Datei für die Öffentlichkeit verfügbar ("Open Access")
The minimum information requirements needed to guarantee high-quality surface Analysis data of nanomaterials are described with the aim to provide reliable and traceable Information about size, shape, elemental composition and surface chemistry for risk assessment approaches.
The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO2 reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community.
Forderungen nach höherer Geschwindigkeit und die Komplexität der Fragen geben der analytischen Chemie neue Impulse. So nutzt die Prozessanalytik gepulste Ramanspektrometer, die Elemente Arsen und Quecksilber dominieren die Forschung in der Speziesanalytik, und die Omics-Techniken entwickeln sich zu Multi-Omics-Ansätzen. Ambiente MS-Techniken benötigen keine aufwendige Probenvorbereitung, multidimensionale Trenntechniken werden verstärkt in der Routine eingesetzt, und Chip-basierte Trennungen fallen durch Schnelligkeit auf. Molekülspektroskopie und Massenspektrometrie dominieren die bildgebenden Verfahren, und die Lateralauflösung der ToF-Sekundärionenmassenspektrometrie hat sich bei Oberflächenuntersuchungen verbessert.