Analytische Chemie
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In industrialised countries more than 80% of the time is spent indoors. Products, such as building materials and furniture, emit volatile organic compounds (VOCs), which are therefore ubiquitous in indoor air. VOC in combination may, under certain environmental and occupational conditions, result in reported sensory irritation and health complaints. Emission concentrations can become further elevated in new or refurbished buildings where the rate of air exchange with fresh ambient air may be limited due to improved energy saving aspects. A healthy indoor environment can be achieved by controlling the sources and by eliminating or limiting the release of harmful substances into the air. One way is to use (building) materials proved to be low emitting. Meanwhile, a worldwide network of professional commercial and non-commercial laboratories performing emission tests for the evaluation of products for interior use has been established. Therefore, comparability of test results must be ensured. A laboratory’s proficiency can be proven by internal and external validation measures that both include the application of suitable emission reference materials (ERM). For the emission test chamber procedure according to EN 16516, no artificial ERM is commercially available. The EU-funded EMPIR project MetrIAQ aims to fill this gap by developing new and improved ERMs. The goal is to obtain a material with a reproducible and temporally constant compound release (less than 10 % variability over 14 days). Two approaches were tested: the impregnation of porous materials with VOC, and the encapsulation of VOC in polymer microcapsules. Impregnation is performed with help of an autoclave and supercritical CO2. The encapsulation is done by interfacial polymerisation on VOC droplets. For both approaches, synthesis and/or material parameters were varied to obtain an optimal ERM. Findings about the optimisation of ERM generation, as well as performance of the best emission reference materials, will be presented.
The principles of (Hard) X-ray photoelectron spectroscopy and some application in the field of (core-shell) nanoparticles will be presented. The presentation should answer hoe to get reliable results. Furthermore, examples of the correlation between physical-chemical measurments and toxicological results are given which are crucial for the risk assessment of nanoparticles.
Climate change and increasing demand for electricity require the use of power electronics based on new wide bandgap (WBG) compound semiconductors. Power electronics devices are used in numerous application areas to control and convert electric energy. These may include generation and distribution of renewable energy for green hydrogen, electrification of transport or 5G communication. WBG electronics have much higher efficiency than the silicon-based ones and can operate at higher power densities, voltages, temperatures and switching frequencies with low energy losses. However, defects in the semiconductors can considerably affect the performance of power electronic devices or make their operation even impossible. The presentation will show the application of spectroscopic and imaging ellipsometry as well as white light interference microscopy for defect characterisation in SiC, GaN and Ga2O3 over a wide wavelength range.
We used parameterized modelling of ellipsometric transfer parameters to determine the dielectric properties of bulk materials and thin layers. Imaging ellipsometry offers more information and is an advanced variant of optical microscopy, combining the lateral resolution of optical microscopy with the extreme sensitivity to surface and interface effects of ellipsometry. Surface topography and morphology of different types of defects were additionally investigated with imaging white light interference microscopy. Modern electronic thin film components require complex surface analysis methodologies and hybrid metrology. Hybrid measurement techniques enable fast and non-destructive traceable characterisation of thin film compound semiconductors as well as accurate detection and identification of defects. This methodical approach leads to a better understanding of the materials themselves and of the defect formation mechanisms during manufacturing.
This work aims to enable highly reproducible manufacturing of compound semiconductor power electronics as well as operation monitoring to ensure failure-safety of electronic systems in power electronic devices.
An overview of personal experience with laser-induced plasma (LIP) will be given. The combination of LIP with laser-induced fluorescence, atomic absorption, Raman spectroscopy and spatial heterodyne spectroscopy for elemental and isotopic analysis will be discussed. Unusual applications of LIP will be covered, such as LIP-based lasers and LIP-based chemical reactors.
This course will provide an introduction to plasma diagnostic techniques. The major focus of the course will be on the discussions of the practical procedures as well as the underlying physical principles for the measurements of plasma fundamental characteristics (e.g., temperatures, thermodynamic properties, and electron number density). Particular emphasis will be placed on inductively coupled plasma–atomic emission spectrometry, but other analytical plasmas will also be used as examples when appropriate. Selected examples on how one can manipulate the operating conditions of the plasma source, based on the results of plasma diagnostic measurements, to improve its performance used for spectrochemical analysis will also be covered. Topics to be covered include thermal equilibrium, line profiles, temperatures, electron densities, excitation processes, micro reactions, pump and probe diagnostics, tomography,
temporal and spatial resolution. Basis of plasma computer modeling will be presented.
Until the 1980s radiography was used to inspect civil structures in case of special demands and showed a much better resolution than other NDT techniques. However, due to safety concerns and cost issues, this method is almost never used anymore. Meanwhile, non-destructive techniques such as ultrasound or
radar have found regular, successful practical application but sometimes suffer from limited resolution and accuracy, imaging artefacts or restrictions in detecting certain features when applied to reinforced or prestressed concrete inspection.
Muon tomography has received much attention recently. Muons are particles generated naturally by cosmic rays in the upper atmosphere and pose no risk to humans. Novel detectors and tomographic imaging algorithms have opened new fields of application, mainly in the nuclear sector, but also in spectacular cases such as the Egyptian pyramids.
As a first step towards practical application in civil engineering and as a proof of concept we used an existing system to image the interior of a reference reinforced 600 kg concrete block. Even with a yet not optimized setup for this kind of investigation, the muon imaging results have been at least of similar quality compared to ultrasonic and radar imaging, potentially even better. Recently, the research was expanded to more realistic testing problems such as the detection of voids in certain structural elements. However, before practical implementation, more robust, mobile, and affordable detectors would be required as well as user-Friendly imaging and simulation software.
Ellipsometry is a very powerful tool used for accurate material investigation in a wide wavelength range. It is a non-destructive and fast method. Imaging ellipsometry as a combination of optical microscopy and ellipsometry enables spatially resolved measurements when determining the layer thickness and dielectric properties of thin layers. It is known for its high polarisation sensitivity and high contrast for the surface structures. In this contribution we show the application of the imaging ellipsometry for detection of defects in energy materials and quality validation of possible reference materials for nano-electronics.
Defects in wide bandgap semiconductors, in homoepitaxial SiC and heteroepitaxial GaN layers on transparent SiC substrates, can be successfully detected and classified by means of imaging ellipsometry. Correlation of imaging ellipsometry results with results from complementary techniques such as white light interference microscopy as well as atomic force microscopy contribute to understanding of surface topography and defect formation mechanisms. We discuss the potential of different methods for analysing ellipsometric map data for monitoring the defect densities.
Electric properties of materials at the nanoscale can be investigated by means of scanning probe microscopy methods such as scanning microwave microscopy and conductive atomic force microscopy. However, development of new robust and easy-to-use calibration methods and calibration standards is essential to increase the traceability of these methods and allow their broad application in industry. We show how imaging spectroscopic ellipsometry can be used for development and monitoring of processing quality of patterned reference samples based on indium tin oxide (ITO) layer with different thickness and conductivity.
The built infrastructure ages and requires regular inspection and, when in doubt, monitoring. To ensure that older concrete bridges showing signs of deterioration can be used safely, several innovative monitoring tools have been introduced, including but not limited to optical, fiber-optic, or acoustic emission techniques. However, there are gaps in the portfolio. A sensing technique that covers a wide range of damage scenarios and larger volumes, while still being sensitive and specific, would be beneficial.
For about 15 years, research has been conducted on ultrasonic monitoring of concrete structures that goes beyond the traditional ultrasonic pulse velocity test (PV test), mostly using a very sensitive data evaluation technique called coda wave interferometry. At BAM we have developed sensors and instrumentation specifically for this method.
We have instrumented a 70-year-old, severely damaged prestressed concrete bridge in Germany in addition to a commercial monitoring system. We have now collected data for almost 3 years. We can show that we can provide information about the stress distribution in the bridge. We have also been able to confirm that there has been no significant additional damage to the bridge since the installation.
X-rays without X-rays: Can muon tomography provide pictures from within concrete and other objects?
(2024)
Until the 1980s radiography was used to inspect civil structures in case of special demands and showed a much better resolution than other NDT techniques. However, due to safety concerns and cost issues, this method is almost never used anymore. Meanwhile, non-destructive techniques such as ultrasound or
radar have found regular, successful practical application but sometimes suffer from limited resolution and accuracy, imaging artefacts or restrictions in detecting certain features when applied to reinforced or prestressed concrete inspection.
Muon tomography has received much attention recently. Muons are particles generated naturally by cosmic rays in the upper atmosphere and pose no risk to humans. Novel detectors and tomographic imaging algorithms have opened new fields of application, mainly in the nuclear sector, but also in spectacular cases such as the Egyptian pyramids.
As a first step towards practical application in civil engineering and as a proof of concept we used an existing system to image the interior of a reference reinforced 600 kg concrete block. Even with a yet not optimized setup for this kind of investigation, the muon imaging results have been at least of similar quality compared to ultrasonic and radar imaging, potentially even better. Recently, the research was expanded to more realistic testing problems such as the detection of voids in certain structural elements. However, before practical implementation, more robust, mobile, and affordable detectors would be required as well as user-Friendly imaging and simulation software.
The talk also discusses other applications , such as volcanology, mining and geothermal exploration.
Die Thermografie ist trotz ihrer ausgereiften wissenschaftlichen und technologischen Grundlagen ein noch relativ junges Mitglied in der Familie der zerstörungsfreien Prüfverfahren. Sie erschließt sich aufgrund einer Reihe von Vorzügen eine wachsende Anwendungsgemeinde. Für eine weitere Verbreitung insbesondere im industriellen Kontext spielen Normen, Standards und technische Regeln eine wichtige Rolle. In diesem Beitrag wird der aktuelle Stand der Normung in Deutschland vorgestellt. Wir zeigen, welche Normen und technischen Regeln es für die Thermografie in Deutschland und international gibt und wir wagen einen Blick in die Zukunft. Darüber hinaus lebt auch die Normierungsarbeit von der Beteiligung durch interessierte Kreise. Dies können industrielle und akademische Anwender*innen, Hersteller*innen von Geräten, Forschungseinrichtungen oder Dienstleistungsunternehmen sein. Sie können gern Ihre Bedarfe bezüglich Normierungsprojekten mitbringen und/oder direkt an die Autoren senden.