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The gold finds from Bernstorf, in the Freising district of Bavaria, were discovered in 1998, in the area of a Bronze Age settlement. First analyses with X-ray fluorescence (XRF) revealed gold of an unusually high purity grade, which was explained by using cementation techniques.
A newer analysis with laser ablation inductively coupled plasma mass spectrometry (LA–ICP–MS) indicated an even higher purity. These analytical results were the starting point of an ongoing discussion. The amount and type of the detected contaminants were highly controversial and led to contradictory interpretations.
We reanalysed 11 gold samples with synchrotron radiation induced X-ray fluorescence (SRXRF) at the BAMline at BESSY-II. To reach the desired detection limits a thorough analysis with three different excitation energies and detection conditions were applied to confirm or disprove the previous results.
In this contribution we will get into the details for the need of the different measurement conditions and the virtues of the use of synchrotron radiation. The use and effectiveness of cementation techniques will be addressed. Finally we will present the achieved results and their impact on the discussion.
The BAMline at the synchrotron BESSY II in Berlin supplies users with up to date analytical x-ray methods for the energy range between 5 and 50 keV. Additional to XRF with micron Resolution it provides amongst other things the possibility to use TXRF and XANES. Especially the use of
the so-called Color X-Ray Camera (CXC) opens the possibility to use new and effective detection schemes, which allow to measure simultaneously distributions of elements or Absorption spectra in a motionless mode.
In this talk the analytical possibilities at the BAMline for samples with biological Background will be introduced. The available methods will be presented and discussed for various examples.
A perspective for the future use for XANES in grazing emission and TXRF geometries for plant materials will be given.
Die Eigenschaften und die Verlässlichkeit von Materialien jeglicher Art sind seit jeher die Grundlagen der Technik einer Gesellschaft. Tiefgreifende Kenntnisse über sie sind deshalb eine Voraussetzung um neue Produkte zu entwickeln, Verlässlichkeit zu gewährleisten, oder aber auch, wie in der Archäometrie, Kenntnisse über die Vergangenheit zu gewinnen. Ein Schlüssel zum Verständnis ist das Wissen über die chemische Zusammensetzung und die Struktur von Materialien Die Analyse mit Synchrotronstrahlung bietet hierfür herausragende Werkzeuge an, die zerstörungsfrei und hochsensitiv sind. Mit Röntgenfluoreszenzanalyse kann die elementare Zusammensetzung in winzigen Proben bis auf μg/g bestimmt werden. Anwendungsbeispiele aus verschiedenen Themengebieten, aber besonders von archäologischen Fragestellungen wie z.B. dem Goldfund von Bernstorf werden im Vortrag vorgestellt.
News from the BAMline
(2017)
Homogeneity of dispersed brominated flame retardants (HBCD) in polystyrene by LA-ICP-MS and XRF
(2017)
To investigate the release or migration of flame retardants from polypropylene (PP) and polysytrene (PS) samples with a defined content of flame retardants as additives were prepared and used. Therefore a distinct 1,2,5,6,9,10-hexabromocyclododecane HBCD concentration of 1 wt.% in PS resp. a specified bromodiphenylether (BDE-209) of 0.1 wt.% in PP is defined. For the preparation of the samples granular PP or PS are extruded together with the BFR additives. Even the result of this process may lead to homogenous partitions of the BFR additives. So, the distribution of these additives must be proven before using the samples in an experimental setup for weathering studies. In accordance to the regulation of RoHS (2011/65/EU) , where the use of XRF is recommended for the proof of flame retardants in electronic consumer products, we use this method as a reference to the laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). Therefore we present the correlation of these experiments. The experimental setup for the XRF experiment is like a standard addition: in cavities, which are introduced in the sample plates subsequently, solutions of defined concentration of flame retardants are put in there. According to the idea of standard addition, we get an information of the originating mass fraction of flame retardant in each sample and we can monitor the release and migration of these additives during/after the weathering experiments with high precision. An internal standard of HBCD is added as a marker and can be analyzed after the weathering experiment.
Characterization of bio-molecular nano-layers by means of reference-free X-ray Spectrometry
An increasing field of application, e.g. in biotechnology is the dedicated adjustment of surface properties by functionalization with organic molecules. For a detailed understanding and further development of such nano-layers, a quantitative determination of the surface density of molecular species is required.
By means of reference-free X-Ray Fluorescence (XRF) spectrometry such surfaces can be analyzed quantitatively by detecting specific marker elements. Using calibrated instrumentation and a quantification approach based on atomic fundamental parameters a SI-traceable quantitative analysis without any calibration sample or reference material is possible. A chemical analysis of molecular bonds can be accomplished by X-Ray Absorption Spectroscopy in the Near-Edge region (NEXAFS). Especially in the soft X-ray range an access to relevant light elements like Carbon C, Nitrogen N and Oxygen is possible.
Here, aminated surfaces with varying densities of amino groups prepared from binary mixtures of silanes were investigated. In a complementary analysis by X-Ray Photoelectron Spectroscopy (XPS) and Fluorescence measurements based on laser-excitation in the optical light spectrum the functional-group density of silane monolayers were determined. The nitrogen atom in the head-group of the silane-molecule could be used as specific marker for the reference-free quantitative XRF analysis and were used for traceable calibration of XPS and Fluorescence Spectroscopy.
X-ray fluorescence (XRF) analysis is a well suited methodology for thin film analysis. With XRF the mass deposition of elements can be non-destructively determined. By knowledge of the density of the thin film as well the thickness can be given. In the field of industrial thin film manufacturing various material systems and layer structures are used. the analysis relies on well-known calibration samples or even reference materials to determine absolute analytical results from the measurement values recorded. Within this concept of chemical traceability the calibration sample has to be as similar as possible to the industrial thin film sample with respect to the spatial distribution of elemental composition in order to minimize matrix effects or analysis related uncertainties. The procurement of such certified similar calibration samples or reference materials including their required traceability is a challenge due to limited number of available calibration samples or reference materials, in particular at the nanoscale. There are only few providers of calibration standards for layer or coating thicknesses which are suitable for XRF analysis. The limited number of available certified reference materials (CRMs) for XRF thin film analysis and in parallel the growing market of novel thin film materials induces a growing gap of required calibration samples for XRF analysis.
The exploitation of process-near samples benefits from a leverage effect: on one hand reference materials are needed for calibration and alignment procedures for X-ray fluorescence devices. They are customized for the special need of the end-user, e.g. a company producing thin film solar cells. On the other hand the market for EDXRF devices develops positively by providing novel thin film calibration samples for industry and end user-related production processes or application. Two aspects are hereby being addressed; the improvement of product quality which in certain sectors like aerospace and automotive industry directly translates to product safety as well as the expansion of the sales potential of EDXRF measuring devices.
The preservation and the improvement of the fertility of soils by agricultural management measures requires carefully planned decisions which are based on a detailed capture of the soil qualities and a detailed understanding of soil processes. Profit losses can be caused on the one hand by conventional, surface-uniform managements (e.g., fertilization) by too low management intensity on one part of the surface, while other parts of the field receive too high doses and it thereby comes to environmental impacts or to waste of resources.
X-ray fluorescence analysis (XRF) and the Laser-induced Breakdown Spectroscopy (LIBS) are possible technologies which permit online analyses of the chemical composition.