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Direct Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy (XRM), which incorporates additional X-ray lenses, in three dimensions down to a minimal basic spatial resolution of about 500 nm or 50 nm, respectively. In this work, two different DLW structures are analysed via XCT. Internal defects are detected and analysed for the purpose of quality control. Defects and structures with sizes down to 1.5 µm are successfully analysed. A 3D reconstruction and internal, hidden features of the fabricated structures are shown and discussed. In a first-of-its-kind study, we demonstrate the detectability of a single-voxel line inside a fabricated structure that would not be detectable with SEM or light microscopy. Furthermore, the direct fabrication on a PET substrate is shown to overcome the high X-ray absorbance of commonly used glass substrates. Attenuation spectra of SZ2080 and glass substrates are compared to a fabrication route direct on a 170 µm PET foil. The practical aspects of XCT measurements for DLW structures on different substrates will be discussed.
The quality of additively manufactured (AM) parts is determined by the applied process parameters used and the properties of the feedstock powder. The influence of inner gas pores in feedstock particles on the final AM product is a phenomenon which is difficult to investigate since very few non-destructive measurement techniques are accurate enough to resolve the micropores.
3D X-ray computed tomography (XCT) is increasingly applied during the process chain of AM parts as a non-destructive monitoring and quality control tool and it is able to detect most of the pores.
However, XCT is time-consuming and limited to small amounts of feedstock powder, typically a few milligrams. The aim of the presented approach is to investigate digital radiography of AM feedstock particles as a simple and fast quality check with high throughput. 2D digital radiographs were simulated in order to predict the visibility of pores inside metallic particles for different pore and particle diameters. An experimental validation was performed. It was demonstrated numerically and experimentally that typical gas pores above a certain size (here: 3 to 4.4 µm for the selected X-ray setup), which could be found in metallic microparticles, were reliably detected by digital radiography.
One essential step on the way towards accurate quantitative simulation of radiographic testing is an accurate description of the utilized energy spectrum of X-ray photons. For use in general purpose simulation tools, the spectra of X-ray tubes have to be described by a model covering at least the intended range of applications. This range includes transmission tubes as well as direct beam tubes with varying angles of incidence and emission, for a number of typical target materials. In radiographic testing acceleration voltages frequently reach up to 450 kV for direct beam targets and up to 225 kV for transmission targets, with even higher voltages available or being developed. Currently used models are unable to cover the whole range of configurations.
Here a model is presented that employs a unified approach for simulating the photon energy spectra for transmission and direct beam targets composed of arbi-trary homogeneous materials. In order to achieve this, a detailed model of electron transport within the target is employed. The validity of the developed model is shown through comparisons with Monte Carlo simulations as well as measurements for a number of different configurations.
Modeling of the photon-electron cascade progress in multicomponent objects of complex geometrical structure by use of hybrid supercomputers is considered. An approach to computing the cascade processes is developed. The approach has three key properties allowing the effective use of heterogeneous structure of computers for solving the tasks of radiation transport in complex multi-scale geometries. Firstly, two different discreet geometrical description of an object being under radiation is used: triangulated model for photon transport and voxel model for electron transport. Secondly, small parameter of the problem is explicitly taking into account for modeling surface effects (for instance, electron emission). Thirdly, the effective calculation decomposition between CPU and GPU is developed for significant increasing the speed of calculations of processes in question. Modeling of experiment on researching the bremsstrahlung generated by electron beam in Ta target is carried out. Comparison of computing and experimental results shows satisfactory consent.
In this contribution, we discuss the influence of scattered radiation on materials’ effective attenuation coefficients at higher X-ray energies. The selected X-ray spectra for the dual-energy experiments correspond to 3 MV and 7.5 MV acceleration potential of the used betatron. Experiments were performed on a test phantom containing step wedges of different low- and high-Z materials. We evaluated the ratio between low- and high-energy X-ray attenuation coefficients quantitatively based on simulated poly-energetic high-energy X-ray source spectra and the detector sensitivity using the “analytical Radiographic Testing inspection simulation tool” (aRTist) developed at BAM. Furthermore, the influence of scattered radiation is evaluated using an efficient Monte-Carlo simulation. The simulation results are compared quantitatively with experimental investigations. Finally, important applications of the proposed technique in the context of aviation security are discussed.
X-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood.
In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detected scattered photons. Both aspects are important to understand the imaging process, to interpret the results, and to optimize the backscatter camera investigated here. Additionally experimental results will be presented and compared with simulations.
Modelling becomes more and more important in modern NDE. It is increasingly used to optimize techniques for complex applications, to support the preparation of written procedures, and for education purposes. To describe the complete chain of RT, the model includes simulating all necessary properties of X- or Gamma-ray sources, the interaction of photons with material with special attention to scattered radiation, the detection process, and the complete geometrical RT setup handling arbitrary parts or constructions. Depending on the given inspection problem and the influencing factors that should be addressed by the simulation, an appropriate physical model has to be chosen to describe the underlying interaction mechanisms. The simulator aRTist combines analytical and Monte Carlo methods to efficiently model the radiation transport such that transmission as well as scatter techniques can be modelled. In this contribution we Focus on Monte Carlo Simulation of scatter contribution within aRTist. Examples for RT/tomographic applications and back-scatter techniques are presented to demonstrate the usability of the presented simulation tool for a broad range of radiological applications.
The computer simulation of radiography is applicable for different purposes in NDT such as for the qualification of NDT systems, the optimization of system parameters, feasibility analysis, model-based data interpretation, education and training of NDT/NDE personnel, and others. Within the framework of the European project PICASSO simulators will be adapted to support reliability assessments of NDT tasks. The radiographic simulator aRTist developed by BAM is well suited for this task. It combines analytical modelling of the RT inspection process with the CAD-orientated object description applicable to various industrial sectors such as power generation, aerospace, railways and others. The analytic model includes the description of the radiation source, the interaction of Radiation
with the material of the part, and the detection process with special focus to DIR. To support reliability estimations the simulation tool is completed by a tool for probability of detection (POD) estimation. It consists of a user interface for planning automatic simulation runs with varying parameters, specifically defect variations.
Further, an automatic image analysis procedure is included to evaluate the defect visibility and calculate the POD therefrom.
X-ray computed tomography (CT) is a volumetric (3D) Imaging diagnostic method, well established in the medical field, and in industrial NDE as well. Developments in industrial CT aim to extent the applicability to complex structures, which do not allow the access of all directions. This are e.g. limited view, data and angle CT applications. New reconstruction algorithms are required on one
side, and the accuracy has to be improved on the other side. Numerical Simulation can support such developments by providing well defined data sets for the testing of reconstruction algorithms. This approach of virtual CT is realized within the radiographic simulator aRTist, developed by BAM. The poster shows the possibilities of this tool to consider complex scan paths. Simulated data sets have been reconstructed by an versatile backprojection algorithm.