Filtern
Dokumenttyp
- Vortrag (10)
- Beitrag zu einem Tagungsband (8)
- Zeitschriftenartikel (7)
- Posterpräsentation (3)
Schlagworte
- Thermography (12)
- VCSEL (8)
- Active thermography (7)
- DMD (6)
- Laser (6)
- Photothermal (5)
- Thermal wave (5)
- Laser thermography (4)
- Structured heating (4)
- Subsurface defects (4)
Organisationseinheit der BAM
Eingeladener Vortrag
- nein (10)
Mit Laserlicht kann man eine Materialoberfläche berührungslos und schnell moduliert aufheizen. Dabei entsteht eine stark gedämpfte Wärmewelle, die tief ins Material eindringen kann. Erzeugt und überlagert man solche thermischen Wellen auf kohärente Weise, dann kann man damit versteckte Materialfehler zerstörungsfrei und sehr präzise aufspüren. Sogar eine bildgebende Tomografie ist denkbar.
Subsurface defect localization by structured heating using laser projected photothermal thermography
(2017)
The presented method is used to locate subsurface defects oriented perpendicularly to the surface. To achieve this, we create destructively interfering thermal wave fields that are disturbed by the defect. This effect is measured and used to locate the defect. We form the destructively interfering wave fields by using a modified projector. The original light engine of the projector is replaced with a fiber-coupled high-power Diode laser. Its beam is shaped and aligned to the projector's spatial light modulator and optimized for optimal optical throughput and homogeneous projection by first characterizing the beam profile, and, second, correcting it mechanically and numerically. A high-performance infrared (IR) camera is set up according to the tight geometrical situation (including corrections of the geometrical image distortions) and the requirement to detect weak temperature oscillations at the sample surface. Data acquisition can be performed once a synchronization between the individual thermal wave field sources, the scanning stage, and the IR camera is established by using a dedicated experimental setup which needs to be tuned to the specific material being investigated. During data post-processing, the relevant information on the presence of a defect below the surface of the sample is extracted. It is retrieved from the oscillating part of the acquired thermal radiation coming from the so-called depletion line of the sample surface. The exact location of the defect is deduced from the analysis of the spatial-temporal shape of these oscillations in a final step. The method is reference-free and very sensitive to changes within the thermal wave field. So far, the method has been tested with steel samples but is applicable to different materials as well, in particular to temperature sensitive materials.
Im Bereich der optisch angeregten Thermografie haben sich Blitzlampen (impulsförmig-flächige Erwärmung) und Halogenlampen (moduliert-flächige Erwärmung) für die spezifischen Regime Impuls- und Lockin-Thermografie etabliert.
Mittels eines rasternden fokussierten Lasers wird die Flying-spot Laserthermografie z.B. zur Risserkennung (Dauerstrichbetrieb) und die photothermische Materialcharakterisierung (hochfrequent moduliert)implementiert. Durch die Verfügbarkeit neuer Technologien (schnelle und hochauflösende IR-Kameras, brillante innovativer Lichtquellen und performante Datenakquisitions- und Verarbeitungstechnik) wird ein Paradigmenwechsel von den getrennt voneinander stehenden photothermischen und
thermografischen Techniken hin zu einer einheitlichen quantitativen Mess-und Prüftechnik ermöglicht, die schneller und präziser ist. Ähnlich wie ein LED-Array, jedoch mit einer um zwei Größenordnungen höheren Bestrahlungsstärke, steht jetzt eine neuartige brillante Laserquelle, das VCSEL-Array (vertical-cavity surface-emitting laser) zur Verfügung, welches die starke Beschränkung der zeitlichen Dynamik der etablierten Lichtquellen aufhebt und gleichzeitig spektral sauber von der Detektionswellenlänge getrennt ist. Es vereint somit das schnelle zeitliche Verhalten eines Diodenlasers mit der hohen optischen Bestrahlungsstärke und dem großen Beleuchtungsbereich von Blitzlampen. Darüber hinaus kann die Erwärmung auch strukturiert vorgenommen werden, da einzelne Bereiche des VCSEL-Arrays unabhängig voneinander angesteuert werden können. Dieser neue Freiheitsgrad ermöglicht die Entwicklung ganz neuer thermografischer ZfP-Verfahren.
Among the photothermal methods, full-field thermal imaging is used to characterize materials, to determine thicknesses of layers, or to find inhomogeneities such as voids or cracks. The use of classical light sources such as flash lamps (impulse heating) or halogen lamps (modulated heating) led to a variety of nondestructive testing methods, in particular, lock-in and flash-thermography. In vertical-cavity surface-emitting lasers (VCSELs), laser light is emitted perpendicularly to the surface with a symmetrical beam profile. Due to the vertical structure, they can be arranged in large arrays of many thousands of individual lasers, which allows power scaling into the kilowatt range. Recently, a high-power yet very compact version of such a VCSEL-array became available that offers both the fast timing behavior of a laser as well as the large illumination area of a lamp. Moreover, it allows a spatial and temporal control of the heating because individual parts of the array can be controlled arbitrarily in frequency, amplitude, and phase. In conjunction with a fast infrared camera, such structured heating opens up a field of novel thermal imaging and testing methods. As a first demonstration of this approach, we chose a testing problem very challenging to conventional thermal infrared testing: The detection of very thin subsurface defects perpendicularly oriented to the surface of metallic samples. First, we generate destructively interfering thermal wave fields, which are then affected by the presence of defects within their reach. It turned out that this technique allows highly sensitive detection of subsurface defects down to depths in excess of the usual thermographic rule of thumb, with no need for a reference or surface preparation.
Structured illumination using high-power diode lasers generates a two-dimensional interference of thermal waves. In addition, the sources and the sample are moving relative to each other. Using different configurations, we investigate the validity of the temporal and spatial superposition principle of the heat diffusion equation for these cases both experimentally and by numerical-analytical modelling. Furthermore, we investigate the potential of this approach for non-destructive testing.
Among the photothermal methods, full-field thermal imaging is used to characterize materials, to determine thicknesses of layers, or to find inhomogeneities such as voids or cracks. The use of classical light sources such as flash lamps (impulse heating) or halogen lamps (modulated heating) led to a variety of nondestructive testing methods, in particular lock-in and flash-thermography.
In vertical cavity surface emitting lasers (VCSELs), laser light is emitted perpendicular to the surface with a symmetrical beam profile. Due to the vertical structure, they can be arranged in large arrays of many thousands of individual lasers, which allows power scaling into the kilowatt range. Recently, a high-power yet very compact version of such a VCSEL-array became available that offers both the fast timing behavior of a laser as well as the large illumination area of a lamp.
Moreover, it allows a spatial and temporal control of the heating because individual parts of the array can be controlled arbitrarily in frequency, amplitude, and phase. In conjunction with a fast infrared camera, such structured heating opens up a field of novel thermal imaging and testing methods. As a first demonstration of this approach, we chose a testing problem very challenging to conventional thermal infrared testing: The detection of very thin subsurface defects perpendicularly oriented to the surface of metallic samples. First, we generate destructively interfering thermal wave fields which are then affected by the presence of defects within their reach. It turned out that this technique allows highly sensitive detection of subsurface defects down to depths in excess of the usual thermographic rule of thumb, with no need for a reference or surface preparation
Photothermal radiometry with an infrared camera allows the contactless temperature measurement of multiple surface pixels simultaneously. A short light pulse heats the sample. The heat propagates through the sample by diffusion and the corresponding temperature evolution is measured at the sample’s surface by an infrared camera. The main drawback in radiometric imaging is the loss of the spatial resolution with increasing depth due to heat diffusion, which results in blurred images for deeper lying structures. We circumvent this information loss due to the diffusion process by using blind structured illumination, combined with a non-linear joint sparsity reconstruction algorithm. The structured illumination is realized by parallel laser lines from a vertical-cavity surface-emitting laser (VCSEL) array controlled by a random binary pattern generator. By using 150 different patterns of structured illumination and our iterative joint sparsity algorithm, it was possible to resolve 1 mm thick lines at a distance down to 0.5 mm, which results in a resolution enhancement of approximately a factor of four compared to the resolution of 5.9 mm for homogenous illuminated thermographic reconstruction.
The separation of two closely spaced defects in fields of Thermographic NDE is very challenging. The diffusive nature of thermal waves leads to a fundamental limitation in spatial resolution. Therefore, super resolution image reconstruction can be used. A new concerted ansatz based on spatially structured heating and joint sparsity of the signal ensemble allows for an improved reconstruction of closely spaced defects. This new technique has been studied using a 1D laser array with randomly chosen illumination pattern.
This paper presents the results after applying super resolution algorithms, such as the iterative joint sparsity (IJOSP) algorithm, to our processed measurement data. Different data processing techniques before applying the IJOSP algorithm as well as the influence of regularization parameters in the data processing techniques are discussed. Moreover, the degradation of super resolution reconstruction goodness by the choice of experimental parameters such as laser line width or number of measurements is shown.
The application of the super resolution results in a spatial resolution enhancement of approximately a factor of four which leads to a better separation of two closely spaced defects.