Forschungsdatensätze der BAM
Filtern
Erscheinungsjahr
- 2019 (1) (entfernen)
Dokumenttyp
Sprache
- Englisch (1) (entfernen)
Referierte Publikation
- nein (1) (entfernen)
Schlagworte
- Artificial neural networks (1) (entfernen)
Organisationseinheit der BAM
- 8 Zerstörungsfreie Prüfung (1) (entfernen)
AI-reflectivity is a code based on artificial neural networks trained with simulated reflectivity data that quickly predicts film parameters from experimental X-ray reflectivity curves. This project has a common root with (ML-reflectivity)[https://github.com/schreiber-lab/ML-reflectivity] and evolved in parallel. Both are linked to the following publication:
Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks A. Greco, V. Starostin, C. Karapanagiotis, A. Hinderhofer, A. Gerlach, L. Pithan, S. Liehr, F. Schreiber, S. Kowarik (2019). J. Appl. Cryst.
For an online live demonstration using a pre-trained network have a look at github.