Filtern
Erscheinungsjahr
Dokumenttyp
- Vortrag (9)
- Beitrag zu einem Tagungsband (7)
- Zeitschriftenartikel (6)
- Posterpräsentation (4)
- Beitrag zu einem Sammelband (2)
- Forschungsbericht (2)
- Buchkapitel (1)
Sprache
- Deutsch (17)
- Englisch (13)
- Mehrsprachig (1)
Referierte Publikation
- nein (31) (entfernen)
Schlagworte
- XPS (4)
- ESCA (2)
- Oberflächenanalytik (2)
- Analysis (1)
- Atmospheric pressure plasma treatment (1)
- Beschichtung (1)
- Catalyst (1)
- Chemical imaging (1)
- Chromium(III) compound (1)
- Cr(OH)3 (1)
Eingeladener Vortrag
- nein (9)
Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper.
Catalyst characterization
(2009)