Nano
Filtern
Dokumenttyp
- Zeitschriftenartikel (353)
- Vortrag (341)
- Posterpräsentation (104)
- Forschungsdatensatz (55)
- Sonstiges (19)
- Beitrag zu einem Tagungsband (16)
- Buchkapitel (10)
- Beitrag zu einem Sammelband (10)
- Forschungsbericht (9)
- Zeitschriftenheft (Herausgeberschaft für das komplette Heft) (6)
- Video (5)
- Sammelband (Herausgeberschaft für den kompletten Band) (4)
- Handbuch (4)
- Preprint (4)
- Monografie (1)
- Dissertation (1)
- Newsletter (1)
Sprache
- Englisch (888)
- Deutsch (52)
- Spanisch (2)
- Mehrsprachig (1)
Schlagworte
- Nanoparticles (127)
- Nano (71)
- SAXS (64)
- XPS (60)
- Laser-induced periodic surface structures (LIPSS) (57)
- Fluorescence (53)
- Quantum yield (53)
- Electron microscopy (51)
- Nanoparticle (49)
- X-ray scattering (46)
Organisationseinheit der BAM
- 6 Materialchemie (670)
- 6.1 Oberflächen- und Dünnschichtanalyse (351)
- 1 Analytische Chemie; Referenzmaterialien (190)
- 1.2 Biophotonik (163)
- 6.6 Physik und chemische Analytik der Polymere (137)
- 6.5 Synthese und Streuverfahren nanostrukturierter Materialien (131)
- 6.2 Material- und Oberflächentechnologien (88)
- 5 Werkstofftechnik (64)
- 4 Material und Umwelt (47)
- 5.4 Multimateriale Fertigungsprozesse (33)
Paper des Monats
- ja (16)
Interaction of electromagnetic waves, such as electron beams or light, with conductive material can lead to localized surface plasmon resonances (LSPRs) where the incoming energy can be deposited in a collective excitation of electrons of the conduction band, which in turn can result in coherent localized plasmon oscillations. LSPR in metallic nanostructures, such as nanoparticles (NPs), which are sensitive to geometry, material composition and environment, are currently utilized in a wide range of applications, such as surface-enhanced Raman spectroscopy, plasmonic wave guides, improved solar cells, on-chip particle accelerators and nanoantennas. A host of studies that focus on plasmonic NPs ranging from single NPs with several shapes (cubic, spherical, tetrahedral) over 1D assemblies of NPs such as chains, to ordered 2D assemblies of NPs show an increase of the complexity regarding the hybridization behavior of LSPRs eventually lead to delocalized Surface Plasmons. Furthermore, Anderson predicted in 1977 the absence of diffusion or delocalization of waves in disordered systems, which has been discussed as the underlying mechanism for LSPRs localization in disordered metallic thin films and ultrathin 2D networks. Our aim is to further develop these studies on the surface plasmon localization in disordered structures by (1) developing a novel NPs assembly fabrication method that allows fabricating disordered assemblies of NPs of a wide range of NPs sizes, and (2) probing the LSPR with high-resolution electron energy-loss spectroscopy (EELS). Moreover, the dominant dipolar interaction between the NPs, also facilitates an efficient numerical modeling of these systems, which in comparison with the experiments allows for an in-depth study of the impact of various geometric parameters as well as retardation and life-time damping on the observed localization behavior.
To synthesize 2D disordered assemblies of gold NPs on a TEM transparent silicon oxide substrate, a new synthesis routine was developed. This procedure is based on sublimation and redeposition of a gold microparticle precursor induced by an electron beam in a scanning electron microscope (SEM) operated at 30 kV. To characterize the assembly of synthesized NPs in terms of size, shape and spreading over the substrate, TEM measurements were conducted subsequently. To study LSPRs experimentally, EELS in scanning transmission electron microscopy (STEM) mode was carried out. The numerical modelling of LSPRs was performed using a self-consistent dipole model.
The synthesized 2D disordered gold NPs assemblies exhibit a gradient in the NPs mean size, which ranges from 100 nm close to the precursor location down to 2 nm at a distance of more than 20 µm from the precursor location. Additionally, the interparticle distance between the gold NPs increases with increasing distance to the precursor location.
The experimental investigation as well as the numerical simulation of the LSPRs demonstrate a localization behavior that decreases toward larger energies, which is driven by the disorder of the NPs assembly (mainly the random particle distance). That localization behavior stays in contrast to what was found in ultrathin 2D gold networks showing increasing of localization towards higher LSPRs energies. By varying the geometric parameters of the NPs assembly in the simulation, we could identify the NPs thickness as the parameter, that determines the energy-dependence of the localization. Specifically, a critical thickness of approx. 10 nm separates the two localization regimes, which correlates to the energy of the dipole mode resonance crucially depending on the thickness of the NPs.
2D disordered assemblies of gold NPs of a wide range of NPs sizes and distances can be synthesized directly on thin substrates facilitating structural characterization and EELS measurements in a TEM. It could be shown that such assemblies exhibit LSPRs with a localization behavior that may be tuned by the NPs sizes (including thickness) and interparticle distances. The proposed synthesis of random NPs assemblies opens new avenues for fundamental studies on Anderson localization in disordered plasmonic structures as well as its applications such as surface-enhanced Raman spectroscopy where localization behavior must be tuned to specific wave lengths.
Plasmons are collective oscillations of the free electron density in metals which can be described by an electromagnetic field. Surface plasmons are longitudinal waves propagating at the surface of the metallic material coupled to an external field. Localized surface plasmons on a nanoparticle reveal the behavior of standing waves with discrete resonance frequencies whose dominating mode is called dipole mode. Coupling of nanoparticles leads eventually to a hybridization of those dipole modes and therefore to spectral and spatial delocalization which was already investigated in ordered systems. In disordered systems, there are a lot of open questions regarding the propagation behavior which changes from delocalization to localization for instance due to the disorder. This phenomenon is then called Anderson localization. To investigate the propagation behavior of plasmonic waves in an assembly of disordered gold NPs, we combine experimental results of electron energy loss spectroscopy in a scanning transmission microscope with simulation results of the self-consistent dipole modelling. We indeed find experimentally localization of plasmon modes and with the simulation we could exclude other localization mechanism such as life-time damping or retardation. In conclusion, we could found Anderson localization of surface plasmons in assemblies of disordered gold nanoparticles which will enhance the understanding of this kind of vector waves to the Anderson localization as a general wave behavior in disordered systems.
Sub-4 nm particles from FFF-3D printing measured with the TSI 1 nm CPC and the Airmodus A11 nCNC
(2024)
Concerns have been raised as Fused Filament Fabrication (FFF) desktop 3D printer emits harmful ultrafine particles (dP < 100 nm) during operation in indoor spaces. However, the vast majority of previous emission studies have neglected the possible occurrence of sub-4 nm particles by using conventional condensation particle counter (CPC) for detection. Thus, the total particle emission could be systematically underestimated. This study has compared two diethylene glycol (DEG) based instruments to evaluate their suitability for measuring organic FFF particles in the sub-4 nm size range either as particle counter or as a particle size spectrometer.
Traceable morphological and chemical characterization of nanomaterials with respect to the various possible sizes, size distributions, shapes, and concentrations of real-world nanoparticles (NPs) is a challenging task. Particularly for the nonspherical, non-monodisperse nanoparticles – as typically for most of the commercial particles, including their strong tendency to agglomerate, there is a lack of standard operation procedures providing accurate nanoparticle characterisation.
In the framework of the pre-standardisation framework of VAMAS (Versailles Project on Advanced Materials and Standards, www.vamas.org) two interlaboratory comparison (ILC) studies are being carried out under the Technical Working Area (TWA) 34 “Nanoparticle Populations”:i) Project #15 addresses the analysis of the size and shape distribution of TiO2 bipyramidal NPs by traceable imaging methods such as TEM, SEM, STEM-in-SEM, AFM as well as with SAXS as an ensemble method. This ILC is thought as the next level development of the case studies exemplified in the published ISO standards ISO 21363 and ISO 19749. It was agreed to complete the first ILC with the NPs already prepared according to the same procedure on a TEM grid, and, at a later stage, to carry out second ILCs with the same NPs distributed to the participants as liquid suspensions together with protocols for the uniform NP deposition on suited substrates - as developed and optimized within the European project nPSize. Once having good deposition protocols available, the door for automated image analysis gets opened. Corresponding image analysis protocols and reporting templates have been distributed to the ILC participants, too.
ii) Project #16: two spherical SiO2 NP samples with bi-modal size distributions in two nominal relative number concentrations were prepared and distributed also as liquid suspensions accompanied by sample preparation, measurement, and image analysis protocols and reporting templates. Here, the NP concentration is the primary parameter to be measured. For the imaging methods it is targeted to
measure the relative nanoparticle concentrations (relative populations of the two modes).
The results of all the participating laboratories, in both ILCs, compiled in comparative representations will be shown and discussed for the first time. The reduction of the measurement uncertainties associated to the size, shape and number-concentration results induced by the significant improvement of the sample preparation on substrates (as single particles with a high-density coverage), combined with well-defined image analysis procedures will be highlighted.
Finally, a very recent 3rd ILC an the determination of lateral size of Graphene Oxide flakes by SEM is presented as project P13 under VAMAS TWA41 Graphene and Related 2D.
These data sets serve as models for calculating the specific surface area (BET method) using gas sorption in accordance with ISO 9277.
The present measurements were carried out with nitrogen at 77 Kelvin and argon at 87 Kelvin.
It is recommended to use the following requirements for the molecular cross-sectional area:
Nitrogen: 0.1620 nm²
Argon: 0.1420 nm²
Expected specific surface area for nitrogen (BET): 140 to 154 m²/g
Expected specific surface area for argon (BET): 129 to 135 m²/g
Titanium dioxides certified with nitrogen sorption and additionally measured with argon for research purposes were used as sample material.
The resulting data sets are intended to serve as comparative data for own measurements and show the differences in sorption behaviour and evaluations between nitrogen and argon.
These data are stored in the universal AIF format (adsorption information format), which allows flexible use of the data.
These data sets serve as models for calculating the specific surface area (BET method) using gas sorption in accordance with ISO 9277.
The present measurements were carried out with nitrogen at 77 Kelvin and argon at 87 Kelvin.
It is recommended to use the following requirements for the molecular cross-sectional area:
Nitrogen: 0.1620 nm²
Argon: 0.1420 nm²
Expected specific surface area for nitrogen (BET): 24 to 25 m²/g
Expected specific surface area for argon (BET): 20 m²/g
Titanium dioxides certified with nitrogen sorption and additionally measured with argon for research purposes were used as sample material.
The resulting data sets are intended to serve as comparative data for own measurements and show the differences in sorption behaviour and evaluations between nitrogen and argon.
These data are stored in the universal AIF format (adsorption information format), which allows flexible use of the data.
This dataset accompanies the following publication:
Hülagü, D., Tobias, C., Dao, R., Komarov, P., Rurack, K., Hodoroaba, V.-D., Towards 3D determination of the surface roughness of core-shell microparticles as a routine quality control procedure by scanning electron microscopy. Sci.Rep, 14, 17936 (2024), https://doi.org/10.1038/s41598-024-68797-7.
It contains SEM and AFM-in-SEM images of polystyrene (PS) core particles, polystyrene-iron oxide (PS/Fe3O4) core-shell particles, and polystyrene-iron oxide-silica (PS/Fe3O4/SiO2) core-shell-shell particles. Please refer to the publication and its supporting information for more details on the acquisition and contents of the dataset, as well as the GitHub repository at https://github.Com/denizhulagu/roughness-analysis-by-electron-microscopy.
The investigated particles were produced at BAM laboratories as previously described in:
Hülagü, D. et al. Generalized analysis approach of the profile roughness by electron microscopy with the example of hierarchically grown polystyrene–iron oxide–silica core–shell–shell particles. Adv. Eng. Mater. 24, 2101344, https://doi.org/10.1002/adem.202101344 (2022).
Tobias, C., Climent, E., Gawlitza, K. & Rurack, K. Polystyrene microparticles with convergently grown mesoporous silica shells as a promising tool for multiplexed bioanalytical assays. ACS Appl. Mater. Interfaces 13, 207, https://dx.doi.org/10.1021/acsami.0c17940 (2020).
The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM).
For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary.
The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM.
With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically).
❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility.
❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs.
❑ Selection of the threshold algorithm can significantly alter the reported ECD.
Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach (1). Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too.
In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted.
In this lecture, following points are addressed:
– Advantages of correlative analysis in electron microscopy
– Measurement principle of the different electron microscopy modes used
– Presentation of the nanomaterials used for this study
– Role of sample preparation
– Sequence kV variation with InLens & transmission detection of the same field-of-view
– Conclusive remarks including Monte Carlo simulations