Datei im Netzwerk der BAM verfügbar ("Closed Access")
Filtern
Dokumenttyp
- Vortrag (8)
- Zeitschriftenartikel (2)
- Beitrag zu einem Sammelband (1)
- Dissertation (1)
Schlagworte
- Core-shell nanoparticles (7)
- SEM (5)
- XPS (5)
- Nanoparticles (4)
- STXM (4)
- PS (3)
- PTFE (3)
- Core-shell (2)
- Electron spectroscopy (2)
- Polymers (2)
Organisationseinheit der BAM
- 6.1 Oberflächen- und Dünnschichtanalyse (12) (entfernen)
Eingeladener Vortrag
- nein (8)
Even though we often do not knowingly recognize them, nanoparticles are present these days in most areas of our daily life, including food and its packaging, medicine, pharmaceuticals, cosmetics, pigments as well as electronic products, such as computer screens. The majority of these particles exhibits a core-shell morphology either intendedly or unintendedly. For the purpose of practicability, this core-shell nanoparticle (CSNP) morphology is often assumed to be ideal, namely a spherical core fully encapsulated by a shell of homogeneous thickness with a sharp interface between core and shell material. It is furthermore widely presumed that all nanoparticles in the sample possess the same shell thickness. As a matter of fact, most real CSNPs deviate in several ways from this ideal model with quite often severe impact on how efficiently they perform in a specific application.
The topic of this cumulative PhD thesis is the accurate characterization of the actual morphology of CSNPs by advanced X-ray analytical techniques, namely X-ray photoelectron spectroscopy (XPS) and scanning transmission X-ray microscopy (STXM). A special focus is on CSNPs which deviate from an ideal core-shell morphology. In the paper from 2019 nanoparticle shell thicknesses are extracted from the elastic-peak intensities in an XPS spectrum based on an ideal particle morphology. This happens for a series of CSNP samples comprising a poly(tetrafluoroethylene) (PTFE) core and either a poly(methyl methacrylate) (PMMA) or polystyrene (PS) shell. The same paper as well as the paper from 2020 demonstrate for the first time, that the analysis of the inelastic background in an XPS spectrum of CSNPs can identify and quantify the heterogeneity of the shell and the incomplete encapsulation of the core.
The result from an XPS experiment is always an average across a large nanoparticle ensemble. Deviations from an ideal morphology within a single particle of the sample cannot be assessed separately. As opposed to that, a spatial resolution of 35 nm enables STXM to visualize the interior of single CSNPs which exhibit a sufficient X-ray absorption contrast between core and shell material. In the paper from 2018 a STXM analysis is demonstrated based on the example of the PTFE-PS CSNP samples already mentioned in the previous paragraph.
In the publication from 2021 (Ca/Sr)F₂ core-shell like nanoparticle ensembles for the practical use in, among others, antireflective coatings are investigated. These nanoparticles do not possess a sharp interface between core and shell material, which is why a shell thickness determination as described in the second paragraph is inappropriate. Instead, in-depth profiles of the chemical composition are obtained by XPS experiments based on synchrotron radiation with variable X-ray photon energy to elucidate the internal morphology of the particles. Additionally, theoretical in-depth profiles of Ca and Sr XPS peak intensities are simulated, in order to facilitate the interpretation of the experiments. Thus, an enrichment of CaF₂ at the particle surface was determined, which could hardly have been assessed by any other analytical technique. Because this kind of non-destructive depth profiling by XPS is very demanding, more than usual effort is spent on gapless documentation of the experiments to ensure full reproducibility.
Due to the vast diversity of nanoparticles differing in material, composition and shape, a measurement procedure cannot unalteredly be transferred from one sample to another. Nevertheless, because the papers in this thesis present a greater depth of reporting on the experiments than comparable publications, they constitute an important guidance for other scientists on how to obtain meaningful information about CSNPs from surface analysis.
ISO Technical Report 23173 describes methods by which electron spectroscopies, including X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the Coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state-of-the-art for such measurements. Such analyses of core–shell nanoparticles are common within the literature, however the
methods employed are varied; the relative advantages and disadvantages of These methods, and the optimal usage of each may not be clear to the general analyst. ISO Technical Report 23173 aims to clarify the methods that are available, describe them in clear terms, exhibit examples of their use, and highlight potential issues users may face. The information provided should allow analysts of electron spectroscopy data to make clear choices regarding the appropriate analysis of electron spectroscopy data from coated nanoparticle systems and provide a basis for understanding and comparing results from different methods and systems.
Accurate and reproducible measurement of the structure and properties of high-value nanoparticles is extremely important for their commercialization. A significant proportion of engineered nanoparticle systems consist of some form of nominally core-shell structure, whether by design or unintentionally. Often, these do not form an ideal core-shell structure, with typical deviations including polydispersity of the core or shell, uneven or incomplete shells, noncentral cores, and others. Such systems may be created with or without intent, and in either case an understanding of the conditions for formation of such particles is desirable. Precise determination of the structure, composition, size, and shell thickness of such particles can prove challenging without the use of a suitable range of characterization techniques. Here, the authors present two such polymer core-shell nanoparticle systems, consisting of polytetrafluoroethylene cores coated with a range of thicknesses of either polymethylmethacrylate or polystyrene. By consideration of surface energy, it is shown that these particles are expected to possess distinctly differing coating structures, with the polystyrene coating being incomplete. A comprehensive characterization of these systems is demonstrated, using a selection of complementary techniques including scanning electron microscopy, scanning transmission electron microscopy, thermogravimetric analysis, dynamic light scattering, differential centrifugal sedimentation, and X-ray photoelectron spectroscopy. By combining the results provided by these techniques, it is possible to achieve superior characterization and understanding of the particle structure than could be obtained by considering results separately.
A variety of methods used to prepare nano-objects for surface analysis are described along with information about when they might be best applied. Intrinsic properties of NPs which complicate their characterization and need to be considered when planning for surface or other analyses of NPs are identified, including challenges associated with reproducible synthesis and functionalization of the particles as well as their dynamic nature. The relevant information about the sample preparation processes, along with analysis details and data that need to be added to the collection of material provenance information is identified. Examples of protocols that have been successfully used for preparation of nano-objects for surface analysis are included in an annex.
Core-shell nanoparticles (CSNPs) have become indispensable in various industrial applications. However, their real internal structure usually deviates from an ideal core-shell structure. To control how the particles perform with regard to their specific applications, characterization techniques are required that can distinguish an ideal from a non-ideal morphology. In this work, we investigated PTFE-PMMA (four samples) and PTFE-PS (six samples) polymer CSNPs with constant core diameter (45 nm) but varying shell thickness (4-50 nm). As confirmed by transmission scanning electron microscopy (T-SEM), the shell completely covers the core for the PTFE-PMMA nanoparticles, while the encapsulation of the core by the shell material is incomplete for the PTFE-PS nanoparticles. X-ray photoelectron spectroscopy (XPS) was applied to determine the shell thickness of the nanoparticles. The software SESSA V2.0 was used to analyze the intensities of the elastic peaks and the QUASES software package to evaluate the shape of the inelastic background in the XPS Survey spectra.
For the first time, nanoparticle shell thicknesses are presented which are exclusively based on the analysis of the XPS inelastic background. Furthermore, principal component analysis (PCA) assisted time-of-flight secondary ion mass spectrometry (ToF-SIMS) of the PTFE-PS nanoparticle sample set revealed a systematic variation among the samples and, thus, confirmed the incomplete encapsulation of the core by the shell material. Opposed to that, no variation is observed in the PCA scores plots of the PTFE-PMMA nanoparticle sample set. Consequently, the complete coverage of the core by the shell material is proved by ToF-SIMS with a certainty that cannot be achieved by XPS and T-SEM.
PTFE/PS core-shell-nanoparticles were characterised by STXM, T-SEM, and ToF-SIMS. Shell-thicknesses were calculated and compared. Preliminary results from ToF-SIMS showed the capabilities of this method.
Investigation of core-shell nanoparticles using scanning transmission x-ray microscopy (STXM)
(2018)
A scanning transmission x-ray microscopy (STXM) based methodology is introduced for determining the dimensions (shell thickness, core and total diameter) of core-shell nanoparticles which exhibit a strong x-ray absorption contrast and a well-defined interface between core and shell material. A low radiation dosage during data acquisition and, therefore, less x-ray beam induced damage of the sample is achieved by recording STXM images only at two predetermined energies of maximum absorption contrast, instead of recording a stack of images across the whole absorption edge. A model core-shell nanoparticle, polytetrafluoroethylene (PTFE) cores with polystyrene (PS) shell, is used for demonstration. Near edge x-ray absorption fine structure (NEXAFS) spectroscopy confirms the significant difference in x-ray absorption behavior between PTFE and PS. Additionally, due to the insolubility of styrene in PTFE a well-defined interface between particle core and shell is expected. In order to validate the STXM results, both the naked PTFE cores as well as the complete core-shell nanoparticles are examined by scanning electron microscopy (SEM). The introduced STXM based methodology yields particle dimensions in good agreement with the SEM results (deviation equal or less than 10%) and provides additional information such as the position of the particle core which cannot be extracted from a SEM micrograph.
A scanning transmission x-ray microscopy (STXM) based methodology is introduced for determining the dimensions (shell thickness, core and total diameter) of core-shell nanoparticles which exhibit a strong x-ray absorption contrast and a well-defined interface between core and shell material. A low radiation dosage during data acquisition and, therefore, less x-ray beam induced damage of the sample is achieved by recording STXM images only at two predetermined energies of maximum absorption contrast, instead of recording a stack of images across the whole absorption edge. A model core-shell nanoparticle, polytetrafluoroethylene (PTFE) cores with polystyrene (PS) shell, is used for demonstration. Near edge x-ray absorption fine structure (NEXAFS) spectroscopy confirms the significant difference in x-ray absorption behavior between PTFE and PS. Additionally, due to the insolubility of styrene in PTFE a well-defined interface between particle core and shell is expected. In order to validate the STXM results, both the naked PTFE cores as well as the complete core-shell nanoparticles are examined by scanning electron microscopy (SEM). The introduced STXM based methodology yields particle dimensions in agreement with the SEM results and provides additional information such as the position of the particle core which cannot be extracted from a SEM micrograph.
This presentation explains the outline and scientific content of the ISO technical report 23173 "Measurement of the thickness and nature of nanoparticle coatings using electron spectroscopies". This technical report deals with those electron spectroscopy methods that are able to determine the coating thickness of nanoparticles. This specifically includes X-ray photoelectron spectroscopy (XPS), energy-resolved X-Ray photoelectron spectroscopy (ERXPS) using synchrotron radiation, near abient pressure photoelectron spectroscopy (NAPXPS) and Auger electron spectroscopy (AES).