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Soil certified reference material (CRM), UME EnvCRM 03 was produced by a collaborative approach among national metrology institutes, designated institutes and university research laboratories within the scope of the EMPIR project: Matrix Reference Materials for Environmental Analysis. This paper presents the sampling and processing methodology, homogeneity, stability, characterization campaign, the assignment of property values and their associated uncertainties in compliance with ISO 17034:2016. The material processing methodology involves blending a natural soil sample with a contaminated soil sample obtained by spiking elemental solutions for 8 elements (Cd, Co, Cu, Hg, Ni, Pb, Sb and Zn) to reach the level of warning risk monitoring values specified for metals and metalloids of soils in Europe. Comparative homogeneity and stability test data were obtained by two different institutes, ensuring the reliability and back up of the data. The certified values and associated expanded uncertainties for the total mass fractions of thirteen elements (As, Cd, Co, Cr, Cu, Fe, Hg, Mn, Ni, Pb, Sb, V and Zn) are established. The developed CRM can be used for the development and validation of measurement procedures for the determination of the total mass fractions of elements in soil and also for quality control/assurance purposes. The developed CRM is the first example of a soil material originating from Türkiye.
Die Bundesanstalt für Materialforschung und -prüfung (BAM) ist eine forschende Bundesoberbehörde und Einrichtung der Ressortforschung der Bundesrepublik Deutschland. Unter ihrer Leitlinie „Sicherheit in Technik und Chemie“ ist sie zuständig für die öffentliche technische Sicherheit und für metrologische Aufgaben in der Chemie. Das Aufgabenspektrum der BAM, das sich an aktuellen Fragestellungen aus Wissenschaft, Wirtschaft, Politik und Normung orientiert, bietet sehr viele interessante Tätigkeitsfelder für Naturwissenschaftler*Innen und Ingenieur*Innen.
Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR
(2023)
The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5]
Iron Oxide Nanocubes as a New Certified Reference Material for Nanoparticle Size Measurements
(2023)
The rational design and increasing industrial use of nanomaterials require a reliable characterization of their physicochemical key properties like size, size distribution, shape, and surface chemistry. This calls for nanoscale reference materials (nanoRMs) for the validation and standardization of commonly used characterization methods closely matching real-world nonspherical nano-objects. This encouraged us to develop a nonspherical nanoRM of very small size consisting of 8 nm iron oxide nanocubes (BAM-N012) to complement spherical gold, silica, and polymer nanoRMs. In the following, the development and production of this nanoRM are highlighted including the characterization by transmission electron microscopy (TEM) and small-angle X-ray scattering (SAXS) as complementary methods for size and shape parameters, homogeneity and stability studies, and calculation of a complete uncertainty budget of the size features. The determination of the nanocubes’ edge length by TEM and SAXS allows a method comparison. In addition, SAXS measurements can also provide the mean particle number density and the mass concentration. The certified size parameters, area equivalent circular diameter and square edge length, determined by TEM with a relative expanded uncertainty below 9%, are metrologically traceable to a natural constant for length, the very precisely known (111) lattice spacing of silicon. Cubic BAM-N012 qualifies as a certified nanoRM for estimating the precision and trueness, validation, and quality assurance of particle size and shape measurements with electron microscopy and SAXS as well as other sizing methods suitable for nanomaterials. The production of this new iron oxide nanocube RM presents an important achievement for the nanomaterial community, nanomaterial manufacturers, and regulators.
The rational design of next generation molecular and nanoscale reporters and the comparison of different emitter classes require the determination of the fluorometric key performance parameter fluorescence quantum yield (Φf), i.e., the number of emitted photons per number of absorbed photons. Main prerequisites for reliable Φf measurements, which are for transparent luminophore solutions commonly done relative to a reference, i.e., a fluorescence quantum yield standard of known Φf, are reliable and validated instrument calibration procedures to consider wavelength-, polarization-, and time-dependent instrument specific signal contributions, and sufficiently well characterized fluorescence quantum yield standards. As the standard’s Φf value directly contributes to the calculation of the sample’s Φf, its accuracy presents one of the main sources of uncertainty of relative Φf measurements. To close this gap, we developed a first set of 12 fluorescence quantum yield standards, which absorb and emit in the wavelength region of 330−1000 nm and absolutely determined their Φf values with two independently calibrated integrating sphere setups.
Criteria for standard selection and the configuration of these novel fluorescence reference materials are given, and the certification procedure is presented including homogeneity and stability studies and the calculation of complete uncertainty budgets for the certified Φf values. The ultimate goal is to provide the community of fluorescence users with available reference materials as a basis for an improved comparability and reliability of quantum yield data since the measurement of this spectroscopic key property is an essential part of the characterization of any new emitter.
Certification of the mass fractions of trace elements in a medium purity graphite reference material
(2018)
The increasing application of graphite materials in various fields of technology and science enhances the demand for strictly controlled properties which are often directly correlated to the contents of trace element impurities. Therefore, the availability of powerful, rapid and reliable analytical methods for the determination of trace impurities is essential for process and quality control. Certified reference materials, indispensable for the development and validation of appropriate trace analytical methods for the characterization of special purity graphite materials are still lacking. Therefore, BAM in co-operation with the working group “Special Materials” of the committee of chemists of GDMB (Gesellschaft der Metallurgen und Bergleute e.V.) certified an industrially sourced graphite material with genuine elemental impurities.
The candidate material was a commercial product (NBG 18) taken from the customary production line of the producer SGL CARBON, Chedde (France). The homogeneity of the powdered material was assessed by means of ETV-ICP OES and DC Arc-OES. Certification of the candidate reference material was based on an inter-laboratory comparison involving 17 expert laboratories from Germany, France, Slovenia, USA, South Africa. A variety of different mineralization, digestion, leaching, fusion and combustion techniques prior to ICP OES and photometry, methods without sample preparation (INAA, k0-INAA) as well as typical solid sampling methods (ETV-ICP OES, ETV-ICP-MS, SS-ET AAS, DC Arc-OES, MF-DC Arc-OES) were used to characterise the material. Certified mass fractions and their expanded uncertainties (k = 2) were assigned for 27 elements (Al, B, Ba, Be, Ca, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, S, Si, Sr, Ti, V, W, Y, Zn, Zr), ranging from (0.00050 ± 0.00027) mg/kg for Be to (41 ± 6) mg/kg for Si. Informative values are given for further parameters: trace element contents of Ag, As, Au, Bi, Cd, Cs, Dy, Eu, Ga, Gd, Hg, In, La, Nb, Rb, Re, Rh, Sb, Sc, Se, Sm, Sn, Ta, Tb, Te, Th, U; method specific values obtained by ETV-ICP OES (BETV and SiETV) and ash content.
The new certified material is available as BAM Reference Material BAM-S009 Medium Purity Graphite Powder.
Certification of the mass fractions of trace elements in a medium purity graphite reference material
(2018)
The increasing application of graphite materials in various fields of technology and science enhances the demand for strictly controlled properties which are often directly correlated to the contents of trace element impurities. Therefore, the availability of powerful, rapid and reliable analytical methods for the determination of trace impurities is essential for process and quality control. Certified reference materials, indispensable for the development and validation of appropriate trace analytical methods for the characterization of special purity graphite materials are still lacking. Therefore, BAM in co-operation with the working group “Special Materials” of the committee of chemists of GDMB (Gesellschaft der Metallurgen und Bergleute e.V.) certified an industrially sourced graphite material with genuine elemental impurities.
The candidate material was a commercial product (NBG 18) taken from the customary production line of the producer SGL CARBON, Chedde (France). The homogeneity of the powdered material was assessed by means of ETV-ICP OES and DC Arc-OES. Certification of the candidate reference material was based on an inter-laboratory comparison involving 17 expert laboratories from Germany, France, Slovenia, USA, South Africa. A variety of different mineralization, digestion, leaching, fusion and combustion techniques prior to ICP OES and photometry, methods without sample preparation (INAA, k0-INAA) as well as typical solid sampling methods (ETV-ICP OES, ETV-ICP-MS, SS-ET AAS, DC Arc-OES, MF-DC Arc-OES) were used to characterise the material. Certified mass fractions and their expanded uncertainties (k = 2) were assigned for 27 elements (Al, B, Ba, Be, Ca, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, S, Si, Sr, Ti, V, W, Y, Zn, Zr), ranging from (0.00050 ± 0.00027) mg/kg for Be to (41 ± 6) mg/kg for Si. Additionally, informative values are given for the: trace element contents of Ag, As, Au, Bi, Cd, Cs, Dy, Eu, Ga, Gd, Hg, In, La, Nb, Rb, Re, Rh, Sb, Sc, Se, Sm, Sn, Ta, Tb, Te, Th, U; method specific values obtained by ETV-ICP OES (BETV and SiETV) and the ash content of the material.
The certified material “BAM-S009 Medium Purity Graphite Powder” is available for purchase from BAM.