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Investigation on Wall Thickness Ranges Using Digital Radiography for Tangential Projection Technique
(2018)
X-ray testing is based on the attenuation of X-rays when passing through matter. Image detectors acquire the X-ray information which is defined by the local penetrated wall thickness of the tested sample. By X-ray absorption in the detector and following read-out and digitization steps a digital image is generated. As detectors a radiographic film and film digitization, a storage phosphor imaging plate and a special Laser scanner (Computer Radiography - CR) or a digital detector array (DDA) can be used. The digital image in the computer can then be further analyzed using many types of image processing. In the presented work the automated evaluation of wall thickness profiles are investigated using a test steel pipe with 9 different wall thicknesses and various X-ray voltages and different filter materials at the tube port and intermediate between object and detector. In this way the influence of different radiation qualities on the accuracy of the automated wall thickness evaluation depending on the penetrated wall thickness of the steel pipe was investigated.
The comparison required the assignment of the mass fraction of folic acid present as the main component in the comparison sample. Performance in the comparison is representative of a laboratory's measurement capability for the purity assignment of organic compounds of medium structural complexity [molecular weight range 300–500] and high polarity (pKOW < −2).
Methods used by the eighteen participating NMIs or DIs were based on a mass balance (summation of impurities) or qNMR approach, or the combination of data obtained using both methods. The qNMR results tended to give slightly lower values for the content of folic acid, albeit with larger associated uncertainties, compared with the results obtained by mass balance procedures. Possible reasons for this divergence are discussed in the report, without reaching a definitive conclusion as to their origin.
The comparison demonstrates that for a structurally complex polar organic compound containing a high water content and presenting a number of additional analytical challenges, the assignment of the mass fraction content property value of the main component can reasonably be achieved with an associated relative standard uncertainty in the assigned value of 0.5%
The Bravais lattices and their lattice parameters are blindly determined using electron backscatter diffraction (EBSD) patterns of materials with cubic or tetragonal crystal structures. Since the geometric relationships in a single EBSD pattern are overdetermined, the relative errors of determining the lattice parameters as well as the axial ratios are confined to about 0.7 ± 0.4% and 0.07 ± 0.03%, respectively, for ideal simulated EBSD patterns. The accuracy of the crystal orientation determination reaches about 0.06 ± 0.03°. With careful manual band detection, the accuracy of determining lattice parameters from experimental patterns can be as good as from simulated patterns, although the results from simulated patterns are often better than expermental patterns, which are lower quality and contain uncertain systematic errors. The reasonably high accuracy is obtained primarily because the detection of the diffracting-plane traces and zone axes is relatively accurate. The results here demonstrate that the developed procedure based on the EBSD technique presents a reliable tool for crystallographic characterization of the Bravais lattices of unknown phases.