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We combine three different approaches to greatly enhance the defect reconstruction ability of active thermographic testing. As experimental approach, laser-based structured illumination is performed in a step-wise manner. As an intermediate signal processing step, the virtual wave concept is used in order to effectively convert the notoriously difficult to solve diffusion-based inverse problem into a somewhat milder wavebased inverse problem. As a final step, a compressed-sensing based optimization procedure is applied which efficiently solves the inverse problem by making advantage of the joint sparsity of multiple blind measurements. To evaluate our proposed processing technique, we investigate an additively manufactured stainless steel sample with eight internal defects. The concerted super resolution approach is compared to conventional thermographic reconstruction techniques and shows an at least four times better spatial resolution.