Analytische Chemie
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- Data correction (2) (entfernen)
Organisationseinheit der BAM
Data correction is probably the least favourite activity amongst users experimenting with small-angle X-ray scattering: if it is not done sufficiently well, this may become evident only during the data analysis stage, necessitating the repetition of the data corrections from scratch. A recommended comprehensive sequence of elementary data correction steps is presented here to alleviate the difficulties associated with data correction, both in the laboratory and at the synchrotron. When applied in the proposed order to the raw signals, the resulting absolute scattering cross section will provide a high degree of accuracy for a very wide range of samples, with its values accompanied by uncertainty estimates. The method can be applied without modification to any pinhole-collimated instruments with photon-counting direct-detection area detectors.
This poster deals with improvements and characteriztion of small-angle scattering limitations, by looking at the trifecta of Data collection and uncertainty propagation, data analysis methodologies, and real-world tests. It is found that - with appropriate care and instrumentation - accuracies of 1% on mean nanomaterial sizes, and 10% on the size distribution width as well as the volume fraction can be achieved.