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- Chalcopyrite-type (1)
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The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits.
A mathematical model for the description of the overall crystallization of polymers has been developed which separates the pure geometric spreading of the semicrystalline superstructures from the increasing crystallinity inside these entities. The model uses the Avrami theory for the geometric part and a freely optional function for the increasing local crystallinity. The two functions are combined by a mathematical procedure called convolution. The free option of the local crystallinity function enables this model to permit calculation of this function, which is not accessible to direct measurement. Thus with given Avrami parameters and measured values of the time-dependent overall crystallinity, this function of the local crystallinity (secondary crystallization function) can be calculated. The model has been applied to test data produced by computer simulations.