Analytische Chemie
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Main concept of magnetism and, therefore, of magnetic imaging can be subdivided into different levels, macroscopic, magnetic domain, and atomic. While conventional sensor solutions cover only the macroscopic level, the spatial resolution of GMR (Giant Magneto Resistance) sensors go down to the domain scale. In addition, those low cost sensors are well suited for automotive and industrial applications, particularly high-speed solutions. Main reason is their outstanding performance in terms of high spatial resolution, high accuracy, high bandwidth combined with field sensitivity, energy efficiency and durability.
In contrast to industrial use, down to the present day GMR sensors do not get beyond scientific scope in case of non-destructive testing (NDT) applications. Nevertheless, there are scientific and industrial NDT applications in which adapted GMR sensor can be promising compared to the conventional NDT methods.
This contribution summarizes findings at the BAM over the last decade which demonstrates the preeminent properties of GMR-based testing solutions. This comprises the active and passive testing of different materials with hidden defects and flaws near geometric boundaries like edges where conventional methods meet their limits. Another promising application for adapted GMR sensors is the characterization of magnetic materials, where the sensors provide additional information on microstructure, mechanical stress state, phase transformations and their interaction with magnetic fields. The examples show the need and benefit of NDT adapted GMR sensors.
The overview of the activity of group 8.5 Micro-NDT (BAM, Belin, Germany) in the field of additively manufacturing material characterization will be presented. The challenges in the residual stress analysis of AM components are discussed on the basis on the show studies performed in BAM. Also, the synchrotron X-ray refraction technique, available in BAM, is presented, showing example of in-situ heating test of Al10SiMg AM material.
The overview of the activity of Federal Institute for Material Research and Testing (BAM, Belin, Germany) in the field of additively manufacturing material characterization will be presented. The research of our group is focused on the 3D imaging of AM materials by means of X-ray Computed Tomography at the lab and at synchrotron, and the residual stress characterization by diffraction (nondestructive technique). Also, two successful research project in collaboration with CAM2, Sweden are presented.
The overview of the activity of Federal Institute for Material Research and Testing (BAM, Belin, Germany) in the field of additively manufacturing material characterization will be presented. The research of our group is focused on the 3D imaging of AM materials by means of X-ray Computed Tomography at the lab and at synchrotron, and the residual stress characterization by diffraction (nondestructive technique).
The focus of the presentation focus will be on 3D imaging by means of X-ray Computed Tomography (XCT) at the lab and at synchrotron, and the non-destructive residual stress (RS) characterization by diffraction of different kind of materials in FB8.5 Micro-NDT BAM. For instance, the manufacturing defects and high RS are inherent of additively manufacturing techniques and affect structural integrity of the components. Using XCT the defects size and shape distribution as well as geometrical deviations can be characterized, allowing the further optimization of the manufacturing process. Diffraction-based RS analysis methods using neutron and synchrotron X-rays at large scale facilities offer the possibility to non-destructively spatially resolve both surface and bulk RS in complex components and track their changes following applied thermal or mechanical loads.
The focus of the presentation focus will be on 3D imaging by means of X-ray Computed Tomography (XCT) at the lab and at synchrotron, and the non-destructive residual stress (RS) characterization by diffraction of additively manufactured (AM) materials in BAM (Berlin, Germany). The manufacturing defects and high RS are inherent of AM techniques and affect structural integrity of the components. Using XCT the defects size and shape distribution as well as geometrical deviations can be characterized, allowing the further optimization of the manufacturing process. Diffraction-based RS analysis methods using neutron and synchrotron X-rays at large scale facilities offer the possibility to non-destructively spatially resolve both surface and bulk RS in complex components and track their changes following applied thermal or mechanical loads.