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Organisationseinheit der BAM
Die Berechnung von Wärmebrücken unter stationären und instationären Randbedingungen, die Optimierung von Wärmespeichern, die Beurteilung sowohl wärmeschutz- als auch brandschutztechnischer Maßnahmen und Energiebedarfsrechnungen setzen die Kenntnis thermischer Eigenschaften, u.a. der Wärmeleitfähigkeit Lambda und der spezifischen Wärmekapazität c, in Abhängigkeit der Temperatur voraus. Im Rahmen einer Zusammenarbeit der EMPA-Dübendorf und der BAM-Berlin wurde ein Kurzzeit-Prüfverfahren mit anschließender numerischer Auswertung entwickelt, das eine simultane Bestimmung dieser beiden Größen ermöglicht. In dem Band wird über das Kurzzeit-Prüfverfahren, das numerische Auswerteverfahren und die Resultate der Messungen an einigen ausgewählten Baustoffen berichtet.
Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters.
The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy.
The total reliability of a mine searching system is driven by the triple of intrinsic
capability, which describes the physical-technical basis capability, the application and
environmental factors and the human factors. Some of them can be determined in
laboratory measurements but the human factor and a part of environment conditions
and their interaction with the device need to be treated statistically. That is why the
test & evaluation procedure described in CEN CWA 14747:2003, includes in addition
to parameter tests of metal detectors also the reliability or blind field tests under local
conditions with local personnel. A series of three big field trials had been
accomplished in the ITEP-project 2.1.1.2 Reliability Model for Test & Evaluation of
Metal Detectors to specify the optimum conditions for reliable trial results with
affordable effort. For each set of specific working conditions, characterized in terms
of a combination of one mine type in one soil with one detector handled by local
personnel, the searching system will show up a working performance in mine
detection rates as a function of mine depth and show up a certain overall false call
rate. During the ITEP-trials in Benkovac and Oberjettenberg the authors learnt to
determine this function separately for each mine type in each soil, which is especially
important for low metal mines in uncooperative soil which will be illustrated for the
mine PMA2 in different types of soil. The question of representativeness for field
conditions on the one hand and necessary statistical set up for the possibility to
distinguish between individual detector performances is still under discussion.
The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)
(2008)
The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed.
Nanotechnologie im Bauwesen
(2008)
Zu den Zielen der Nanotechnologie gehört die Entwicklung, Produktion und Anwendung von Materialien und Werkstoffen mit völlig neuartigen Leistungsspektren. Für die Baupraxis und die Materialforschung lassen sich über den Einsatz der Nanotechnologie Ziele wie die Optimierung von Baustoffeigenschaften, Vermeidung von Schäden und neue Funktionalitäten definieren. Der vorliegende Beitrag gibt einen Überblick über mögliche Anwendungsbereiche der Nanotechnologie im Bausektor, wie z. B. zementgebundene Baustoffe, Außen- und Dachfassaden, Fenster und Verglasungen, Brandschutz, Inneneinrichtung und Infrastrukturbau. Zudem werden aktuelle Forschungsarbeiten mit nanowissenschaftlichem und nanotechnologischem Schwerpunkt im Bereich baustoffbezogener Materialien der Bundesanstalt für Materialforschung und -prüfung (BAM) in Berlin vorgestellt. Die Forschungstätigkeiten beziehen sich zum einen auf die Modifikation der Hydratphasen in Ultra-Hochleistungsbeton (UHPC) und zum anderen auf die Weiterentwicklung von Anti-Graffiti-Systemen.