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- Additive manufacturing (2)
- Residual stress (2)
- Al-3.85%Mg alloy (1)
- Cellular structures (1)
- Creep (1)
- Denoising filter (1)
- Electron backscatter diffraction (1)
- Electron backscatter diffraction (EBSD) (1)
- Inconel 718 (1)
- Kernel average misorientation (1)
- LPBF (1)
- Laser powder bed fusion (1)
- Lattice structures (1)
- Neutron diffraction (1)
- Power law and power-law breakdown (1)
- Power-law breakdown (1)
- Principal stress components (1)
- Pure aluminium (1)
- Steady-state creep (1)
- Texture (1)
Organisationseinheit der BAM
The electron backscatter diffraction (EBSD) technique is used to investigate the dislocation structures formed after steady-state creep deformation of an Al-3.85%Mg alloy. This material is crept at two different stress levels, corresponding to the so-called power-law and power-law breakdown regimes. The results show that, regardless of the creep stress level, the strain tends to localize, leading to the formation of intragranular bands. The thickness of such bands is larger when the material is tested at loads corresponding to the power-law breakdown. This suggests enhanced diffusion by dislocation pipes.
In the present work, electron backscatter diffraction was used to determine the microscopic dislocation structures generated during creep (with tests interrupted at the steady state) in pure 99.8% aluminium. This material was investigated at two different stress levels, corresponding to the power-law and power-law breakdown regimes. The results show that the formation of subgrain cellular structures occurs independently of the crystallographic orientation. However, the density of these cellular structures strongly depends on the grain crystallographic orientation with respect to the tensile axis direction, with <111> grains exhibiting the highest densities at both stress levels. It is proposed that this behaviour is due to the influence of intergranular stresses, which is different in <111> and <001> grains.
The determination of residual stresses becomes more complicated with increasing complexity of the structures investigated. Additive manufacturing techniques generally allow the production of ‘lattice structures’ without any additional manufacturing step. These lattice structures consist of thin struts and are thus susceptible to internal stress-induced distortion and even cracks. In most cases, internal stresses remain locked in the structures as residual stress.
The determination of the residual stress in lattice structures through nondestructive neutron diffraction is described in this work. It is shown how two difficulties can be overcome: (a) the correct alignment of the lattice structures within the neutron beam and (b) the correct determination of the residual stress field in a representative part of the structure. The magnitude and the direction of residual stress are discussed. The residual stress in the strut was found to be uniaxial and to follow the orientation of the strut, while the residual stress in the knots was more hydrostatic. Additionally, it is shown that strain measurements in at least seven independent directions are necessary for the estimation of the principal stress directions. The measurement directions should be chosen according to the sample geometry and an informed choice on the possible strain field. If the most prominent direction is not measured, the error in the calculated stress magnitude increases considerably.
The effect of two types of scanning strategies on the grain structure and build-up of Residual Stress (RS) has been investigated in an as-built IN718 alloy produced by Laser Powder Bed Fusion (LPBF). The RS state has been investigated by X-ray diffraction techniques. The microstructural characterization was performed principally by Electron Backscatter Diffraction (EBSD), where the application of a post-measurement refinement technique enables small misorientations (< 2°) to be resolved. Kernel average misorientation (KAM) distributions indicate that preferably oriented columnar grains contain higher levels of misorientation, when compared to elongated grains with lower texture. The KAM distributions combined with X-ray diffraction stress maps infer that the increased misorientation is induced via plastic deformation driven by the thermal stresses, acting to self-relieve stress. The possibility of obtaining lower RS states in the build direction as a consequence of the influence of the microstructure should be considered when envisaging scanning strategies aimed at the mitigation of RS.