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Artificial intelligence (AI), machine learning, and neural networks have revolutionized fields such as self-driving cars or machine translation. Indeed, AI has progressed so far that scientists such as Stephen Hawking now fear that it may destroy humankind altogether. So, let’s get started and use AI in surface science.
Here we train neural networks to use raw measurement data as input and immediately return the desired output parameters. We discuss the example of X-ray reflectivity measurements of ultrathin films, which contain reciprocal space information and must traditionally be fitted with dynamic scattering theory. Instead, we train the neural network with simulated X-ray data of multilayer structures and then apply it to measurement data. The neural network yields high accuracy results, is robust against noise, and performs significantly faster than fitting algorithms in real-time experiments. The presented neural network data analysis is becoming increasingly attractive, because free software has become very accessible and specialized computer chips (NPU) are currently being rolled out.