).
This contribution focuses on further experimental optimizations allowing the characterization of supported vanadium oxide (VOx) based catalysts at the lower hard X-ray regime (5 to 6 keV). First S2XAFS measurements of these catalysts are presented herein. Supported VOx catalysts show promising results in the oxidation of methane to formaldehyde.
S2XAFS allows determining the structural composition of the metal (i.e. vanadium) based on a fast and smart setup. It is therefore an ideal tool to identify crucial roles of chemical compounds in catalytic reactions.
The Color X-ray Camera CXC or SLcam® is an energy-resolving X-ray camera capable of energy- and space-resolved measurements. It consists of a high-speed CCD detector coupled to a polycapil-lary optic that conducts the X-ray photons from the probe to distinct pixels onto the detector. The camera is capable of fast acquisition of spatially and energy resolved fluorescence images. A dedicated software enables the acquisition and the online processing of the spectral data for all 69696 pixels, leading to a real-time visualization of the elements distribution in a sample. It was developed in a joint project with BAM, IFG Berlin and PN Sensors. In this contribution we will mainly discuss the use of the CXC at our beamline, the BAMline at BESSY II and imaging applications of the CXC from different areas, like biology and archaeometry. Additionally new developments for the use of the detector without optics, like wavelength dispersive detection or 1shot-XANES, will be presented.
ZnSnOx coatings were deposited from two 2in magnetron targets made of
ZnO and SnO2 connected to DC pulsed and RF power supplies, respectively.
The pure Ar and reactive gas mixture Ar/O2 were used. DC pulsed power applied on ZnO target was kept constant 50W 50kHz, 20% d.c. and the RF power applied on SnO2 target was set to values from 0W (pure ZnO deposited) up to 150W (up to 8 at.% of Sn in films). The deposited films were investigated by multiple techniques as deposited at RT as well as after annealing at temperatures 200o C and 450o C. The lower annealing temperature is still compatible with many of common polymeric substrates.
The amount of Sn in the films is proportional to applied RF power on SnO2 target. But there is also significant influence of the post Deposition annealing on the film compositions. The ratio Zn/Sn is reduced by the annealing process. Therefore the annealing is promoting the migration of Sn toward the surface and Zn to inside. Moreover the films deposited in oxygen rich reactive gas mixture does not reduces the resistivity with added Sn in contrary to films deposited in Ar where the resistivity was reduced by 5 orders of magnitudes. The plasma parameters were investigated and mean energies of dominant species were in DC pulsed only about 3eV and DC + RF powered plasma up to 15eV. The expected higher energetic particles in the RF influenced plasma deliver an additional energy to the growing film. Therefore, we observed systematic differences between refractive indexes in the films deposited with low RF powered SnO2 magnetron at RT and post-annealed at 200 ° and practically no difference between RT and post-annealed film at higher RF power above 50 W. The XRD results proved the transitions from an amorphous to more crystalline structure by post-annealing of the films.