6 Materialchemie
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- Mechanochemistry (7)
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- Imaging (4)
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- 6 Materialchemie (76)
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The test material EDS-TM001 together with an accompanying software package, “EDX spectrometer check”, have been made available in 2009 by BAM to be employed by EDS (energy-dispersive X-ray spectrometer) users to check the performance of an EDS attached to the SEM. Particularly for test laboratories operating under accreditation schemes like ISO/IEC 17025, a periodical control of the critical instrumental parameters in end-user laboratories is required. With EDS-TM001 or EDS-TM002 (second generation) test material, this periodical check is simplified to the acquisition of only one 10 kV spectrum. The software “EDX spectrometer check” is destined to evaluate automatically this spectrum and determine the performance of the EDS in terms of energy resolution and calibration, as well as possible alteration of low-energy Efficiency due to detector contamination. Energy resolution can be compared with the specified values according to the international ISO standard ISO 15632:2012. EDS-TM is a synthetic material consisting of a 6 μm thick layer of C, Al, Mn, Cu and Zr deposited on a steel (in case of EDS-TM001) or silicon (in case of EDS-TM002) substrate. The chemical composition of EDS-TM was chosen such as to give nearly equal intensities of the low energy lines in a 10 kV spectrum, thus, making it very sensitive against spectrometer efficiency changes. Meanwhile, about 150 laboratories use the EDS-TM001 or EDS-TM002 test material for the periodical check of their EDS. A detailed description of the test material and software together with examples of application was published recently. New results and gained experiences will be presented as well. When the FWHM of the X-ray lines in the EDS-TM spectrum are determined, the spectrum background must be subtracted accurately. The applied physical background subtraction procedure is robust and takes into account the transmission of the detector window. While the previous version considers only Moxtek AP windows, the new version includes selection of silicon Nitride window and the case of windowless detector. Moreover, the new version allows importing of spectra in Bruker spx-format and EMSA/MSA files from EDAX TEAM software.
Windowless detectors have been also tested demonstrating long-term stability after repeated heating and cooling cycles. In this case, the appropriate Background subtraction is decisive for accurate detector characterization. Detailed results will be presented.
It was demonstrated in the past that the electron probe microanalysis (EPMA) can be applied to determine accurately both elemental composition and thickness of thin films by using the dedicated software package for thin film analysis Stratagem. A relatively small number of film materials such as pure metallic films of platinum and nickel, binary alloys of Fe-Ni, and Pt-Ni-Co ternary alloy films has been reported in literature as working successfully. Further, the software can be applied ‘inversely’, i.e., by feeding it with the thickness of the film and using the determined mass coating, one can easily calculate the film density, which for porous layers leads us to the true film porosity.
The present study repeats measurements on an already tested system of Fe-Ni thin films on silicon and reports for the first-time results of analysis on Si-Ge thin films deposited on a non-conductive aluminium oxide substrate. Standard-based and standardless EPMA (with EDS) results were used in combination with Stratagem for the quantification.
Further, X-ray fluorescence analysis (XRF) can be used for the determination of elemental composition and thickness of such films as well. In this case, XRF with a μ-focus X-ray source (μ-XRF) attached to a SEM was applied. For quantification, a fundamental parameter (FP) approach has been used to calculate standard-based and standardless results. Compared to EPMA, XRF has a larger information depth and a higher elemental sensitivity because of a generally lower background.
Both thin film systems have been chosen as samples of an international round robin test (RRT) organised in the frame of standardisation technical committee ISO/TC 201 ‘Surface chemical analysis’, under the lead of KRISS. The main objective of the RRT is to compare the results of atomic fractions of Fe1-xNix and Si1-xGex alloy films obtained by different surface Analysis techniques, such as X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) applied in the depth-profiling operation mode.
Five samples of different atomic fractions of each thin film system, i.e., Fe1-xNix and Si1-xGex, have been grown by ion beam sputter deposition on silicon and Al2O3 wafers, respectively. Reference FeNi and SiGe films with well-known elemental composition and thickness have been also supplied for standard-based analysis. The atomic fractions of all the samples including the references have been certified by RBS (Rutherford backscattering spectrometry) and ICP-AES (inductively coupled plasma atomic emission spectroscopy).
Porous materials play an important role in several fields of technology, especially for energy applications like photovoltaics, electrolysis or batteries. The activity of porous films is affected by properties like porosity, film thickness, chemical composition of the material, as well as the crystallinity of the framework. The complex morphology of such porous films constitutes a challenge even for modern analytical techniques and requires new approaches employing the combination/complementation of data of different analytical methods. In this contribution, we characterise thin mesoporous iridium-titanium mixed oxide film properties by electron probe microanalysis (EPMA) with energy-dispersive X-ray spectroscopy (EDS) at an SEM.
Mesoporous iridium oxide - titanium oxide (IrOx-TiOx) films were prepared via dip-coating of a solution containing a triblock-copolymer as structure-directing agent, an iridium precursor as well as a titanium precursor in ethanol. IrOx-TiOx films were synthesized with different amounts of iridium and calcined in air. The SEM micrographs reveal for all films the achievement of a well-ordered mesoporous structure and homogeneous films with thicknesses between 67 nm and 152 nm.
For the determination of film elemental composition and porosity, EPMA can be used as part of a combined SEM/EDS/STRATAGem analysis. Elemental compositions and mass depositions (in μg cm-2) of IrOx-TiOx films were calculated with the thin film analysis Software STRATAGem via k-values measured with SEM/EDS. Pure bulk Ir, TiO2 and Si were measured as references. The average density of the films was obtained from the mass Deposition and the film thickness as measured by cross-section SEM. The porosity was then extracted from the measured average film density divided by a theoretical bulk density. The latter is calculated from the weight fractions of IrOx and TiOx as determined with STRATAGem and the bulk mass densities of IrO2 and TiO2 (rutil) from literature.
The fitting results of the k-values from the STRATAGem software, which are in fair agreement with the measured k-values.
The application of the SEM/EDS/STRATAGem approach for accurate porosity determination on pure mesoporous TiOx films and pure porous IrOx films has been recently demonstrated.
The porosities of pure IrOx, TiOx and mixed IrOx-TiOx films in this study have been determined. The contribution will assess in detail the advantages and limitations of the combined SEM/EDS/STRATAGem analysis for the morphology and porosity of thin metal oxide films. Moreover, the comparison with other measurement techniques and the combination of datasets from multiple measurements will be discussed.
Microbeam analysis data are of continuously improving quality, this owing mainly to developments in instrumentation (hardware and software) and computer performance. The knowledge and skills of the operators must be also kept correspondingly updated. To be deemed as technically competent, the laboratories must be accredited according to an accreditation scheme, mostly following ISO/IEC 17025.
International standards are able to provide requirements, specifications, guidelines or characteristics of methods, instruments or samples with the final goal that these can be used consistently in accredited laboratories. In the field of electron microscopy and microbeam Analysis standardisation and metrology are terms that are encountered rather seldom at major conferences and scientific publications. Several ISO standards already published and used successfully by a large part of the electron microscopy and microbeam analysis community. For example, file formats such as EMSA/MSA for spectral-data exchange or tagged image file format (TIFF) for SEM images; procedures for the specification of X-ray spectrometers, the specification of certified reference materials (CRMs), and for measurement of average grain size by electron backscatter diffraction (EBSD); and guidelines for calibrating image magnification in SEM or TEM. A main task of ISO technical committee TC 202 ‘Microbeam Analysis’ is to identify feasible projects/proposals needed to be developed into new international standards, particularly in respect to recent technology, such the silicon drift detector (SDD).
As far as the metrological aspects are regarded, The International Bureau of Weights and Measures (BIPM) through the Consultative Committee for the Amount of Substance (CCQM) is concerned with the metrological aspect in Chemistry and Biology. In particular, the Surface Analysis Working Group (SAWG) assists in identifying and establishing inter-laboratory work to test the consistency as well as to improve the traceability of spatially resolved chemical surface analysis at the micro and nanoscale. Examples of recent projects on quantitative microbeam analysis at low energies, such as the quantification of light elements such as carbon and nitrogen will be presented.
The significant sources of measurement uncertainty will be emphasized. These are: quality of the unknown and the reference materials used, the quantification model, instrumental parameters like take-off-angle, spectrometer efficiency, and particularly the beam current. The crucial importance of working with uniform and well-defined measurement and data evaluation protocols will be discussed in compliance with the ISO document “Guide to the expression of uncertainty in measurement (GUM)”.
Another international platform where pre-standardisation work can be organised is VAMAS (Versailles Project on Advanced Materials and Standards). International collaborative Projects aim at providing the technical basis for harmonised measurements, testing, specifications, and standards to be further developed at ISO level. One key point of VAMAS activities is constituted by inter-laboratory comparisons for high-quality data. In the field of microbeam analysis, the technical working area (TWA) 37 Quantitative Microstructural Analysis deals with corresponding projects. Good ideas, e.g., on analysis at low energies, are particularly encouraged by directly contacting the author. Support and guidance will be supplied.
The simultaneous detection of different analytes has gained increasing importance in recent years, especially in the fields of environmental and health monitoring. Particularly suitable formats for multiplexing are bead-based assays. The beads employed need to fulfil size and density requirements important for instance for flow cytometry and shall exhibit an as high as possible surface area for anchoring capture probes to allow for low limits of detection. Core/shell particles are ideally suited in this sense because of their modularity in design and adaptability for various (bio)analytical assays. Here, polystyrene particles coated with different kinds of mesoporous silica shells are presented, possessing distinctly higher surface areas in comparison to non-porous core/shell particles. Different factors such as pH and amount and type of mediator salt used during shell preparation were evaluated with shell inspection by scanning/transmission scanning electron microscopy (SEM/tSEM) being key to architecture control of the monodisperse particles.
For a cytometric model assay, the optimized core/shell particles were functionalized with capture oligonucleotides for DNA detection. After covalent attachment of single-stranded DNA to the silane-modified silica surface, a hybridisation assay using labelled t-DNA complementary strands was carried out to demonstrate particle performance, showing how tailoring of the shell’s surface area controls sensitivity and dynamic range of the assay. Finally, a multiplex assay for the determination of DNA from different human papilloma virus (HPV) lines was developed. Using our optimized particles, we were able to detect down to 10 amolμl‒1, which is an improvement of one order of magnitude compared to assays using non-porous particles reported in the literature. In addition, multiplexed detection could successfully be demonstrated.
Die ThermoExtraktionDesorption-Gaschromatografie-Massenspektrometrie (TED-GC-MS) ist die wichtigste Methode der BAM zur Analyse von Mikroplastikpartikeln in Umweltproben. Mit wachsendem Erfahrungsschatz traten Komplikationen auf, bei deren Bewältigung das Analysensystem verbessert werden konnte. Das Poster präsentiert u. a. die Verbesserung der Nachweisgrenzen sowie die Eliminierung von Kontaminationsquellen aus gängigen Probennahmeverfahren.
We developed a setup for time- and lateral-resolved X-ray absorption fine structure (XAFS) spectroscopy. A dispersive element is placed behind the sample to investigate. The broadband incoming beam transmits the sample, is then dispersed and finally collected by a position sensitive detector. This allows the recording of a whole X-ray absorption near edge structure (XANES) or extended X-ray absorption fine structure (EXAFS) spectrum in a single shot. The dispersive element is a Si(111) crystal, bent by means of a so called wafer bender, developed in house. Our setup is very flexible, easy to adjust and allows a time resolution down to one second which can be used to follow chemical reactions with dynamics on this time scale.
Inorganic nanoparticles are used to improve the performance of epoxy as the matrix phase in fiber-reinforced composites used for aerospace applications. The effectiveness of nanofillers on property enhancement of thermosetting polymers depends on many factors including the interaction between the functional groups of nanofillers and the polymer reactants. In the current work, we study the effect of boehmite nanoparticles (BNPs) on properties of anhydride-cured bisphenol-A-diglycidyl ether (DGEBA). Dynamic mechanical thermal analysis (DMTA) and a high-resolution force measurement approach called intermodulation atomic force microscopy (ImAFM) were carried out to investigate the thermomechanical and nanomechanical properties of this material, respectively. It was found that BNPs lead to decrease of glass transition temperature (Tg) and crosslink density of the polymer network meanwhile significantly enhancing the Young’s modulus. Besides formation of a soft interphase near the particles, significant changes in local stiffness of polymer matrix far from the interphase was observed with ImAFM. Thus, boehmite induces long-range chemical alteration on the matrix. This effect has a higher impact on overall composite properties compared to the formation of interphase which is only a short-range effect. The local chemical evaluations on the soft interphase using an infrared-AFM method (NanoIR) revealed the accumulation of anhydride hardener near the boehmite interface. Based on these observations the effect of boehmite on the curing of epoxy is hypothesized to be governed by the strong interaction between boehmite and the anhydride. This interaction causes changes the ratio of reactants in the epoxy mixture and hence alteration of curing pathway and the network architecture. In future studies we examine this hypothesis by measuring the thermomechanical properties of cured epoxies in which the epoxy-hardener ratio is systematically altered and further comparing to those properties of nanocomposites shown in the current study.
Nanoparticles (NP) have become important materials for a variety of chemical technologies. The enhanced surface-area-to-volume ratio of NPs, making them excellent for use as catalyst, in analytical assays, and for antimicrobial applications.
Nickel NPs have exhibited immense potential as important catalyst for the Sabatier reaction, i.e. converting waste to energy via transformation of CO2 into CH4, and could replace the rare earth elements such as Ru, PT, or Rh. In this work we describe the solvothermal synthesis of monometallic and bimetallic nickel nanoparticles.
Monodisperse monometallic Ni NPs were synthesized using Oleylamin as solvent and reducing agent. The nanoparticles were investigated using small angle scattering (SAXS), scanning transmission electron microscopy (STEM) and energy dispersive X-ray spectroscopy (EDX), showing that the NPs are stable while the surface is not entirely covered. However, Ni has a high propensity to undergo oxidation, and becoming deactivated by coke formation. Hence, we further explore the preparation of bimetallic NPs, where a second metal is added to stabilize the Ni.
Bimetallic Cu-Ni NPs were synthesized by simultaneous solvothermal reduction. These bimetallic NPs exhibit excellent catalytic properties are promising candidates to be used as catalysts for efficient energy storage.