Analytische Chemie
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As groundwork for thickness determination of polymeric surface protection systems for concrete, we present a method for measuring the thickness of isolated semitransparent solids using pulse thermography both in Transmission and reflection geometry. Since standard models do not capture semitransparency, an advanced analytical model by Salazar et al. is applied. Physical material parameters are deduced by fitting experimental data from samples of well-known
thickness. Using those, the thickness of samples of the material can be obtained by fitting, as demonstrated for different semitransparent polymer materials.
So far, only destructive measurement techniques are available for thickness determination of polymer based surface protection systems for concrete surfaces. Pulse thermography appears to be well suited for non-destructive thickness evaluation in these systems. Here, we present first results of the development of a respective measurement and analysis procedure. Since surface protection systems consist of a number of layers, a model for the calculation of the surface temperature of a multi-layer structure on an infinite (concrete) substrate in pulse thermography setup was developed. It considers semitransparency of the upmost layer and thermal losses at the surface. It also supports the use of an arbitrary temporal shape of the heating pulse to properly describe the measurement conditions for different heat sources. First experimental results regarding the verification of the model are presented.
Funding by the Federal Ministry for Economic Affairs and Energy is gratefully acknowledged.
As groundwork for thickness determination of polymeric surface protection systems for concrete, we present a method for measuring the thickness of isolated semitransparent solids using pulse thermography both in transmission and reflection configuration. An advanced analytical model by Salazar et al. capturing semitransparency is applied. After calibration with samples of well-known thickness, the unknown thickness of samples of the same material can be obtained by fitting.
Controlling thickness and tightness of surface passivation shells is crucial for many applications of core–shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the applicationrelevant functionality like a high photoluminescence (PL) quantum yield, calling for a whole nanoobject approach. By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. In addition to demonstrating the potential of this novel whole nanoobject approach for determining architectures of small nanoparticles, the presented results also highlight challenges faced by different sizing and structural analysis methods and method-inherent uncertainties.
ISO Technical Report 23173 describes methods by which electron spectroscopies, including X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the Coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state-of-the-art for such measurements. Such analyses of core–shell nanoparticles are common within the literature, however the
methods employed are varied; the relative advantages and disadvantages of These methods, and the optimal usage of each may not be clear to the general analyst. ISO Technical Report 23173 aims to clarify the methods that are available, describe them in clear terms, exhibit examples of their use, and highlight potential issues users may face. The information provided should allow analysts of electron spectroscopy data to make clear choices regarding the appropriate analysis of electron spectroscopy data from coated nanoparticle systems and provide a basis for understanding and comparing results from different methods and systems.