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Organisationseinheit der BAM
A new type of test sample for the determination of lateral resolution in surface analysis is presented. The certified reference material BAM-L002 Nanoscale strip pattern for length calibration and testing of lateral resolution is an embedded cross-section of epitaxially grown layers of AlxGa1-xAs and InxGa1-xAs on GaAs substrate. The surface of the sample provides a flat pattern with strip widths of 0.4-500 nm. The combination of gratings, isolated narrow strips and sharp edges of wide strips offers improved possibilities for the calibration of a length scale, the determination of lateral resolution and the optimization of instrument settings. The feasibility of the reference material for an analysis of lateral resolution is demonstrated for SIMS.
Mechanical and thermal response of a nickel-base superalloy upon grinding with high removal rates
(1997)
Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters.
The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy.
Residual stress depth profiles of a cast nickel-base superalloy were measured by regarding the deflections occurring in plate-shaped specimens while successively removing layers from the machined or treated surface by electropolishing. The results are in good agreement with previous findings showing (i) the influence of grinding parameters on the width of so-called white layers, which correspond to steep gradients of residual tensile stress, and (ii) a broad zone of compressive residual stress in the case of shot peening.
This work focuses on surface changes induced by repeated brake applications and tries to provide explanations, how such material modifications might affect friction and wear properties of automotive disc brakes. Surface films were investigated locally by transmission electron microscopy (TEM) after having prepared thin cross-sections with a focused ion beam instrument (FIB). Since the observed friction layers revealed a nanocrystalline structure, modelling with the method of movable cellular automata (MCA) was performed by assuming an array of linked nanometer-sized particles. In spite of complicated material combinations at the pad surface, two very characteristic features were always observed at both the pad and disc surface, namely a steel constituenteither ferritic (pad) or pearlitic (disc), partly covered with patches of nanocrystalline iron oxide, on a zone of severe plastic deformation with fragmented grain structure. When using an automata size of 10 nm, reasonable values for the mean coefficient of friction (COF) were obtained, namely 0.35 and 0.85 for oxide-on-oxide and metal-on-metal contacts, respectively. Immediately after brake application mass-mixing and bond-breaking was observed within a narrow zone at both surfaces.
The development of two metallizations based on the solid-phase regrowth principle is presented, namely Pd/Sb(Zn) and Pd/Ge(Zn) on moderately doped In0.53Ga0.47As (p=4×1018 cm-3). Contact resistivities of 23×10-7 and 67×10-7 ?cm2, respectively, have been achieved, where both systems exhibit an effective contact reaction depth of zero and a Zn diffusion depth below 50 nm. Exhibiting resistivities equivalent to the lowest values of Au-based systems in this doping range, especially Pd/Sb(Zn) contacts are superior to them concerning metallurgical stability and contact penetration. Both metallizations have been successfully applied for contacting the base layer of InP/In0.53Ga0.47As heterojunction bipolar transistors.
A rather new tool, the focused ion beam (FIB) technique, was used to characterise superficial layers at micro-contact areas of a commercial brake pad. The friction material was a polymer matrix composite (PMC) with approximately 50% metal content (semi-metallic) and the counter part was a cast iron rotor. Though the contact areas were not visible as topographic features, they could be identified with the aid of their increased secondary electron emission during FIB-scanning of the surface after tribological activation. Target preparation of micron-sized cross-sections with the FIB enabled the study of superficial layers at predetermined sites at high magnification.
Depending on the constituent of the pad, one, two or three layers were identified. The three layer structure comprised: (i) a 100 nm thick friction film containing nanocrystalline metal oxides and an amorphous phase which was enriched with sulphur, (ii) a nanocrystalline friction layer of compacted wear debris accommodating surface roughness and (iii) a severely deformed layer if the supporting constituent was a metal particle. Though the majority of loose wear particles was iron oxide, the friction film which adhered tightly to the pad surface contained a large amount of copper and sulphur, whereas zinc was transferred to the cast iron rotor.
Ti/TiN multilayer coatings with multilayer periods in the range 550 nm and a final thickness of 2 µm were deposited on steel substrates by cyclic modulation of nitrogen gas flow into the chamber of a PVD sputtering device. Coating characterization was performed by cross-sectional transmission electron microscopy, glancing-angle X-ray diffraction and instrumental indentation testing. Individual a-titanium and titanium nitride layers were always observed, although for the finer microstructures, the TiN layers were thicker than the Ti layers by a factor three. The plastic hardness of the films increased steadily with decreasing layer spacing, following a HallPetch relationship. Finally, a hardness value of 42 GPa was reached, which is similar to that of a thick TiN monolayer, prepared under the same coating conditions.