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Surface characterisation of Escherichia coli under various conditions by near-ambient pressure XPS
(2018)
Bacteria are inherently in a hydrated state and therefore not compatible to ultra-high vacuum techniques such as XPS without prior sample preparation involving freeze drying or fast freezing.
This has changed with the development of near-ambient pressure (NAP)-XPS, which makes it possible to characterise the bacterial surface with minimal sample preparation. This paper presents NAP-XPS measurements of Escherichia coli under various NAP conditions: at 11 mbar in a humid environment, at 2 mbar after drying in the chamber, pre-dried at 4 mbar, and at 1 mbar after overnight pumping at 10^−4 mbar. The high-resolution spectra of carbon, nitrogen, and oxygen are presented and found to be in general agreement with XPS measurements from freeze-dried and fast-frozen bacteria. However, it was found that the amount of carbon components associated with polysaccharides increases relative to aliphatic carbon during drying and increases further after overnight pumping. This implies that drying has an impact on the bacterial surface.
This application note presents how EnviroESCA can be used to analyze E. coli biofilms on silicon under near ambient pressure conditions in various states of hydration. Such investigations of the outer bacterial cell surface in their hydrated state are essential for studying biological interfaces at work.
Pseudomonas fluorescens (Gram-negative) bacteria purchased from Leibniz Institute DSMZ-German Collection of Microorganisms and Cell Cultures were analyzed using high-resolution x-ray photoelectron spectroscopy at near ambient pressure conditions (NAP-XPS), 1500 Pa water vapor atmosphere. Fresh layers of P. fluorescence bacteria were grown on Luria Broth agar plates. Bacteria were taken from the agar plate with a sterile spatula and gently spread on a Si-wafer piece for NAP-XPS analysis. The NAP-XPS spectra of the bacterial envelope of P. fluorescence were obtained using monochromatic Al Kα radiation and include a survey scan and high-resolution spectra of C 1s, N 1s, P 2p, and O 1s as well. The presentation of the C 1s high-resolution spectrum includes the results of peak fitting analysis.