Nano
Filtern
Dokumenttyp
- Vortrag (338) (entfernen)
Sprache
- Englisch (293)
- Deutsch (42)
- Spanisch (2)
- Mehrsprachig (1)
Referierte Publikation
- nein (338)
Schlagworte
- Nanoparticles (41)
- VAMAS (29)
- Nano (28)
- Laser-induced periodic surface structures (LIPSS) (21)
- X-ray scattering (21)
- Electron microscopy (19)
- Fluorescence (16)
- Interlaboratory comparison (16)
- Particle size distribution (16)
- Quantum yield (15)
- Dye (14)
- Quality assurance (14)
- Standardisation (14)
- Nanomaterial (13)
- SAXS (13)
- MOUSE (12)
- Reference materials (12)
- Nanomaterials (11)
- Surface functionalization (11)
- X-ray photoelectron spectroscopy (11)
- XPS (11)
- Functionalized graphene (10)
- Lifetime (10)
- Nanoparticle (10)
- Reference material (10)
- SEM (10)
- Traceability (10)
- Conductivity (9)
- Ellipsometry (9)
- Graphene (9)
- Particle (9)
- Femtosecond laser (8)
- Inter-laboratory comparison (8)
- Method (8)
- Metrology (8)
- Nanocomposites (8)
- Sample preparation (8)
- AFM (7)
- EBSD (7)
- Imaging (7)
- Integrating sphere spectroscopy (7)
- Luminescence (7)
- Photoluminescence (7)
- Photophysics (7)
- Quantum dot (7)
- Quantum dots (7)
- Small angle scattering (7)
- Surface analysis (7)
- Boehmite (6)
- HAXPES (6)
- Lab automation (6)
- Methodology (6)
- NIR (6)
- OECD (6)
- Optical spectroscopy (6)
- Particle size (6)
- Quantitative spectroscopy (6)
- Scattering (6)
- Standardization (6)
- Thin films (6)
- Uncertainty (6)
- EDS (5)
- FIB (5)
- Geant4 (5)
- Ionic Liquid crystals (5)
- Lanthanide (5)
- MCS (5)
- Measurement uncertainty (5)
- Nanoconfinement (5)
- Nanocrystal (5)
- Oxygen evolution reaction (5)
- Quantification (5)
- Reference data (5)
- Rigid amorphous fraction (5)
- SWIR (5)
- Spectroscopic ellipsometry (5)
- Surface chemistry (5)
- 2D materials (4)
- Advanced Materials (4)
- Automation (4)
- BDS (4)
- Calibration (4)
- Data stewardship (4)
- Dynamics (4)
- Fast Scanning Calorimetry (4)
- Femtosecond laser ablation (4)
- Geant4-DNA (4)
- Glass transition (4)
- ISO/TC 202 (4)
- Mesoporous iridium oxide films (4)
- Microbeam analysis (4)
- Nano powder (4)
- Nano@BAM (4)
- Nanocomposite (4)
- Nanoelectronics (4)
- Nanopartikel (4)
- Nanostructure (4)
- Non-destructive operando analysis (4)
- Oxidation (4)
- Risk assessment (4)
- Semiconductor quantum dot (4)
- Silica (4)
- Simulation (4)
- Size (4)
- Standard (4)
- Synthesis (4)
- TMDSC (4)
- Upconversion (4)
- VSSA (4)
- Adsorbed Layer (3)
- Assay (3)
- Characterization (3)
- Core-shell nanoparticles (3)
- Correlative imaging (3)
- Electromagnetic scattering (3)
- Electron Microscopy (3)
- Flash DSC (3)
- ISO/TC 229 (3)
- Introduction (3)
- Knowledge Readiness Level (3)
- Laboratory management (3)
- Linearity (3)
- Method comparison (3)
- Microbeam Analysis (3)
- Monte Carlo (3)
- Monte-Carlo simulations (3)
- Nano particle (3)
- Nanomaterialien (3)
- Nanoparticle concentration (3)
- Nanosafety (3)
- Optical assays (3)
- Particle scattering simulations (3)
- Polymer (3)
- Prüfrichtlinie (3)
- Sensing (3)
- Sensor (3)
- Software (3)
- Strategic Research Agenda (SRA) (3)
- ToF-SIMS (3)
- Topas (3)
- Upconversion nanocrystal (3)
- Upconversion nanoparticle (3)
- Validation (3)
- nPSize (3)
- 3D (2)
- Advanced manufacturing (2)
- Advanced materials (2)
- Analysis (2)
- Applications (2)
- Atomic Force Microscopy (2)
- Automated synthesis (2)
- Brightness (2)
- Broadband dielectric spectroscopy (2)
- Bundesoberbehörden (2)
- CEN/TC 352 Nanotechnologies (2)
- CLS (2)
- Calcium sulfate (2)
- Capillary waves (2)
- Cathodoluminescence (2)
- Chemical composition (2)
- Cleavable probe (2)
- Commercial graphene (2)
- Conductometry (2)
- Correlative Imaging (2)
- Correlative analysis (2)
- Cycloalyphatic epoxy oligosiloxane (2)
- Data (2)
- Data organization (2)
- Desintegracion radioactiva (2)
- Diagnosis (2)
- Dielectric Spectroscopy (2)
- Dosimetry (2)
- EC4SafeNano (2)
- EMPIR (2)
- EMPIR 18HLT01 MetVesII (2)
- Ectrocatalysis (2)
- Elastomers (2)
- Elektronenmikroskopie (2)
- Epoxy (2)
- European Metrology Network (EMN) (2)
- Extracellular vesicles (EV) (2)
- Femtosecond laser processing (2)
- Flow cytometry (FCM) (2)
- Fluorescence standard (2)
- Fluorescent particles (2)
- Fourier transforms (2)
- Friction (2)
- Glass (2)
- Graphene inks (2)
- Graphene oxide (2)
- Graphene oxide flakes (2)
- Graphene related 2D materials (2)
- Growth Kinetics (2)
- Holistic experimental procedures (2)
- Holistic experimentation (2)
- Holistic science (2)
- ISO (2)
- ISO/TC 229 Nanotechnologies (2)
- InP (2)
- Indium phosphide (2)
- Industrial applications (2)
- Instrument calibration (2)
- Instrumentation (2)
- Interfaces (2)
- Interlaboratory Comparison (2)
- Interlaboratory Comparisons (2)
- Korrosion (2)
- Laboratory automation (2)
- Laser processing (2)
- Laser-induced periodic surface structures, LIPSS (2)
- Machine learning (2)
- Method validation (2)
- Micro- and nanoplastics (2)
- Microanalysis (2)
- Microdosimetry (2)
- Microscopy (2)
- Microstructure (2)
- Multiphoton lithography (2)
- Multiplexing (2)
- Método de Montecarlo (2)
- Nano- and microsensors (2)
- Nano-powder (2)
- Nanocharacterisation (2)
- Nanofasern (2)
- Nanopipettes (2)
- Nanoplastic (2)
- Nanoplastics (2)
- Nanopulver (2)
- Nanotechnology (2)
- OECD TG 124 (2)
- Oberflächenfunktionalisierung (2)
- Optical assay (2)
- Orientation (2)
- Particle scattering simulation (2)
- Particle surface analysis (2)
- Partikel (2)
- Partikelgrößenverteilung (2)
- Performance validation (2)
- Processing (2)
- Protein (2)
- Quantitative NMR (2)
- Quantum yields (2)
- Radioactive decay (2)
- Radioactive nanoparticle (2)
- Raman (2)
- Ratiometric sensors (2)
- Reference product (2)
- Regulation (2)
- Reliability (2)
- Reproducibility (2)
- Reproducibility crisis (2)
- Robotics (2)
- SAXS/WAXS (2)
- SOP (2)
- Scicat (2)
- Sensor molecules (2)
- SiO2 (2)
- Single particle spectroscopy (2)
- Size distribution (2)
- Small-angle X-ray scattering (2)
- Spectroscopic imaging ellipsometry (2)
- Spectroscopy (2)
- Standardisierung (2)
- Surface (2)
- Surface Analysis (2)
- Surface Group Analysis (2)
- Surface group analysis (2)
- Surface group quantification (2)
- Surfaces (2)
- Synchrotron (2)
- TEM (2)
- Test material (2)
- Thin Films (2)
- TiO2 (2)
- Titania nanoparticles (2)
- Titanium alloy (2)
- Transmission electron microscopy (2)
- Transparent Conductive Oxides (2)
- Ultrafast laser processing (2)
- WAXS (2)
- Wear (2)
- White light interference microscopy (2)
- X-ray Photoelectron Spectroscopy (2)
- nanoparticula (2)
- pH sensing (2)
- 100Cr6 (1)
- 2D flakes (1)
- 3d structuring (1)
- AFM based test methods (1)
- AFM-IR (1)
- AFM-Kraft-Abstand-Kurven (1)
- AIS (1)
- Absolute measurement (1)
- Absorption (1)
- Achsschenkel (1)
- Additiv (1)
- Additive (1)
- Additive manufacturing (1)
- Advanced Manufacturing (1)
- Agglomerates (1)
- Aging (1)
- Alloy 36 (1)
- Aluminium alloy (1)
- Amorphous silica particles (1)
- Analytical chemistry (1)
- Analytical methods (1)
- Analytical sciences (1)
- Analytische Zentrifuge (1)
- Anisotropy (1)
- Antibakterielle Oberflächen (1)
- Antioxydant (1)
- Application (1)
- Article concentration (1)
- Artificial Intelligence (1)
- Atomic force microscopy (1)
- Au nanodisks (1)
- Au nanoparticles (1)
- AuNP (1)
- Auger electron spectroscopy (1)
- Automated Image Analysis (1)
- Automated analysis (1)
- Automated assay (1)
- Autonomous Materials Discovery (1)
- BAM Academy (1)
- BET (1)
- BMU (1)
- Bacteria repellent surfaces (1)
- Bacterial adhesion (1)
- Bacterial adhesion tests (1)
- Barcoding (1)
- Base damage (1)
- Base loss (1)
- Bead (1)
- Bessel-Strahlen (1)
- Bimodal (1)
- Bio-based concrete (1)
- Biofilm formation (1)
- Biofilm growth (1)
- Biofilme (1)
- Brownsche Molekularbewegung (1)
- Bruchmechanische Auslegung (1)
- Böhmit (1)
- C++ (1)
- CE-ICP-MS (1)
- Cancer (1)
- Cancer treatment (1)
- Case studies (1)
- Catalogue of Services (CoS) (1)
- Causes leading to scientific misconduct (1)
- Cell (1)
- Cement (1)
- Certification (1)
- Certified Referencematerial (1)
- Certified reference materials (1)
- Cetrifugal Liquid Sedimentation CLS (1)
- Chemical admixtures (1)
- Chemical analysis (1)
- Chemometric analysis (1)
- Cleavable probes (1)
- Cmake (1)
- Coating (1)
- Coatings (1)
- Comparison (1)
- Complementary methods (1)
- Computed tomography (1)
- Computertomographie (1)
- Contact resonance (1)
- Converter marterial (1)
- Core-shell nanoparticle (1)
- Core-shell structures (1)
- Core/shell nanoparticle (1)
- Correlative Spectroscopy (1)
- Corrosion (1)
- Cr(III) complex (1)
- Critical strain (1)
- Crystallization (1)
- Cubical Iron Oxide (1)
- Curing (1)
- Curve fitting (1)
- Cytotoxicity (1)
- DLS (1)
- DMAS (1)
- DNA (1)
- DNA radiation damage (1)
- DNA structures (1)
- DSC (1)
- Data Fusion (1)
- Data Management (1)
- Data analysis (1)
- Data analysis round robin (1)
- Data catalog (1)
- Data corrections (1)
- Data curation (1)
- Data management (1)
- Data manipulation (1)
- Data pipelines (1)
- Data processing (1)
- Data provenance (1)
- Data stewartship (1)
- Data visualisation (1)
- Databases (1)
- Datenfusion (1)
- Debian (1)
- Defect Analysis (1)
- Demonstration (1)
- Density (1)
- Depth profiling (1)
- Diclofenac (1)
- Differential scanning calorimetry (1)
- Diffraction (1)
- Digital laboratory (1)
- Digitalisation (1)
- Digitalisierung (1)
- Digitalization (1)
- Diopside (1)
- Direct damage (1)
- Dispersion process (1)
- Dissociative electron attachment (DEA) (1)
- Dissociative electron transfer (DET) (1)
- Doping (1)
- Double-strand break (DSB) (1)
- Durability (1)
- Dyad molecules (1)
- Dye labeling (1)
- Dünne Schichten (1)
- E. coli (1)
- EDS-TM002 (1)
- EDX (1)
- EPMA (1)
- ESCA (1)
- EU (1)
- Elastomer (1)
- Electrical Paramters (1)
- Electrical Properties (1)
- Electrical properties (1)
- Electrical thin layers (1)
- Electrocatalysis (1)
- Electrocatalytic Water Splitting (1)
- Electrochemical Titration (1)
- Electromagnetic radiation (1)
- Electron Probe Microanalysis (1)
- Electrospun fibers (1)
- Elektronisches Laborbuch (1)
- Ellipsometric porosimetry (1)
- Ellipsometrie (1)
- Encoding (1)
- Endpoints (1)
- Energiedissipation im Kontakt (1)
- Energy deposit (1)
- Energy dispersive X-ray spectroscopy (1)
- Energy materials (1)
- Energy transfer (1)
- Engineered Nanomaterials (1)
- Engineered nanomaterials (1)
- Epoxy nanocomposites (1)
- Epoxy-Anhydrid Duroplast (1)
- European Centre (1)
- European Metrology Networks (EMNs) (1)
- Experiment tracking (1)
- Experimental traceability (1)
- Extracellualr vesicles (1)
- FAIR (1)
- Fail-safe (1)
- FeNi nanoparticles (1)
- Field of view (1)
- Finite-difference time-domain calculations (1)
- Finite-difference time-domain calculations (FDTD) (1)
- Fityk (1)
- Flame retardant (1)
- Flow cytometry (1)
- Fluorescence microscopy (1)
- Fluorescence quantum yield (1)
- Fluorescent glasses (1)
- Fluorescent indicator (1)
- Focused Ion Beam (1)
- Force distance curve (1)
- Forschungsstrategie (1)
- Fourier Transform (1)
- Free electron laser (1)
- Free electron laser (FEL) (1)
- Functionalized Nanomaterials (1)
- Functionalized nano- and microparticles (1)
- Functionalized silica and polymeric particles (1)
- G5P (1)
- Gallium doping (1)
- Git (1)
- Glow-discharge optical emission spectroscopy (1)
- Glue (1)
- Gold (1)
- Granulometrie (1)
- Graphene funcionalisation (1)
- Graphene powder (1)
- Graphene related materials (1)
- Grenzfläche als Material (1)
- Größe (1)
- Größenbestimmung (1)
- Guideline (1)
- HEA (1)
- Halloysite nanotubes (1)
- Hard X-ray photoelectron spectroscopy (1)
- Hard X-ray photoelectron spectroscopy (HAXPES) (1)
- Hard-energy X-ray photoelectron spectroscopy (1)
- High resolution (1)
- High-resolution transmission electron microscopy (1)
- High-throughput (1)
- High-throughput measurements (1)
- History (1)
- Holistic experiment approaches (1)
- Homogeneous deposition (1)
- Hybrid metrology (1)
- Hydrated DNA (1)
- Hydrated electron (1)
- Hydration shell (1)
- Hydrodynamics (1)
- Hydrogen Generation (1)
- Hydroxyl radical (1)
- Hygiene (1)
- Hyperspectral imaging (1)
- ICP-MS (1)
- ILC (1)
- IR (1)
- ISO/TC 201 (1)
- ISO/TC229 (1)
- ISOGScope (1)
- ImAFM (1)
- Image Segmentation (1)
- Image analysis (1)
- Image manipulation (1)
- Imaging Ellipsometry (1)
- Imaging ellipsometry (1)
- In situ Atomic Force Microscopy (AFM) (1)
- Indirect damage (1)
- Instrument automation (1)
- Instrumentation utilization (1)
- Inter-laboratory comparisons (1)
- Intercomparability (1)
- Interlaboratory (1)
- Interlaboratory comparisons (1)
- Interpenetrating polymer network (1)
- Ionic liquid (1)
- Ionisation (1)
- Ionization (1)
- Iridium oxide (1)
- Iron oxide nanoparticles (1)
- JNP (1)
- Kerbschlagarbeit (1)
- Knowledge (1)
- Korrelation (1)
- Kunststoff (1)
- LEE (1)
- LIPSS (1)
- LLG (1)
- Laboratory methodology (1)
- Large number of participants (1)
- Laser Metal Deposition (LMD) (1)
- Laser ablation (1)
- Laser technology (1)
- Laser-Materialbearbeitung (1)
- Laser-induced Periodic Surface Structures (LIPSS) (1)
- Laser-induced amorphization (1)
- Laser-induced periodic surface structueres (LIPPS) (1)
- Laser-induced periodic surface structures (1)
- Laser-induzierte periodische Oberflächen-Nanostrukturen (1)
- Laser-induzierte periodische Oberflächenstrukturen (1)
- Lateral dimensions (1)
- Latex (1)
- Layer Materials (1)
- Layer system (1)
- Leichtbau (1)
- Lichtstreuung (1)
- Life sciences (1)
- Ligand (1)
- Ligand quantification (1)
- Ligands (1)
- Linux (1)
- Low energy electrons (1)
- Lubricant additives (1)
- Lubricants (1)
- Lubrication (1)
- Machine Learning (1)
- Magnetic nanoparticle (1)
- Mass spectrometry (1)
- Materials and Processes Data Reusability (1)
- Matter reorganization (1)
- McSAS3 (1)
- Measurement science (1)
- Mesoporous (1)
- Mesoporous Materials (1)
- Mesoporous iridium-titanium mixed oxides (1)
- Metadata (1)
- Metadata collection (1)
- Metadata structuring (1)
- Metal organic frameworks (1)
- Metal-organic frameworks (1)
- Method development (1)
- Methodology development (1)
- Methos comparision (1)
- Metrics (1)
- Metrological traceability (1)
- Micro- and Nanoplastics (1)
- Microfluidics (1)
- Micromagnetism (1)
- Micropatterning (1)
- Microplastic reference materials (1)
- Microprinting (1)
- Mie resonances (1)
- Mikrostrukturen (1)
- Modelling (1)
- Molecular Mobility (1)
- Molecularly Imprinted Polymers (1)
- Monte-Carlo simulation (1)
- Morphology (1)
- Multi-scale (1)
- Multicolored (1)
- Multifunctional nanoparticles (1)
- Multiphoton Lithography (1)
- Multiphoton laser structuring (1)
- Mussel inspired materials (1)
- NAP-XPS (1)
- NFDI (1)
- NMR (1)
- Nano Characterisation (1)
- Nano characterization (1)
- Nano material (1)
- Nano screening (1)
- Nano-related data (1)
- Nano-risk assessment (1)
- NanoSolveIT (1)
- Nanoanalysis (1)
- Nanoanalytics (1)
- Nanocarrier (1)
- Nanokomposit (1)
- Nanomaterial properties (1)
- Nanoparticles Synthesis and Characterization (1)
- Nanoplattform (1)
- Nanorisk (1)
- Nanorisk Governance (1)
- Nanosafety services (1)
- Nanoscale (1)
- Nanoscale luminescent reporters (1)
- Nanoscale measurements (1)
- Nanosilver (1)
- Nanostructural analysis (1)
- Nanostructure investigation (1)
- Nanostructure quantification (1)
- Nanostructures (1)
- Nanostrukturen (1)
- Nanotechnologie (1)
- Nanotoxicity (1)
- Native oxide layer (1)
- Natural rubber (1)
- Near ambient pressure xray photo electron spectroscopy (1)
- Net-ionization reaction (1)
- Neuartige Materialien (1)
- Neural Networks (1)
- Next Generation Sequencing (1)
- Nichtrostender Stahl (1)
- Niobium (1)
- Nnano particle (1)
- Noble metal nanoparticles (1)
- Non-spherical shape (1)
- Normung (1)
- Nucleation (1)
- OECD TG (1)
- OECD TG 125 (1)
- OH radical (1)
- OOMMF (1)
- Oberflächenanalytik (1)
- Oberflächenintegrität (1)
- Oberflächenmesstechnik (1)
- Oberflächenmodifikation (1)
- Oberflächenpotential (1)
- Oberflächensteifigkeit (1)
- Ontologies (1)
- Operating Procedure (1)
- Optical Spectroscopy (1)
- Optical flow (1)
- Optical measurements (1)
- Optical probes (1)
- Optical scattering (1)
- Oxygen (1)
- Oxygen sensing (1)
- PAG (1)
- PC characterisation (1)
- PEG (1)
- PES (1)
- PH probe (1)
- Paint (1)
- Paper mills (1)
- Parameter correlation. (1)
- Participatory Approach (1)
- Particle Synthesis (1)
- Particle number concentration (1)
- Particle scattering (1)
- Particle sensors (1)
- Particle size determination (1)
- Particle, imaging (1)
- Partikeldurchmesser (1)
- Partikelgröße (1)
- Partikelgrößenbestimmung (1)
- Partikelkonzentration (1)
- Passivation shell (1)
- Peptide Library (1)
- Peptides (1)
- Performance check (1)
- Phage Display (1)
- Phase transitions (1)
- Phosphor (1)
- Photocuring (1)
- Photodynamic therapy (1)
- Photon bunching (1)
- Photoresist (1)
- Pigments (1)
- Pitfalls (1)
- Plastic reference materials (1)
- Plastikstrategie (1)
- Pollutant (1)
- Polydopamine (1)
- Polyethylene Glycol (1)
- Polymer blends (1)
- Polymer foils (1)
- Polymer nanocomposites (1)
- Polysaccharides (1)
- Porosity (1)
- Power Electronics (1)
- Power electronics (1)
- Practical aspects (1)
- Pre-standardisation (1)
- Prehydrated electron (1)
- Preparation (1)
- Presolvated electron (1)
- Probe (1)
- Prürfrichtlinie (1)
- Pump-probe (1)
- Pycnometry (1)
- Quality assurcance (1)
- Quality control (1)
- Quantum Yields (1)
- Quarzglas (1)
- Quasi-direct damage (1)
- REACH (1)
- ROS (1)
- Radiation damage (1)
- Radiation therapy (1)
- Radical (1)
- Radioactive NP (1)
- Radiolysis (1)
- Radiotherapy (1)
- Reactive oxygen species (1)
- Recycling (1)
- Recycling-by-design (1)
- Reference methods (1)
- Reference procedures (1)
- Reference products (1)
- Reference standards (1)
- Referenzdaten (1)
- Regional workshop (1)
- Reibungsreduktion (1)
- Reinforcement (1)
- Release kinetics (1)
- Reliabiilty (1)
- Research Data Management (1)
- Rheology (1)
- Risk Governance (1)
- Risstrajektorie (1)
- Robotic synthesis (1)
- Robotic-supported synthesis (1)
- Round robin (1)
- Rreference material (1)
- Rubber (1)
- Röntgenrefraktion (1)
- SDLs (1)
- SIMS (1)
- SKPM (1)
- SMPS (1)
- STEM-in-SEM (TSEM) (1)
- Saccharide sensing (1)
- Safe-by-Design (1)
- Safe-by-design (1)
- Safety (1)
- Sample peparation (1)
- Saphir (1)
- Saxs (1)
- Scannig probe microscope (1)
- Scanning Electron Microscopy (1)
- Scanning Kelvin Probe Force Microscopy (SKPFM) (1)
- Scanning Probe methods (1)
- Scanning probe measurements (1)
- Schmiermittel (1)
- Scientific misconduct (1)
- Screening (1)
- Self-driving Labs (1)
- Semantic Interoperability (1)
- Semiconductor materials (1)
- Semiconductur (1)
- Sensors (1)
- Shape (1)
- Silane (1)
- Silica and Polystyrene Particles (1)
- Silica and polystyrene nanoparticles (1)
- Silica particles (1)
- Silicon (1)
- Silicon nanoparticles (1)
- Simulations (1)
- Single cell-ICP-ToF-MS (1)
- Single particle (1)
- Single particle-ICP-ToF-MS (1)
- Single-particle measurements (1)
- Single-strand break (SSB) (1)
- Single-stranded DNA-binding proteins (1)
- Small-Angle X-ray Scattering (1)
- Small-angle scattering (1)
- Small-angle x-ray scattering (1)
- Small-area XPS (1)
- Speciation analysis (1)
- Specific surface (1)
- Spektroskopie (1)
- Spezifische Oberfläche (1)
- Stability (1)
- Stakeholder (1)
- Standardarbeitsanweisung (1)
- Standardarbeitsanweisungen (1)
- Standardized check (1)
- Standards (1)
- Strain measurement (1)
- Structural characterisation (1)
- Superconductivity (1)
- Surface Analytics (1)
- Surface Modification (1)
- Surface functional group quantification (1)
- Surface group (1)
- Surface modification (1)
- Surface modified nano- and microparticles (1)
- Surface morphology (1)
- Surface morphology and chemistry (1)
- Surface oxidation (1)
- Sustainability (1)
- Sustainable-by-Design (1)
- Synthesis library (1)
- TGA (1)
- TMDCs (1)
- TOPAS (1)
- TOPAS-nbio (1)
- Terminal functional groups (1)
- Test guideline (1)
- Theoretical modelling (1)
- Theranostics (1)
- Thermogravimetry (1)
- Thin Layers (1)
- Thin film analysis (1)
- Thin polymer films (1)
- Ti6Al4V alloy (1)
- TiAl64V (1)
- Time of Flight - Secondary ion mass spectrometry (1)
- Time-of-Flight Secondary Ion Mass Spectrometry (1)
- Time-of-flight secondary ion mass spectrometry (ToF-SIMS) (1)
- Time-resolved analysis (1)
- Time-resolved coherent scattering (1)
- Time-resolved scattering (1)
- Titania (1)
- Titanium (1)
- Titanium oxide (1)
- Titration (1)
- ToF SIMS (1)
- Tools to combat scientific misconduct (1)
- Topas-nbio (1)
- Transition metal dichalcogenide (1)
- Transmission Kikuchi Diffraction (TKD) (1)
- Transmission electron microscopy (TEM) (1)
- Transparent conductive Oxides (1)
- Trinkwasser (1)
- Two photon polymerisation (1)
- Two-photon polymerisatio (1)
- UV-curing (1)
- Ultrakurzpuls-Laser (1)
- Ultrakurzpuls-Laserbearbeitung (1)
- Ultraschallunterstütztes Fräsen (1)
- Uncertainties (1)
- Upconversion nanoparticles (1)
- Verschleißreduktion (1)
- Viskosität (1)
- Werkstoffe (1)
- White light interferometric microscopy (1)
- Wide-bandgap semiconductors (1)
- Wirksumme (1)
- Workflows (1)
- X-Ray Spectroscopy (1)
- X-ray generation (1)
- X-ray instrumentation (1)
- X-ray spectrometer (1)
- X-ray spectroscopy (1)
- XRD (1)
- XRM (1)
- XUV scattering (1)
- Xray (1)
- Xray photo electron spectrocopy (1)
- attraktive Wechelwirkung (1)
- dispersion (1)
- electron microscopy (1)
- fluorescence standards (1)
- graphene related 2D materials (1)
- pH (1)
- particle size determination (1)
- qNMR (1)
- quality assurcance (1)
- sample preparation (1)
- single cell-ICP-ToF-MS (1)
- single particle-ICP-ToF-MS (1)
- surface group analysis (1)
- synthesis (1)
- Äquivalenzdurchmesser (1)
Organisationseinheit der BAM
- 6 Materialchemie (240)
- 6.1 Oberflächen- und Dünnschichtanalyse (143)
- 1 Analytische Chemie; Referenzmaterialien (63)
- 1.2 Biophotonik (56)
- 6.6 Physik und chemische Analytik der Polymere (38)
- 6.5 Synthese und Streuverfahren nanostrukturierter Materialien (37)
- 6.2 Material- und Oberflächentechnologien (34)
- 5 Werkstofftechnik (24)
- 4 Material und Umwelt (21)
- 5.4 Multimateriale Fertigungsprozesse (17)
The progress in the activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects/inter-laboratory comparisons. The recently started project FIB sample processing for TEM is presented. Next projects in the pipeline involving EBSD and TKD are shortly announced. The need of more promotion for the engagement of more experts from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed.
Both essential aspects of the surface of solid matter, its morphology and chemistry, are studied traditionally at BAM starting in the 60’s with different cyclical research focus areas, mostly related either to applicative research or method development. In the recent years, the focus has shifted almost exclusively to the nano-analytics of advanced materials such as complex nanoparticles, (ultra)thin films/coatings, nanocomposites, 2D materials, energy materials, etc. This is also the reason why BAM has established recently the new Competence Center nano@BAM (www.bam.de/Navigation/DE/Themen/Material/Nanotechnologie/sichere-nanomaterialien.html) with the five sub-fields nanoCharacterisation, nanoMaterial, nanoSafety, nanoData and nanoTechnology. The link to the BAM central guidelines to the safety in technology and chemistry is given by the development of reference products such as reference measurement procedures, reference (nano)materials, and newly reference data sets. Thus, an internationally well-networked group in surface analysis has been established @BAM, with regular contributions to integral analytical characterization with metrological and standardization background.
Examples of newly developed methodical approaches will be given with an emphasis on correlative nano-analysis of morphology and chemistry of nanomaterials. Correlative imaging by STEM-in-SEM with high-resolution SEM and EDX, and further with AFM or the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for surface chemistry will be highlighted. The panoply of advanced surface characterization methods @BAM is completed by discussing examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy with the highest surface-sensitive methods X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Particularly for the analysis of the surface chemistry of nanostructures, such as the completeness of the shells of core-shell nanoparticles or in-depth and lateral gradients of chemistry within mesoporous thin layers, the latter methods are inherent.
Other special developments like approaches for the quantitative determination of the roughness of particle surface by electron microscopy or for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM will be presented in conjunction with the corresponding advanced materials studied.
Current research projects, promising ideas, including ongoing (pre-)standardization activities in the field of the challenging nano/surface analysis will be touched systematically, with the open goal of identifying future bilateral cooperation possibilities between EMPA and BAM.
In order to assess new nanomaterials and nanoparticles for potential risks to health and the environment, they need to be well-characterised. The measurement of constituent nanoparticle size, shape, and size distribution are important factors for the risk evaluation process.
EMPIR project Improved traceability chain of nanoparticle size measurements (17NRM04, nPSize) is working to assess a range of traceable nanoparticle measurement approaches, including Electron Microscopy (SEM, TEM, STEM-in-SEM), Atomic Force Microscopy and Small Angle X-ray Scattering, and deliver improved calibration methods to users. For the techniques under investigation, physical models of their response to a range of nanoparticle types are developed. Validated reference materials are also used for inter-comparisons of measurement systems, with an evaluation of the associated measurement uncertainty. With project contributions to standards development work, manufacturers will be better placed to assess the human and environmental risks posed by nanomaterials across a whole range of products.
The presentation is structured in the following three parts:
i) Report of the Working Group 4 X-Ray Spectroscopy including the publication of ISO 15632:2021 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis,
ii) Liaison activities between ISO/TC202 Microbeam Anaylsis and VAMAS/TWA34 Quantitative Microstructural Analysis, and
iii) Liaison activities from ISO/TC202 Microbeam Analysis for ISO/TC229 Nanotechnologies.
Most relevant projects are highlighted for information and further discussions. New initiatives and better promotion of strategic projects are addressed.
The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. Further, a short overview of the VAMAS areas of activities is given where Germany is involved.
By far most of the current nanoparticle (NP) research is dealing with (quasi-) spherical and/or monodisperse particles. However, many NPs used in industrial applications are rather aspherical and polydisperse. This inhomogeneity considerably hampers their characterization and, particularly, the accurate determination of the nanoparticle size. In order to overcome this problem and to promote the availability of standardized size measurement methods, it is crucial to develop and establish (candidate) reference materials with inhomogeneous size (distribution), aspherical shape as well as agglomerated or aggregated particles.
Therefore, a new set of NPs including Au-, SiO2 , and TiO2-particles is investigated. The range of properties comprises polydisperse spherical, bimodal spherical, rod-like, acicular, bipyramidal, sheet-like as well as cubic NPs. With respect to a good traceability of the measurements, size and size distributions of the candidate reference materials are determined using microscopic methods like scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning electron microscopy in transmission mode (STEM-in-SEM), atomic force microscopy (AFM) as well as small angle X-ray scattering (SAXS) as an ensemble technique. The development of protocols for sample preparation is of particular importance to obtain a homogeneous dispersion of the NPs on a substrate. Further, approaches for signal modelling for all the methods above are being developed. The initiation of two VAMAS (www.vamas.org/twa34/index.html) inter-laboratory comparisons on bipyramidal titania and bimodal silica with different modal concentration ratios will be also highlighted.
It sounds like being a simple analytical task, it is definitely not. The way toward accurate measurement of the size distribution of nanoparticles (NPs) with complex shape, having a broad size polydispersity, with inhomogeneous chemistry, and with a high degree of agglomeration/aggregation is very challenging for all available analytical methods. Particularly for the NPs with complex shape, the access to the smallest dimension (as e.g. required for regulatory purposes) can be enabled only by using imaging techniques with spatial resolution at the nanoscale. Moreover, the full 3D-chacterisation of the NP shape can be provided either by advanced characterization techniques like 3D-TEM tomography or by correlative analysis, i. e. synergetic/complementary measurement of the same field-of-view of the sample with different probes. Examples of the latter type of analysis are: i) electron microscopy for the lateral dimensions and AFM for the height of the NPs, ii) SEM with STEM-in-SEM (also called T-SEM), iii) Electron Microscopy with TKD (Transmission Kikuchi Diffraction) for determination of the geometrical orientation of crystalline NPs, iv) Raman and SEM for e.g. thickness of graphen flakes, or v) Electron Microscopy for descriptive NP shape and SAXS for the NP concentration, the latter as a NP property able to be measured with higher and higher accuracy. For all these types of measurement, reference NPs are necessary for the validation of the measured size. Particularly non-spherical reference NPs are still missing. Examples of such new reference NPs as characterized by the correlative analyses enumerated above will be presented in detail in the contribution.
For test laboratories operating under accreditation schemes like ISO/IEC 17025 (ISO/IEC 17025), as the international reference for testing and calibration laboratories wanting to demonstrate their capacity to deliver reliable results, a periodical control of the critical instrumental parameters of an Energy-Dispersive X-ray Spectrometer (EDS) is required.
This periodical check of an EDS is specified with exact procedures and materials in the ISO 15632:2021 ”Microbeam Analysis – Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis” (ISO 15632). The EDS check can be simplified to the acquisition of only one 10 kV spectrum from a dedicated test material, EDS-TM002, which is made available by BAM since 2009 (https://webshop.bam.de/webshop_en/). The optional BAM software “EDX spectrometer check” is destined to automatically evaluate this spectrum and determine the performance of the EDS in terms of energy resolution and calibration, as well as possible alteration of low-energy efficiency due to detector contamination. Nearly 200 laboratories have the EDS-TM and associated software package in use.
Practical examples based on various types of artifacts occurred in the EDS spectra and a long-term (>10 years) meticulous observation of the own spectrometers will be discussed. Different types of EDS spectrometers are considered, e.g. Si(Li) and SDD, of various window types (AP, the recent one Si3N4 or even windowless), and with different front contact layers (Au and Ni) (Hodoroaba and Procop, 2014). Evaluation of other parameters or effects such as the deadtime at different count rates or pileup effects is also explained with examples.
The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed.
The 44th Meeting of the Versailles Project on Advanced Materials and Standards (VAMAS) Steering Committee has just taken place at NIST in Boulder (CO, USA). BAM participates with significant contributions in Technical Working Areas on nanoparticle and surface chemistry characterization, but also has positioned itself to new global material challenges and trends in the developement of advanced materials and their characterization, such as thermal properties, self-healing materials, and micro- and nanoplastic.